Biographies of Staff Members

Bernard Courtois COURTOIS Bernard
 
Position: Directeur de Recherches CNRS
Education:
1981 - Docteur d'Etat degree
1976 - Doctor-Engineer degree
1973 - Engineer degree
1970 - 1973 National School for Informatics and Applied Mathematics in Grenoble
1967 - 1970 Mathematics in Paris
1968 - Baccalaureat degree – Philosophy
1967 - Baccalaureat degree – Mathematics

Director CMP 1984-2013
 
Short Biography

Bernard COURTOIS received the Engineer degree in 1973 from the Ecole Nationale Supérieure d'Informatique et Mathématiques Appliquées de Grenoble (Grenoble, France), and next the "Docteur-Ingénieur" and "Docteur-ès-Sciences" degrees from the Institut National Polytechnique de Grenoble. He is currently the Director of CMP Service that is servicing Universities and Companies from about 60 countries for ICs, MCMs and MEMS prototyping and small volume production. He was also Director of the Laboratory of Techniques of Informatics and Microelectronics for Computer Architecture (TIMA) where researches include CAD, architecture and testing of integrated circuits and systems. He has been general chair or program chair of various international conferences and workshops, including EDAC-ETC-EUROASIC, Electron and Optical Beam Testing, EUROCHIP, Mixed-Signal Testing, Rapid System Prototyping, THERMINIC, Design, Test and Microfabrication of MEMS/MOEMS, POLYTRONIC and European Nano Systems. He is a member of ACM, ASME, IEEE and IMAPS. He is a IEEE Computer Society's Golden Core member and he is Doctor Honoris Causa of the Technical University of Budapest.


Full list of Publications

A) 1973-1981
B) Books and magazines: 1982-2012
C) Conferences and Workshops: 1982-2012

A) 1973 - 1981

1973 Computer test program
IEEE Workshop on diagnosis and reliable design of digital
systems - Pasadena - 12/73, USA (Nb of co-authors: 4)

1974 Nouvelles perspectives des outils d'évaluation de fiabilité
Journées d'études sur les calculateurs numériques embarqués.
LAAS et PRIVAT ed. Toulouse, 6/74 (Nb of co-authors: 1)

1975 On the relationships between performance and reliability of computers,
3rd Int. seminar on applied aspects of the automata theory, Varna, 6/75, Bulgaria (Nb of co-authors: 1)

Microprogramming as a means of evaluation of a computer's
performance and reliability
EUROMICRO. North Holland publishing, 6/75, Nice (Nb of co-authors: 1)

On balancing hardware-firmware for the design of a fault tolerant
computer's series
8th Annual Workshop on microprogramming, Chicago, 10/75, USA (Nb of co-authors: 1)

On partitioning a redundant system under realistic assumptions
Informatica 10/75, Yougoslavia (Nb of co-authors: 1)

1976 Models for the control of the test and of the reconfiguration of a computer
2nd European meeting on cybernetics and systems research, Vienne,
Autriche 4/76, Hemisphere Pub. C°, N.Y.

On balancing safety and reliability of hybrid and "bi duplex" systems
IEEE Fault Tolerant Computing Symposium, Pittsburgh, USA, 6/76

Etude d'un calculateur tolérant des pannes : ses fiabilité, sécurité, performance et coût
Thèse de docteur ingénieur, Grenoble 12/76

Fiabilité et sécurité de quelques systèmes logiques
Congrès AFCET Automatismes logiques : recherches et applications
industrielles, Paris, 12/76

Interaction fiabilité - sécurité - disponibilité maintenance
3ème Congrès National de fiabilité Perros Guirec, 9/76

Safety and reliability of non-repairable systems
Digital processes 2 – 1976

1977 Influence of reliability and safety on the maintenance of logical systems
2nd IFAC Symposium on discrete systems - Desden, DDR 3/77

1979 Failure detection in microcomputer systems
IFAC workshop on safety computer controlled systems,
Stuttgart, 5/79, FRG Pergamon Press 1980

Some results about the efficiency of simple mechanisms for the detection of
microcomputer malfunctions
9th Fault Tolerant Computing Symposium, Madison, 6/79, USA
Projet d'architecture pour la commande d'un autocommutateur
téléphonique, Inter. Switching Symposium, Paris, 5/79

Projet d'architecture pour la commande d'un autocommutateur téléphonique
Inter. switching Symposium, Paris 5/79

1980 Fréquences optimales pour tests concurrents et périodique de
systèmes logiques
2nd Colloque Int. sur la fiabilité et la maintenabilité, Perros Guirec
9/80 (Rapport IMAG n° RR 192, Mars 80)

1981 Safety Availability and Maintenance Evaluation of Redundant Systems
Digital Processes

A methodology for on-line testing of microprocessors
11th Fault Tolerant Computing Symposium, Portland, June 81, USA

Failure mechanisms, fault-hypotheses and analytical testing of
LSI-NMOS (HMOS) circuits
VLSI 81, University of Edinburgh, 18.21.8.81, Academic Press

Test et LSI
Doctorat d'Etat, 12 Juin 1981

SKALP : Skeleton Architecture for fault tolerant distributed processing
EUROMICRO Jounal, Vol. 7, n° 5, May 1981

A light efficient and microprocessor oriented ATE
Automatic testing 81 - Brighton, December 8/10 81

On-line oriented functional testing of control sections of integrated CPUs
EUROMICRO Symposium, Paris, Septembre 8/10 81.

Analytical testing of data processing sections of integrated CPUs
Int. Test Confernece, Cheery-Hill, October 27/29 81, Philadelphie, USA

B) BOOKS AND MAGAZINES, 1982-2012

1982

COURTOIS B.
Sûreté de fonctionnement dans des systèmes distribués
Journal NTT, 1982 (in japanese)

1984

COURTOIS B., MARCHAL P., NICOLAIDIS M.
Microarchitecture of the MC 6800 and evaluation of a self-checking version
Ecole OTAN "Microarchitecture of VLSI Computers"
July 1984 - Martinus Nijhoff - Editeur

BASCHIERA D., COURTOIS B.
"Testing CMOS" : A challenge ?
VLSI Design, October 1984

1986

JERRAYA A., COURTOIS B.
The SYCO silicon compiler and its environment
NATO ASI - July 1986

1987

JERRAYA A., COURTOIS B.
The SYCO silicon compiler and its environment
NATO ASI on Logic synthesis and silicon compilation for VLSI Design,
L'Aquila (Italy), July 86, Martinus Nijhoff Editors, 1987

NICOLAIDIS M., COURTOIS B.
Les circuits autotestables en vue du test en ligne
Revue "Enjeux" N° 81 - July 1987

DAVID R.* COURTOIS B., SAUCIER G**
A history of research in fault tolerant computing at the Grenoble University
Dependable Computing and Fault-Tolerant Systems, Vol 4,
Springer-Verlag 1987
----------
* LAG, Grenoble, France; ** LGI, Grenoble, France

1988

JERRAYA A., MHAYA N., GERONIMI J.P., COURTOIS B.
"SYCO : a silicon compiler for ASICs specified by algorithms"
Invited paper, in Special Issue on silicon compilation in Europe,
IEE CAE Journal, June 1988.

JANSCH I., COURTOIS B.
"Strongly Language Disjoint Checkers"
IEEE Transactions on Computers, June 1988

NICOLAIDIS M., COURTOIS B.
"Strongly code disjoint checkers"
IEEE Transactions on Computers, June 1988

WOLFGANG E.*, COURTOIS B.
Proceedings of the 1st European Conference on Electron and Optical Beam Testing of Integrated Circuits
North Holland, 1988
----------
* SIEMENS, Munich, FRG

1989

DAVID R.*, FUENTES A.*, COURTOIS B.
Self-checking logic arrays
In Microprocessors and Microsystems, Butterworth Scientific Ltd, Guilford, England, May 1989

JERRAYA A., MHAYA N.*, JAMIER R.**, BEKKARA N.**, COURTOIS B.
Le compilateur de silicium SYCO
In Technique et Science Informatiques (TSI) Journal, Vol. 8, N°6, Nov/Dec 1989
----------
* IFATEC - Versailles
** SGS Thomson, Grenoble

LAPRIE J.C.*, POWELL D.*, GAUDEL M.C.**, COURTOIS B.
Sûreté de fonctionnement des systèmes informatiques : matériel et logiciel, Dunod, 1989
----------
* LAAS, Toulouse, France
** LRI, Orsay, France
NICOLAIDIS M., COURTOIS B.
Self-checking logic arrays
In Microprocessors and Microsystems, Butterworth Scientific Ltd, Guilford, England, May 1989

1990

KUBALEK E., WOLFGANG E., COURTOIS B.
Proceedings of the 2nd European Conference on Electron and Optical Beam
Testing of Integrated Circuits, North Holland, 1990

1991

NICOLAIDIS M., TORKI K., JERRAYA A.A., COURTOIS B.
Silicon compilation of hierarchical control sections with unified BIST testability
In Microprocessors and Microsystems, Butterworth Scientific Ltd,
Guildford, UK, 1991

1992

CONARD D., RUSSELL J., LAURENT J., SKAF A., COURTOIS B.
Multiple adjacent image processing for automated failure location using electron beam testing
In Microelectronics Reliability, Vol. 32, Number 11, pp. 1615-1620,
Pergamon Press Ltd., Great Britain, 1992

CASTRO ALVES V., LUBASZEWSKI M., NICOLAIDIS M, COURTOIS B.
BIST scheme for embedded multiport RAMs
In Informacije MIDEM N°4, Journal of Microelectronics, Electronic Components and
Materials, pp. 215-221,
Informacije MIDEM, Letnik 22,ST.4 (63), Ljubljana, Yougoslavia, December 1992

MELGARA M.*, WOLFGANG E.**, COURTOIS B., FANTINI F.***, Editors
Proceedings of the 3rd European Conference on Electron and Optical Beam Testing of Integrated Circuits, Elsevier, 1992
----------
*CSELT, Turin, Italy
** SIEMENS, Munich, Germany
*** Parma University, Italy

RUSSELL J.D., VARGAS F.L., COURTOIS B.
E-beam testing using multiple adjacent image processing for prototype validation
The Microelectronic Engineering Journal,
Elsevier Science Publishers, Volume 16, Numbers 1-4, pp 413-420, 1992

1993

COURTOIS B., KERECSEN-RENCZ M.*
Trends in Microelectronics - European Perspectives
In Journal on Communications, Vol. XLIV, pp. 2-7, July 1993
----------
* Technical University of Budapest, Hungary

NICOLAIDIS M., VARGAS F., COURTOIS B.
Design of Built-In Current Sensors for concurrent checking in radiation environments
In IEEE Transactions on Nuclear Science, December 1993

O'BRIEN K., PARK I., JERRAYA A., COURTOIS B.
Synthesis for control-flow dominated machines
Chapter in "Novel Architecture and Synthesis Methodologies for Future
Application-Specific Architecture Design: A perspective",
Ed. F. Catthoor, L. Svensson, Publ. KluwerAcademic, 1993

1994

COURTOIS B.
MPC activities in France (in Japanese)
Invited paper in IEICE Transactions, Japan, 1994

COURTOIS B.
CAD and testing of ICs and systems: where are we going ?
In Journal of Microelectronic System Integration, PLENUM Publishing Corporation,
Vol. 2(3), pp. 139-201, 1994

1995

COURTOIS B.
The activities of Multiproject Chip Service in the world (in Japanese)
Invited paper in the Journal of Future Electron Devices Institute, Tokyo, Japan, 1995

COURTOIS B., DELORI H., PAILLOTIN J.F., TORKI K.
MPC fabrication principles and CMP services
In the Journal of Solid-State Devices and Circuits, Publication by Brazilian Microelectronics Society, Vol. 3, n° 1, July 1995

COURTOIS B., KARAM J.M.
CMP Service: Microsystems low-cost fabrication and CAD tools support
MST-News, January 1995

HELLEBRAND S.*, RAJSKI J.**, TARNICK S.***, VENKATARAMAN S.****, COURTOIS B.
Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers
IEEE Transactions on Computers, Special issue on Fault-Tolerant Computing, 1995
----------
* University of Siegen, Germany; ** Mc Gill University, Montreal, Canada; *** Max-Planck-Society, Fault Tolerant Computing Group at Univ. of Potsdam, Germany; **** C&SRL Laboratory, Univ. of Illinois at Urbana-Champaign, Urbana, USA

KARAM J.M., COURTOIS B., PARET J.M.
Collective fabrication of microsystems compatible with CMOS through the CMP Service
Invited paper in Journal of Materials Science and Engineering B.: Solid-State Materials for
Advanced Technology, Elsevier Science Publishers, December 1995

KOLARIK V., MIR S., LUBASZEWSKI M., COURTOIS B.
Analogue checkers with absolute and relative tolerances
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems,
Vol. 14, n° 5, pp. 607-612, May 1995

NICOLAIDIS M., NORAZ S.*, COURTOIS B.
Generalized fail-safe systems
Book - Commemorative Silver Jubilee Volume IEEE International Symposium on Fault Tolerant
Computing, 25th Anniversary 1971-1995, Editor Dean Siewiorek
----------
* Merlin Gérin, Grenoble, France

1996

KAMARINOS G.*, GUILLEMOT N.**, COURTOIS B., Editors
Proceedings of the 1st European Workshop on Microelectronics Education,
Grenoble, France, 5-6 February 1996, World Scientific Publishing Co Pte Ltd, London, 1996
----------
* LPCS-ENSERG, Grenoble, France ; ** CIME, Grenoble, France

KAMINSKA B.*, COURTOIS B.
IEEE Design & Test of Computers
Special Issue on Design and Test of Analog and Mixed-Signal Circuits
Guest Editors, Summer 1996
----------
* Ecole Polytechnique de Montréal, Canada

KAMINSKA B.*, COURTOIS B.
JETTA - Journal of Electronic Testing, Theory and Applications
Special Issue on Analog and Mixed-Signal Testing
Guest Editors, Volume 9, August/October 1996
----------
* Ecole Polytechnique de Montréal, Canada

MIR S., LUBASZEWSKI M., KOLARIK V.*, COURTOIS B.
Fault-based testing and diagnosis of balanced filters
In Journal: Analogue Integrated Circuits and Signal Processing, Kluwer Academic Publishers
Vol. 11, n°1, September 1996
----------
* Technical Univ. of Brno, Czech Republic

MIR S., LUBASZEWSKI M., COURTOIS B.
Fault-based ATPG for linear analogue circuits with minimal size multifrequency test sets
Journal of Electronic Testing, Theory and Applications (JETTA), Special Issue on Mixed-Signal
Testing, Kluwer Academic Publishers, Volume 9, 1996

MIR S., LUBASZEWSKI M., COURTOIS B.
Unified Built-In Self-Test for fully differential analogue circuits
Journal of Electronic Testing, Theory and Applications (JETTA), Special Issue on Mixed-Signal
Testing, Kluwer Academic Publishers, Volume 9, 1996

SZEKELY V.*, MARTA Cs*, RENCZ M.*, BENEDEK Zs.*, COURTOIS B.
Design for thermal testability (DfTT) and a CMOS realization
In Journal: "Sensors and Actuators", A-Physical, Vol. A55 N°1, Special Issue on Thermal
Investigations of ICs and Microstructures (THERMINIC Workshop 95), July 1996
----------
* Technical University of Budapest, Hungary

SZEKELY V.*, RENCZ M.*, COURTOIS B., Guest Editors
Sensors and Actuators - A-Physical
Special Issue on Thermal Investigations of ICs and Microstructures
(THERMINIC Workshop 95), Vol. A55 N°1, July 1996
----------
*Technical University of Budapest, Hungary

WOLFGANG E.*, COURTOIS B., BALK L.J.**, Editors
Proceedings of the 5th European Conference on Electron and Optical Beam Testing of Electronic Devices, August 27-30, 1995, Wuppertal, Germany
Special Issue of Microelectronic Engineering Journal, Vol. 31, Numbers 1-4 Special Issues, Elsevier, February 1996
----------
* SIEMENS AG, Munich, Germany; ** Wuppertal University, Germany

1997

COURTOIS B.
Access to microsystem technology : the MPC services solution
Microelectronics Journal, Vol.28, N° 4, May 1997

KARAM J.M., COURTOIS B., BOUTAMINE H.
CAD tools bridge microsystems and foundries
In IEEE Design & Test of Computers, Special Issue on Design, Test & CAD in Europe
Summer 1997

SZEKELY V.*, RENCZ M.*, COURTOIS B.
IEEE Transactions on VLSI Systems
Special Issue on Thermal Investigations (THERMINIC Workshop 1996)
Vol. 5, N°3, September 1997
Guest Editors
----------
* Technical University of Budapest, Hungary

SZEKELY V.*, RENCZ M.*, COURTOIS B.
Special Issue on Thermal Investigations of ICs and Microstructures
(THERMINIC Workshop 1995)
Microelectronics Journal, Vol. 28, N° 3, March 1997
Guest Editors
----------
* Technical University of Budapest, Hungary

SZEKELY V.*, RENCZ M.*, COURTOIS B.
Thermal Transient Testing
In Microelectronics Journal, N° 43, May 1997
----------
* Technical University of Budapest, Hungary

SZEKELY V.*, RENCZ M.*, TÖRÖK S., COURTOIS B.
Cooling is a possible way to extend the usability of IDDQ testing
Electronics Letters, Vol.33, N°25, 4th December 1997
----------
* Technical University of Budapest, Hungary

VINCI DOS SANTOS F., BOUTAMINE H., VEYCHARD D., KARAM J.M., COURTOIS B.
Towards space microsystems : design and manufacturing methodologies for CMOS compatible MEMS
MST news, International activities in microsystem technology, N°22, December 1997

1998

BIANCHI R.A., VINCI DOS SANTOS F., KARAM J.M., COURTOIS B., PRESSECQ F.*, SIFFLET S.**
CMOS compatible temperature sensor using lateral bipolar transistor for very wide temperature range applications
Special Issue, Journal Sensors & Actuators A-Physical, Vol. 71, No. 1-2, 1 November 1998
----------
*CNES, Toulouse, France ; **TRS31, Auterive, France

BIANCHI R.A., VINCI DOS SANTOS F., KARAM J.M., COURTOIS B., PRESSECQ F.*, SIFFLET S.**
CMOS-compatible smart temperature sensors
Microelectronics Journal, Vol. 29, N° 9, September 1998
----------
*CNES, Toulouse, France ; ** TRS31, La Pradelle, Auterive, France

COURTOIS B., BLACKBURN*, Guest Editors
IEEE Transactions on Components Packaging and Manufacturing Technology
Special section on Thermal Investigations of ICs and Microstructures (THERMINIC Workshop 1997)
Part A, Vol. 21, No. 3, September 1998
----------
* NIST, Jaithersburg, USA

COURTOIS B., KARAM J.M., LUBASZEWSKI M., SZEKELY V.*, RENCZ M.*, HOFMANN K.**, GLESNER M.**
CAD tools and foundries to boost microsystems development
Materials Sciences and Engineering B51, 1998
----------
* Technical University of Budapest, Hungary; ** Darmstadt University of Technology, Germany

KRIM N., COURTOIS B., VINCI DOS SANTOS F., DENT T.*, PEARSON I.*
A combined approach to the support of SMEs
Advances in information technologies : the Business Challenge
J.-Y. Roger et al. (Eds.), IOS Press, 1998
----------
*Iprias Ltd, UK

LUBASZEWSKI M.*, COURTOIS B.
A reliable fail-safe system
IEEE Transactions on Computers, Vol. 47, No. 2, February 1998
----------
* UFRGS, Porto Alegre, Brazil

RIBAS R.P., LECLERCQ J.L.*, KARAM J.M., COURTOIS B., VIKTOROVITCH P.*
Bulk micromachining characterization of 0.2 µm HEMT MMIC technology for GaAs MEMS design
Materials Sciences and Engineering B51, 1998
----------
* LEAME, Ecole Centrale de Lyon, Ecully, France

RIBAS R.P., LESCOT J.*, LECLERCQ J.L.**, BENNOURI N., KARAM J.M., COURTOIS B.
Micromachined planar spiral inductor in standard GaAs HEMT MMIC technology
IEEE Electron Device Letters, Vol. 19, No. 8, August 1998
----------
* LEMO Laboratory, Grenoble, France; ** LEAME, Ecole Centrale de Lyon, Ecully, France

SZEKELY V.*, RENCZ M.*, COURTOIS B.
Tracing the thermal behavior of ICs
IEEE Design & Test of Computers, April-June 1998
----------
* Technical University of Budapest, Hungary

SZEKELY V.*, RENCZ M.*, COURTOIS B., Guest Editors
Special Issue on Thermal Investigations of ICs and Microstructures (THERMINIC Workshop 1996)
Microelectronics Journal, Vol. 29, N° 4-5, April-May 1998
----------
* Technical University of Budapest, Hungary

SZEKELY V.*, RENCZ M.*, KARAM J.M., LUBASZEWSKI M., COURTOIS B.
Thermal monitoring of self-checking systems
JETTA - Journal of Electronic Testing, Theory and Applications
Special Issue on On-Line Testing, Vol.12, N°1-2, February-April 1998
----------
*Technical University of Budapest, Hungary

SZEKELY V.*, RENCZ M.*, COURTOIS B., Guest Editors
Sensors and Actuators, A-physical
Special issue on Thermal Investigations of ICs and Microstructures (THERMINIC Workshop 1997)
Vol. A71 N°s 1-2, 1 November 1998
----------
*Technical University of Budapest

1999

BLACKBURN D.*, COURTOIS B., Guest Editors
IEEE Transactions on Components and Packaging Technology
Special issue on Thermal Investigations of ICs and Microstructures (THERMINIC Workshop 1998)
Vol.22, No.2, June 1999
----------
* NIST, Jaithersburg, USA

COURTOIS B.
Quelques tendances en microélectronique
Bulletin de liaison du CRITT MICROLOR
No.12, January-February-March 1999

COURTOIS B., SZEKELY V.*, RENCZ M.*
Thermal investigations of ICs and Microstructures
In "Encyclopedia of Microcomputers", a multi-volume work, Executive Ed. A. Kent, J.G.
Williams, (Publishers: Marcel Dekker Inc. of New-York), Vol. 23, pp. 361-389, 1999
----------
* Technical University of Budapest, Hungary

COURTOIS B., DEMIDENKO S.*, Editors
Design, Characterization and Packaging for MEMS and Microelectronics
Proceedings of SPIE, Vol. 3893, 1999

COURTOIS B., CRARY S.B.*, EHRFELD W.**, FUJITA H.***, KARAM J.M.****,
MARKUS K.*****, Editors
Design, Test, and Microfabrication of MEMS and MOEMS
Proceedings of SPIE, DTM’99, Paris, France, Vol. 3680, 30 March - 1 April 1999
----------
* University of Michigan, USA; ** IMM, Maynz, Germany; *** University of Tokyo, Japan;
**** MEMSCAP, Grenoble, France; ***** Cronos Integrated Microsystems, Inc. , North Carolina, USA

COURTOIS B., BLANTON S.*, Guest Editors
Special Issue on MEMS, IEEE Design and Test of Computers
October – December 1999
----------
* Carnegie Mellon University, Pittsburg, PA, USA

PALAN B., SANTOS F.V., KARAM J.M., COURTOIS B., HUSAK M.*
Sensor interface circuit for ISFET based sensors
Journal of Solid-State Devices and Circuits, Vol. 7, No. 1, February 1999
----------
* Czech Technical Univesity in Prague, Prague, Czech Republic

PALAN B., SANTOS F.V., KARAM J.M., COURTOIS B., HUSAK M.*
New ISFET sensor interface circuit for biomedical applications
Journal Sensors and Actuators B : Chemical, Vol. 57, No. 1-3, pp. 63-68, 1999
----------
* Czech Technical Univesity in Prague, Prague, Czech Republic

SZEKELY V.*, RENCZ M.*, COURTOIS B., Guest Editors
Microelectronics Journal
Special Issue on Thermal Investigations of ICs and Microstructures (THERMINIC Workshop 1998)
Vol. 30, No.11, November 1999
----------
*Technical University of Budapest, Hungary

SZEKELY V.*, RENCZ M.*, COURTOIS B.
A step forward in the transient thermal characterization of chips and packages
Microelectronics Reliability, Vol. 39, pp. 89-96, 1999

2000

BIANCHI R.A., KARAM J.M., COURTOIS B.
Analog ALC crystal oscillators for high-temparture applications
IEEE Journal of Solid-State Circuits, Vol. 35, N°1, January 2000 (ISSN 0018-9200)

BIANCHI R.A.*, KARAM J.M.**, COURTOIS B., NADAL R., PRESSECQ F.***,
SIFFLET S.***
CMOS-compatible temperature sensor with digital output for wide temperature range
Applications
Microelectronics Journal. Vol.31, Nos.9-10, Sept.-Oct. 2000
----------
* STMicroelectronics, Crolles, France ; ** MEMSCAP, Grenoble, France ; *** CNRS, Toulouse, France

BLACKBURN D.*, COURTOIS B., LASANCE C.**, Guest Editors
Special Issue On Thermal Investigations of ICs and Microstructures (THERMINIC 1999)
IEEE Transactions on Components and Packaging Technologies, Vol. 23, No.3, September 2000
----------
* NIST, USA; ** Philips, The Netherlands

COURTOIS B., CRARY S.B.*, GABRIEL K.J.**, KARAM J.M.***, MARKUS K.****,
TAY A.A.O.*****, Editors
Design, Test, Integration and Packaging of MEMS/MOEMS
Proceedings of SPIE, DTIP’2000, Paris, France, Vol. 4019, 9-11 May 2000
----------
*University of Michigan, USA; **Carnegie Mellon Univ., Pittsburgh, Pa, USA; *** MEMSCAP, Grenoble, France; ****Cronos Integrated Microsystems, Inc. , North Carolina, USA; *****National University of Singapore, Singapore

COURTOIS B., GUILLEMOT N.*, KAMARINOS G.**, STEHELIN G.***, Editors
Microelectronics Education
Proceedings of the 3rd European Workshop on Microelectonics Education (EWME’2000),
Aix-en-Provence, France 18-19 May 2000, (ISBN 0-7923-6456-2)
----------
* CIME/INPG, Grenoble, France ; ** LPCS/CNRS, Grenoble, France ; *** St University (ST Microelectronics), Fuveau, France

COURTOIS B., RENCZ M.*, LASANCE C**., SZEKELY V.*, POPPE A.***, Editors
Proceedings of 6th International Workshop on THERmal Investigations of ICs and Systems
(THERMINIC 2000), Budapest, Hungary, September 24-27 2000 (ISBN 2-913329-51-9)
----------
*Technical University of Budapest, Hungary; ** Philips, The Netherlands; *** MicRed Microelectronics Res & Dev Ltd., Hungary

 

HENINI M.*, COURTOIS B., Editors
Papers presented at the 1999 Workshop on Thermal Investigations of ICs and Microstructures
(THERMINIC 1999)
Microelectronics Journal, Vol. 31, Nos 9-10, September – October 2000 (ISSN 0026-2692)
----------
* University of Nottingham, UK

JEANNOT J.C.*, SCHROPFER G.**, GOY J., COURTOIS B., de LABACHELERIE M.*
Micro-accéléromètre intégré trois axes
Chapter in « Microcapteurs et Microsystèmes Intégrés », Nano et Micro Technologies, edited by
D. Hauden, Hermès, Vol. 1, N°1, 2000, (ISBN 2-7462-0142-9)
----------
* LPMO/IMFC, Besançon, France; ** SENSONOR/ASA, Horten, Norway

LUBASZEWSKI M.*, MIR S., KOLANIK V.**, NIELSEN C.***, COURTOIS B.
Design of self-checking fully differential circuits and boards
IEEE Transactions on VLSI Systems, Vol. 8, No. 2, April 2000
----------
*UFRGS, Porto Alegre, Brazil; ** University of Brno, Brno, Czechoslovakia; ***DEIF A/S, Danemark

MIR S., CHARLOT B., COURTOIS B.
Extending fault-based testing to microelectromechanical systems
Journal of Electronic Testing : Theory and Applications, Vol. 16, No. 3, June 2000

PALAN B., SANTOS F.V., COURTOIS B., HUSAK M.*
Microsystems for space applications
full paper from AED'99 Prague will be published in Journal Acta Polytechnica-Journal of Advanced Engineering, Vol. 40, No.3/2000 (ISSN: 1210- 2709)
---------
* Czech Technical Univesity in Prague, Prague, Czech Republic

RENCZ M.*, SZEKELY V.*, TÖRÖK S.*, TORKI K., COURTOIS B.
IDDQ testing of submicron CMOS - by cooling ?
Journal of Electronic Testing Theory and Applications, N°16, pp. 453-461, 2000
----------
*Technical University of Budapest, Hungary

SZEKELY V.*, RESS S.*, POPPE A.*, TOROK S.*, MAGYARI D.*, BENEDEK Z.*, TORKI K., COURTOIS B., RENCZ M.*
New approaches in the transient thermal measurements
Microelectronics Journal, Vol.31, Nos.9-10, September-October 2000
----------
* Technical University Budapest, Hungary

2001

BENEDEK Zs.*, COURTOIS B., FARKAS G.**, KOLLAR E., MIR S., POPPE A.*, RENCZ M.*, SZEKELY V.*, TORKI K.
A scalable multi-functional thermal test chip family: design and evaluation
Journal of Electric Packaging (American Society of Mechanical Engineers), Vol. 123, No. 4,
December 2001
----------
* Technical University Budapest, Hungary; **MicRed Microelectronics Res & Dev Ltd., Hungary

CHARLOT B., MIR S., PARRAIN F., COURTOIS B.
Generation of electrically induced stimuli for MEMS self-test
Journal of Electronic Testing : Theory and Applications (JETTA), Kluwer Academic
Publishers, Vol.17, No. 6, December 2001

COURTOIS B., Guest Editor
Special double issue on MEMS technology (DTIP 2000)
An International Journal Analog Integrated Circuits and Signal Processing (ALOG),
Kluwer Academic Publishers, Volume 29, Nos. 1/2, October/November 2001

COURTOIS B.,
Editorial Board in the Proceedings of the 8th Conference Computer Networks
Studia Informatica, Vol. 22 , No.1 (43), 2001

COURTOIS B., LASANCE C.**, Guest Editors
Special Issue On Thermal Investigations of ICs and Microstructures (THERMINIC Workshop 2000)
IEEE Transactions on Components and Packaging Technologies, Vol.24, No.4, December 2001
----------
* NIST, USA; ** Philips, The Netherlands

COURTOIS B., RENCZ M.*, LASANCE C**., SZEKELY V.*, Editors
Proceedings of 7th International Workshop on THERmal Investigations of ICs and Systems
(THERMINIC 2001), Paris, France, September 24-27, 2001
----------
*Technical University of Budapest, Hungary; ** Philips, The Netherlands

COURTOIS, B., KARAM, J.M.*, LEVITAN, S.P.**, MARKUS, K.***, TAY, A.A.O.****, WALKER, J.A.*****, Editors
Design, Test, Integration, and Packaging of MEMS/MOEMS (DTIP 2001), 25-27 April
2001, Cannes, France, SPIE Proceedings Series, Vol. 4408, 2001
----------
* MEMSCAP, Grenoble, France; ** University of Pittsburgh, USA; *** JDS Uniphase/Cronos, USA; **** National University of Singapore;
***** Tellium Inc., USA

GOY J., COURTOIS B., KARAM J.M.*, PRESSECQ F.**
Design of an APS CMOS image sensor for low light level applications using standard CMOS technology
An International Journal Analog Integrated Circuits and Signal Processing (ALOG),
Kluwer Academic Publishers, Volume 29, Nos. 1/2, October/November 2001
----------
* MEMSCAP, Grenoble, France ; ** CNES, Toulouse, France

SZEKELY V.*, RENCZ M.*, POPPE A.*, COURTOIS B.
THERMODEL: A tool for thermal model generation, and application for MEMS
An International Journal Analog Integrated Circuits and Signal Processing (ALOG), Kluwer Academic Publishers, Volume 29, Nos. 1/2, October/November 2001
----------
* Technical University Budapest, Hungary

2002

ABBOTT D., COURTOIS B., Guest Editors
Design, modeling and simulation in microlectronics and MEMS smart electronics and MEMS
Microelectronics Journal, Vol. 23, Nos 1-2, January-February 2002

PARRAIN F., CHARLOT B., MIR S., COURTOIS B.,
Capteur infrarouge CMOS à thermopiles comportant des fonctions de selft-test
Journal Nano et Micro Technologies – microcapteurs et microsystèmes intégrés, Hermès
Sciences Publications, Volume 1, N°3-4, January 2002

2003

COURTOIS B.
Infrastructures for education and research: from national initiatives to worldwide development
Invited paper at Festkolloquium Zukunftstrendsin der Mikroelektronik Anlass: von 60. Geburtstag Professor Manfred Glesner, Darmstadt, Germany, August 29, 2003

COURTOIS B., MARKUS K.*, KORVINK J.**, KARAM J.M.***, BERGMAN K.****, MICHEL B.****, Editors
Design, Test, Integration, and Packaging of MEMS/MOEMS (DTIP’03), May 5-7, 2003
Mandelieu – La Napoule, France, SPIE Proceedings
----------
* JDS Uniphase/Cronos, USA ; ** Univ. of Freiburg, Germany ; *** MEMSCAP, Grenoble, France ; **** Columbia Univ., USA ; ***** IZM, Berlin, Germany

COURTOIS B., Guest Editor
Special Issue on DTIP 2002 (The Symposium on Design, Test, Integration of MEMS/MOEMS held in Cannes, May 6-8, 2002)
An International Journal on Analog Integrated Circuits and Signal Processing, Kluwer Academic Publishers, Vol.37, No.1, October 2003

COURTOIS B., RENCZ M.*, LASANCE C.**, SZEKELY V.***, Editors
Proceedings of 9th International Workshop on THERmal Investigations of ICs and Systems
(THERMINIC’03), Aix-en-Provence, France, 24-26 September 2003
----------
* MicRed Microelectronics Res & Dev Ltd., Hungary; ** Philips, The Netherlands; *** Budapest University of Technology and Economics, Hungary

2004

CHARLOT B., PARRAIN F., GALY N., BASROUR S., COURTOIS B.
A sweeping mode integrated fingerprint sensor with 256 tactile microbeams
IEEE Journal of Microelectromechanical Systems, Vol 4, N°13, August 2004

COURTOIS B., KORVINK J.G.*, Guest Editors
Special Issue on DTIP 2003
An International Journal on Analog Integrated Circuits and Signal Processing, Kluwer Academic Publishers, Vol. 40, No. 2, August 2004
----------
* Albert Ludwig University in Freiburg, Germany

COURTOIS B., RENCZ M.*, LASANCE C.**, SZEKELY V.***, Editors
Proceedings of 10thInternational Workshop on THERmal Investigations of ICs and Systems
(THERMINIC’04), Sophia Antipolis, Côte d'Azur, France, 29 September - 1 October 2004
----------
* MicRed Microelectronics Res & Dev Ltd., Hungary; ** Philips, The Netherlands; *** Budapest University of Technology and Economics, Hungary

COURTOIS B., MARKUS K.*, KORVINK J.G.**, KARAM J.M.***, IONESCU A.*, ESASHI M.*, Editors
Proceedings of Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2004), Montreux, Switzerland, May 12-14, 2004

COURTOIS B., MICHEL B.*, Editors
Foreword to Special Issue on The Symposium on Design, Test, Integration of MEMS/MOEMS (DTIP 2003)
Research Journal on Microsystem Technologies, Springer Publishers, Vol.10, No.5, August 2004
--------
* IZM, Berlin, Germany

2005

COURTOIS B., MARKUS K.* et al., Editors
Proceedings of Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2005), Montreux, Switzerland, June 1-3, 2005

COURTOIS B., RENCZ M.*, LASANCE C.**, SZEKELY V.***, Editors
Proceedings of 11thInternational Workshop on THERmal Investigations of ICs and Systems
(THERMINIC’05), Belgirate, Lake Maggiore, Italy, September 27– 30, 2005
----------
* MicRed Microelectronics Res & Dev Ltd., Hungary; ** Philips, The Netherlands; *** Budapest
University of Technology and Economics, Hungary

COURTOIS B., Guest Editor
Special issue on European Micro and Nano Systems (EMN04) held in Paris, 20–21 October, 2004 
Microelectronics Journal, Vol. 36, No. 7, Pages 613-686, July 2005

COURTOIS B., Guest Editor
Special Issue on selected papers on Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2004)
An International Journal on Analogue Integrated Circuits and Signal Processing, Vol.44, No.2, August 2005

DE VENUTO D.*, COURTOIS B., Editors
Proceedings of 1st International Workshop on Advances in Sensors and Interfaces (IWASI’05), Bari, Italy, April 19-20, 2005 (ISBN 88-8231-323-9)
----------
* Politecnino di Bari, Italy

ROMAN C., CIONTU F., COURTOIS B.
Nanoscopic modeling of a carbon nanotube force-measuring biosensors
Molecular Simulations Journal, Taylor & Francis Publisher, Vol.31, No.2-3, 123 - 133 , 15 February –
15 March 2005

2006

COURTOIS B., MARKUS K.* et al., Editors
Proceedings of Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2006), Stresa, Italy, 26-28 April 2006

COURTOIS B., RENCZ M.*, LASANCE C.**, SZEKELY V.***, Editors
Proceedings of 12thInternational Workshop on THERmal Investigations of ICs and Systems
(THERMINIC’06), Nice, Côte d'Azur, France, September 27-29, 2006
----------
* MicRed Microelectronics Res & Dev Ltd., Hungary; ** Philips, The Netherlands; *** Budapest
University of Technology and Economics, Hungary

SHAKOURI A.*, KANG S.M.*, BAR-COHEN A.**, COURTOIS B., Guest Editors
Scanning the Special Issue on On-Chip thermal engineering
Proceedings of the IEEE, Vol.94, No.8, pp. 1-3, August 2006
----------
* University of California Santa Cruz, USA; ** University of Maryland, College Park, USA

COURTOIS B., MICHEL B.*, Editorial
Special Issue on the Symposium on Design, Test, Integration of MEMS/MOEMS (DTIP’05)
Research Journal on Microsystem Technologies, Springer Publishers, Vol. 12, Nos 10-11, September 2006
----------
* IZM, Berlin, Germany

COURTOIS B., Guest Editor
Special Issue on selected papers on Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2005)
An International Journal on Analogue Integrated Circuits and Signal Processing

2007

COURTOIS B., KARAM J.M.*, Editors
Proceedings of Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2007), Stresa, Italy, 25--27 April 2007
----------
* MEMSCAP, Crolles, France

GALY N., CHARLOT B., COURTOIS B.
A full fingerprint verification system for a single-line sweep sensor
IEEE Sensors, vol.7, n°7, July 2007

SZEKELY V.*, RENCZ M.**, COURTOIS B.
Die attach quality testing structure function evaluation
Book chapter 23 in Micro- and opto-electronic materials and structures: Physics, mechanics, design, reliability, packaging, by E. Suhir, Y.C Lee, C.P. Wong (Editors), Springer, Vol. I, pp.629-650, 2007
----------
* Budapest University of Technology and Economics, Hungary; ** MicRed Microelectronics Res & Dev Ltd.,Hungary

COURTOIS B., RENCZ M.*, LASANCE C.**, SZEKELY V.***, Editors
Proceedings of 13thInternational Workshop on THERmal Investigations of ICs and Systems
(THERMINIC’07), Budapest, Hungary, September 17-19, 2007
----------
* MicRed Microelectronics Res & Dev Ltd., Hungary; ** Philips, The Netherlands; *** Budapest University of Technology and Economics, Hungary

COURTOIS B.
Proceedings of ENS 2007, Paris, 3-4 December 2007

COURTOIS B., MICHEL B.*, Editorial
Special Issue on the Symposium on Design, Test, Integration of MEMS/MOEMS (DTIP’06)
Research Journal on Microsystem Technologies, Springer Publishers, October 2007
----------
* IZM, Berlin, Germany

COURTOIS B., Guest Editor
Special Issue on selected papers on Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2006)
An International Journal on Analogue Integrated Circuits and Signal Processing

2008

BRIGHT V., BOUROUINA T., COURTOIS B., DESMULLIEZ M., KARAM J.M., WANG G.J.
Proceedings of Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2008), Nice, 9-11 April 2008

COURTOIS B., RENCZ M.*, LASANCE C.**, SZEKELY V.***, Editors
Proceedings of 13thInternational Workshop on THERmal Investigations of ICs and Systems (THERMINIC’08), Rome, Italy, September 24-26, 2008
----------
* MicRed Microelectronics Res & Dev Ltd., Hungary; ** Philips, The Netherlands; *** Budapest University of Technology and Economics, Hungary

COURTOIS B., Guest Editor
Special Issue ENS 2006, Microelectronics Journal 39 (2008)

COURTOIS B. et al, Editors
Proceedings of Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2008), Nice, French Riviera, France, April 9-11, 2008

COURTOIS B., RENCZ M.*, LASANCE C.**, SZEKELY V.***, Editors
Proceedings of 12thInternational Workshop on THERmal Investigations of ICs and Systems (THERMINIC’08), Rome, Italy, September 24-26, 2008
----------
* MicRed Microelectronics Res & Dev Ltd., Hungary; ** Philips, The Netherlands; *** Budapest University of Technology and Economics, Hungary

2009

COURTOIS B., RENCZ M.*, Editors
Proceedings of 15thInternational Workshop on THERmal Investigations of ICs and Systems (THERMINIC’09), ISBN 978-2-35500-010-2, Leuven, Belgium, 7-9 October 2009
----------
* Budapest University of Technology and Economics, Hungary

COURTOIS B., Guest Editor
Special issue on European Micro and Nano Systems (ENS 2007) held in Paris, 3-4 December 2007, Microelectronics Journal, Vol. 40, No. 4-5, Pages 655-710, April-May 2009

COURTOIS B., DE VENUTO D.* Guest Editors
Special issue on 2nd IEEE International Workshop on Advances in Sensors and Interfaces (IWASI 2007) held in Bari, 26-27 June 2007, Microelectronics Journal, Vol. 40, No. 9, September 2009
----------
* Politecnico di Bari, Italy

COURTOIS B. et al, Editors
Proceedings of Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2009), ISBN 978-2-35500-009-6, Rome, Italy, 1-3 April 2009

2010

COURTOIS B., RENCZ M.*, Editors
Proceedings of 16thInternational Workshop on THERmal Investigations of ICs and Systems (THERMINIC’10), ISBN 978-2-35500-012-6, Barcelona, Spain, 6-8 October 2010
----------
* Budapest University of Technology and Economics, Hungary

COURTOIS B. et al, Editors
Proceedings of Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2010), ISBN 978-2-35500-011-9, Seville, Spain, 5-7 May 2010

2011

COURTOIS B.
Paper in the book “Grenoble, cité internationale, cité d’innovations”, by Daniel BLOCH
To appear in 2011

COURTOIS B., DI PENDINA G., TORKI K.
Chapter in the book “Advances in Mechanical Engineering Research”
Published by NOVA Publishers
To appear in 2011

COURTOIS B., RENCZ M.*, Editors
Proceedings of 16thInternational Workshop on THERmal Investigations of ICs and Systems (THERMINIC’11), ISBN 978-2-35500-018-8, Paris, France, 27-29 September 2011
----------
* Budapest University of Technology and Economics, Hungary

COURTOIS B.
Chapter in the book “CMOS Biomicrosystems: Where Electronics Meet Biology”, by Krysztof INIEWSKI
Published in 2011 by John Wiley & Sons, ISBN 978-0-470-64190-3

COURTOIS B. et al, Editors
Proceedings of Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2011),
ISBN 978-2-35500-013-3, Aix-en-Provence, France, 11-13 May 2011

C) CONFERENCES AND WORKSHOPS, 1982-2012

1982

COURTOIS B.
Performance modeling of partially self-checking systems
12th Fault Tolerant Computing Symposium, Santa Monica, June 1982, USA

MARCHAL P., COURTOIS B.
On detecting the hardware failures disrupting programs in microprocessors
12th Fault Tolerant Computing Symposium, Santa Monica, June 1982, USA

COURTOIS B., EYNARD J. P., MARCHAL P., POSTIGO C.
Test en-ligne et hors-ligne : classification et résultats récents
3ème Colloque International sur la Fiabilité et la Mayntenabilité, Toulouse, Octobre 1982

COURTOIS B., MARCHAL P., NICOLAIDIS M.
Design of testable microprocessors
Test Technology Newsletter, 1982

COURTOIS B.
Test generation for microprocessors
Invited paper, 5th Fault Tolerant Systems and Diagnostics, Katowice, Pologne, September 1982 - Reporté à Février 1983

BEN ROMDHANE M., COURTOIS B.
Error confinement/data recovery in distributed systems
2nd Symposium on reliability in distributed software and data base systems
Pittsburgh, July 1982, USA
BAILLE G., COURTOIS B., LAURENT J.
Analyse de défaillances par microscopie électronique
International Conf. on quality of electronic devices : Strategy for the next years, Bordeaux, France, Octobre 1982

COURTOIS B.
Failure analysis using SEM
Invited paper at 2nd Symposium on Microelectronics, Sao Paulo, Brésil, July 27/29 1982

1983

COURTOIS B.
E-beam testing of integrated circuits
Workshop on design for testability, Vail Colorado, Avril 1983, USA

COURTOIS B.
Built in self test during the life cycle of integrated circuits
Built In Self Test Workshop, Kiawah Island, March 15-16 1983 USA

RUBAT DU MERAC C., JUTIER P., LAURENT J., COURTOIS B. (En coopération avec le CICG et l'INSERM)
A new doMayn for image analysis : VLSI circuit testing, with ROMUALD, specialized in parallel image processing
British Pattern Recognition Association, Oxford, Sept. 19-21 1983
GB Pattern Rcognition Letters 1/5-6:347-57

BERGER SABBATEL G., COURTOIS B.
E-beam testing strategies for VLSI
European Conference on circuit theory and design 1983, Stuttgart
September 5-9 1983, FRG

COURTOIS B.
E-beam testing of integrated circuits
Workshop on design for testability, Vail, Colorado, Avril 1983, USA

BAILLE G., COURTOIS B., RUBAT DU MERAC C.
Inspection automatique de circuits intégrés
INOVA 83, Avril 1983, Paris

BAILLE G., BERGHER L., COURTOIS B., LAURENT J., RUBAT DU MERAC C.
Testing for failure analysis : new tools and new test methods
13th Fault Tolerant Computing Symposium Milano June 1983

MARCHAL P., COURTOIS B., NICOLAIDIS M.
Low level fault modeling and design consequences
VLSI Test Workshop, Munich, March 1983

BAILLE G., COURTOIS B., LAURENT J.
E-beam test methodologies for VLSI
IFIP VLSI Test Workshop, Munich, March 1983

JANSCH I., COURTOIS B.
Design of checkers based on analytical fault hypotheses
3ème Symposium on Microelectronics. Sao Paulo, Brazil, July 1983

COURTOIS B.
Testing integrated circuits
Invited paper, Journées Conception logique, Barcelone, Spain, December 1983

BAILLE G., COURTOIS B., LAURENT J., RUBAT DU MERAC C.
Prospective of methodologies for microprocessors and memories failure analysis
Journées d'électronique : test des circuits intégrés, Lausanne, October 83

1984

COURTOIS B.
Methodology for the use of an electron beam tester of integrated circuits. Invited paper
Int. Symp. on circuits and Systems, Montréal, Canada, May 1984

BERGHER L., LAURENT J., RUBAT DU MERAC C., COURTOIS B.
Inspection automatique et test MEB de circuits intégrés
Congrés Fiabilité et Mayntenabilité, Peros-Guirec, May 1984

NICOLAIDIS M., COURTOIS B.
Design of self-checking N-MOS (H-MOS) integrated circuits
NATO Avionics panel symposium, Bruxelles, May 1984

BERGHER L., LAURENT J., RUBAT DU MERAC C., COURTOIS B.
Inspection Automatique et test MEB de circuits intégrés
Congrès Fiabilité et Mayntenabilité, Peros-Guirec, May 1984

COURTOIS B.
Advances in test pattern generation for integrated circuits, ATE 84, Paris, December 1984

RUBAT DU MERAC C., BAILLE G., COURTOIS B.
Inspection automatique de la qualité des circuits intégrés
Colloque qualité des composants électroniques, Bordeaux, March 1984

COURTOIS B.
Design of NMOS self-checking systems.
Workshop on Design for Testability, Vail, USA, April 1984

JANSCH I., COURTOIS B.
On the design of checkers based on analytical fault hypotheses
ESSIRC 1984 – Edinburgh, UK, August 1984

NICOLAIDIS M., JANSCH I., COURTOIS B.
Strongly code disjoint checkers
14th Fault-Tolerant-Computing Symposium – Orlando, USA, June 1984

COURTOIS B.
CAD needs with respect to fault medeling
Euromicro 1984, Coppenhaguen, DK, September 1984

SAHAMI H., COURTOIS B.
Functional vs. analytical test of RAMs
2nd conference on Fault Tolerant Systems, Bonn – RFA, September 1984

1985

NICOLAIDIS M., COURTOIS B.
Design of self-checking systems based on analytical fault hypotheses
VLSI 1985, Academic Press, Tokyo, Japan., August 1985

JANSCH I., COURTOIS B.
Strongly Language Disjoint checkers
15th Fault Tolerant Computing Symposium. Ann Arbor, Michigan, USA, .June 1985

COURTOIS B.
Les circuits intégrés sont ils testables ?
Convention Informatique, Paris, September 1985

NICOLAIDIS M., COURTOIS B.
Layout rules for the design of self-checking circuits
VLSI 85, Tokyo, Japan, August 1985

JERRAYA A., ROUGEAUX F.R., ROSIER E., COURTOIS B.
A hierarchical symbolic layout tool STYX
VLSI 85, Tokyo, Japan, August 1985

JERRAYA A., GUIGUET I., JAMIER R., ROUGEAUX F.R., COURTOIS B.
An environnement for automatic design and validation of large integrated circuits.
Journées sur : Technologie et conception des circuits intégrés au silicium, Barcelone-Spain, December 1985

1986

OSSEIRAN A. NICOLAIDIS M., SHCOELLKOPF J.P., COURTOIS B, LE TRUNG B.*,
BIED CHARRETON D.*
Design of a self-checking microprocessor for real-time application in transportation systems.
5th IFAC/ IFIP/ IFORS, Vienna - Austria, July 1986
----------
* Institut de Recherche des Transports

JERRAYA A., VARINOT P., JAMIER R., COURTOIS B.
SYCO : A silicon compiler for VLSI circuits described by algorithms.
Physical Design 1986, Houston, Texas, USA, March 1986

JERRAYA A., VARINOT P., JAMIER R., COURTOIS B.
Principles of the SYCO compiler
This report will appear in Design Automation Conference, Las Vegas, June 1986

NICOLAIDIS M., COURTOIS B.
Design of NMOS Strongly Fault Secure Circuits using unidirectional errors detecting codes
This report will appear in Fault Tolerant Computing Symposium 16, Vienna, July 1986

BASCHIERA D., COURTOIS B.
Advances in fault modeling and test pattern generation for CMOS
This report will appear in International Conference on Computer Design, New York, October 1986

BERGHER L., LAURENT J., COLLIN J. P.*, COURTOIS B.
Towards automatic analysis of complex ICs through e-beam testing
This report will appear in International Test Conference, Washington USA, September 1986
----------
* IBM France

FUENTES A.*, DAVID R., COURTOIS B.
Random testing versus deterministic testing of RAMs
This report will appear in Fault Tolerant Computing Symposium 16, Vienna, July 1986
----------
* Laboratoire d'Automatique de Grenoble

NICOLAIDIS M., COURTOIS B.
Self-Checking Circuits: from the theory to Practice
This report will appear in SAFECOMP'86, Sarlat, France, 14-17 October 1986

JERRAYA A., VARINOT P., JAMIER R., COURTOIS B.
SYCO a silicon compiler for VLSI circuits described by algorithms
Physical Design Workshop, Houston Texas, USA, March 1986

REIS R.*, JERRAYA A., COURTOIS B.
A microprocessor design using the SYCO COMPILER
Workshop Italy, May 1986
----------
* PGCC/UFRGS Porto Alegre BRAZIL

BASCHIERA D., COURTOIS B.
BIST for CMOS
Built In Self Test Workshop, Kiawah Island, Charleston, USA, March 1986

1987

OSSEIRAN A., NICOLAIDIS M., COURTOIS B, LE TRUNG B.*, BIED CHARRETOND.*
Microprocesseurs à contrôle incorporé
Colloque sur les Transports terrestres : automatismes, communication, systèmes, Paris, 3 – 5 February 1987
---------------
* Institut National de Recherche sur les Transports et leur Sécurité

BERGHER L.*, GUIGUET I., MARZOUKI M., COURTOIS B.
Electron-beam testing: failure analysis and debug of integrated circuits
New directions for IC testing, Winnipeg, Canada, April 8 – 10 1987
----------------
* THOMSON EFCIS Grenoble, France

JERRAYA A., MHAYA N., COURTOIS B.
About Controlling SILICON Compiler Output
Presented at the International Workshop on Logic Synthesis
Research Triangle Park, North Carolina, USA, May 12 - 15, 1987

MICOLLET D., COURTOIS B.
Electron beam sensitive devices design methods
Presented at the ESSIRC 87, Bad Soden, FRG, September 1987

GUIGUET I., MARZOUKI M., COURTOIS B.
An integrated debugging system based on e-beam test
1st European Conference on Electron and Optical beam testing of integrated circuits,
Grenoble, France, December 9-11, 1987

SAVART D., COURTOIS B.
Automatic failure analysis of VLSI circuits using e-beam
1st European Conference on Electron and Optical beam testing of integrated circuits,
Grenoble, France, December 9-11, 1987

MICOLLET D., COURTOIS B.
Design methods of electron beam sensitive devices in NMOS and CMOS technologies
1st European Conference on Electron and Optical beam testing of integrated circuits,
Grenoble, France, December 9-11, 1987

COLLIN J.P.*, COURTOIS B.
Device testing and SEM testing tools
Presented at the Nato ASI on testing and diagnosis of VSLI and ULSI, Como, Italy, June-July 1987
-------------
* IBM Compec, Bordeaux

JERRAYA A., COURTOIS B.
Architecture experimentation with SYCO
Presented at the Advanced summer course on logic synthesis and silicon compilation for VLSI design,
L'Aquila, Italy, July 13-18, 1987

NICOLAIDIS M., COURTOIS B.
Systèmes autotestables : théorie et pratique
Présenté au séminaire Tuniso-français d'Informatique,
Tunis, 27-29 avril 1987

COCITO M.*, MELGARA M.*, PROCTOR G.**, VERNAY Y.J.***, BOLAND F.****, COURTOIS B.
ADVICE : Automatic Design Validation of Integrated Circuits using E-Beam
Presented at Esprit Conference, Brussels, Belgium, September 1987
----------
* C.S.E.L.T., Torino, Italy; ** B.T.R.L., Ipswich, UK; *** C.N.E.T., Meylan, France ; **** Trinity College, Dublin, Ireland.

1988

JERRAYA A., BONDONO Ph., GERONIMI J.P., HORNIK A., COURTOIS B.
Nautile: a physical design environment based on a object oriented data manager
Presented at the Annual IEEE Design Automation Workshop,
Apache Junction, USA, January 13-15, 1988

TORKI K., NICOLAIDIS M., JERRAYA A.A., COURTOIS B.
UBIST version of the SYCO's control section compiler
IEEE International Conference on Computer Design, Rye Brook, New York, USA,
October 3-5, 1988

CAISSO J.P., COURTOIS B.
Fault simulation and test pattern generation at the multiple-valued switch level
International Test Conference, Washington, USA, September 12-14, 1988

MARZOUKI M., COURTOIS B.
PESTICIDE: a Prolog-written Expert System as a Tool for Integrated Circuits Debugging
Sixth European Workshop on Design For Testability, Garderen, The Netherlands, June 13-16, 1988

CAISSO J.P., COURTOIS B.
Fault simulation and test pattern generation at the multiple-valued switch level
IEEE Workshop on Design for Testability, Vail, Colorado, USA, April 19-22, 1988

MARZOUKI M., COURTOIS B.
Debugging integrated circuits : a knowledge-based approach
Presented at 11th Fault-Tolerant Systems and Diagnostics, Suhl, German Democratic Republic, June 6-9, 1988

MARZOUKI M., LAURENT J., COURTOIS B.
Testing integrated circuits from an ergonomic point of view : the expert system PESTICIDE
Presented at AFCET Conference "ERGO-IA", Biarritz, October 4-6, 1988

1989

CABESTANY MONCUSI J., LAURENT J., CONARD D., COURTOIS B.
Technis per l’analisi del funcionament de circuits integrats emprant microscopia electronica
Trobades Cientifiques de la Mediterranea Microelectronica, Menorca, Spain, September 1989

COLLIN J.P.*, CONARD D., COURTOIS B., DENIS P.*, SAVART D.
Failure analysis using E-beam
Invited paper at 2nd European Conference on Electron and Optical Beam Testing of Integrated Circuits,
Duisburg, FRG, October 1-4, 1989
----------
* IBM COMPEC 6 CESTAS, France

CONARD D., COURTOIS B.
Automatic failure analysis on VLSI circuits by electron beam test
4th International Conference on Quality in electronic components, Bordeaux, France, April 25-28, 1989

CONARD D., COURTOIS B.
Failure analysis using E-beam : a fully automatic process
Invited paper at 2nd European Conference on Electron and Optical Beam Testing of Integraed Circuits
Duisburg, FRG, October 2-4, 1989

DARLAY F., COURTOIS B.
A BIST device for CMOS circuits
Built-in-Self-Test Workshop, Charleston, USA, March 29-31, 1989

DARLAY F., COURTOIS B.
Test and design for testability of reconvergent fan-out CMOS logic networks
International Test Conference 1989, Washington, USA, August 29-31, 1989

DARLAY F., COURTOIS B.
Definition & evaluation of a test pattern generator for CMOS circuits
1st European Workshop on Dependable Computing (EWDC-1), Toulouse, France, March 1-3, 1989

DARLAY F., COURTOIS B.
Test sequence generation for built-in-self-test of CMOS circuits
12th Fault Tolerant Systems and Diagnostics Conference (FTSD-12), Prague, Tchecoslovaquia, September 4-7, 1989

JERRAYA A.A., COURTOIS B.
Architecture experimentation with the behavioral silicon compiler SYCO
Invited paper at MELECON’89, Lisbon, Portugal, April 11-13, 1989

MARZOUKI M., COURTOIS B.
Debugging integrated circuits : A.I. can help !
European Test Conference, Paris, France, April 12-14, 1989

MARZOUKI M., LAURENT J., COURTOIS B.
A unified use of deep and shallow knowledge in an expert system for prototype validation of integrated Circuits
9th Workshop on Expert Systems and their applications, specialized Conference on 2nd generation of Expert Systems,
Avignon, France, May 29-June 2, 1989

NICOLAIDIS M., COURTOIS B.
Basic structure for the control of critical systems
1st European Workshop on Dependable Computing (EWDC-1), Toulouse, France, March 1-3, 1989

NICOLAIDIS M., NORAZ S., COURTOIS B.
Generalized fail-safe systems
Fault Tolerant Computing Symposium, Chicago, USA, June 21-23, 1989

NICOLAIDIS M., NORAZ S., COURTOIS B.
Design of critical systems
12th Annual IEEE Design for Testability Workshop, Vail, Colorado, USA, April 18-21, 1989

NICOLAIDIS M., COURTOIS B.
Self-checking circuits: a tutorial
Invited paper at 12th Fault Tolerant Systems and diagnostics Conference (FTSD-12), Prague, Tchecoslovaquia, September 4-7, 1989

NORAZ S., NICOLAIDIS M., COURTOIS B.
VLSI implementation for control of critical systems
IFAC/IFIP SAFECOMP 1989, Vienna, Austria, December 5-7, 1989

1990

BONDONO P., BONIFAS D.*, HORNIK A., JERRAYA A., COURTOIS B.
NAUTILE : a safe environment for silicon compilation
European Design Automation Conference (EDAC 90), Glasgow, Scotland, March 1990
----------
* IBM Corbeil

BONDONO P., BONIFAS D.*, HORNIK A., JERRAYA A., COURTOIS B.
NAUTILE : an open physical design environment based on an object oriented data manager
3rd International Workshop on VLSI Design, Bangalore, January 8-9, 1990
----------
* IBM Corbeil

CHAUMONTET G , GUYOT A., NICOLAIDIS M., CASTRO ALVES V., COURTOIS B.
Description d’un micro-automate programmable de sécurité (MAPS) à l’usage de la signalisation ferroviaire
7th International Conference on Reliability and Maintainability, Brest, France, June 18-22, 1990

CHAUMONTET G , CASTRO ALVES V., NICOLAIDIS M., GUYOT A., COURTOIS B.
MAPS : a safety microcontroller dedicatd to the railway control
13th International Conference on Fault-Tolerant Systems & Diagnostics, Varna, Bulgaria, June 20-22, 1990

CHAUMONTET G , CASTRO ALVES V., NICOLAIDIS M., GUYOT A., COURTOIS B.
A fail-safe microcontroller for railway signalling
16th European Solid State Circuits Conference (ESSCIRC 90), Grenoble, France, September 19-21, 1990

CONARD D., LAURENT J., MARZOUKI M., COURTOIS B.
High level tools and methods for electron-beam debug and failure analysis of integrated circuits
Seminar on Integrated Measurement Systems, Budapest, Hungary, July 2-4, 1990

COURTOIS B., DELORI H., GUYOT A., PAILLOTIN J.F.
The French Multi-Projects Circuits Service : CMP
International Conference on Microelectronics (ICM 90), Dams, Syria, October 13-17, 1990

COURTOIS B.
New trends in testing integrated circuits
Invited presentation at Seminario « Microelectronica : Diseno y Test de Circuitos Integrados Digitales »,
Sevilla, Spain, October 8-11, 1990

DARLAY D., COURTOIS B.
Robust tests for stuck-open faults and design for testability of reconvergent fan-out CMOS logic networks
European Design Automation Conference (EDAC 90), Glasgow, Scotland, 12-15 March, 1990

NICOLAIDIS M., COURTOIS B.
Design of testable ASICs
IFIF Workshop on Design & Test of ASICs, Hiroshima, Japan, June 11-12, 1990

O’BRIEN K., PARK I., COURTOIS B. et al.
Novel architecture design methodologies and systhesis strategies for future ASIC design
Invited paper at Norsile 90 Conference, Lund, Sweden, October 1990

SKAF A., AIT-MESSAOUD H., LAURENT J., GUYOT A., COURTOIS B.
A contribution to the study of the MHS 80C86 microprocessor in an hostile environment
International Conference on Microelectronics (ICM 90), Damas, Syria, October 13-17, 1990

1991

CASTRO ALVES V., NICOLAIDIS M., LESTRAT P.*, COURTOIS B.
Test algorithms for multi-port RAMs
14th Annual IEEE Workshop on Design For Testability (DFT), Vail, USA, April 16-19, 1991
----------
* THOMSON Composants Militaires et Spatiaux, Saint-Egrève, France

CASTRO ALVES V., NICOLAIDIS M., LESTRAT P.*, COURTOIS B.
Built-In Self-Test for multi-port memories
IEEE International Conference on Computer-Aided Design (ICCAD), Santa Clara, USA, November 10-13, 1991
----------
* THOMSON Composants Militaires et Spatiaux, Saint-Egrève, France

CHAGOYA A., COURTOIS B., DELORI H., GUYOT A., PAILLOTIN J.F., TORKI K.
The French Multi-Projects Circuits Service : CMP
APK’91, Design Automation Conference, Kaunas, Lithuania, USSR, June 3-8, 1991

CONARD D., RUSSELL J.D., LAURENT J., SKAF A., COURTOIS B.
"Multiple adjacent image processing" for automated failure location using electron beam testing
Invited Paper at Relectronic'91 Conference, Budapest, Hungary, August 26-30, 1991

CONARD D., COURTOIS B., LAURENT J., MARZOUKI M.
High level tools and methods for electron-beam testing
Invited paper at "IV Simposio de Computadores Tolerantes a Falhas", Gramado (RS), Brazil, October 2-4, 1991
COURTOIS B., DELORI H., GUYOT A., PAILLOTIN J.F., TORKI K.
The French Multi-Projects Circuits Service : CMP
Invited paper at VI SBMICRO Congress, Belo Horizonte, Brazil, July 15-19, 1991

COURTOIS B., NICOLAIDIS M.
Design of self-checking systems
Tutorial course and invited paper presented at VI SBMICRO Congress, Belo Horizonte, Brazil, July 15-19, 1991

COURTOIS B., DELORI H., GUYOT A., PAILLOTIN J.F., TORKI K.
The CMP Service for chip fabrication
Invited paper presented at the International Conference on Microelectronics (ICM’91)
Cairo, Egypt, December 21-23, 1991

COURTOIS B.
The Multi-Projects Circuits Service : CMP
Invited paper presented at "Seminario de Microelectronica", Montevideo, Uruguay, September 23-24, 1991

COURTOIS B., NICOLAIDIS M.
Design of self-checking systems : theory and practise
International Conference on Microelectronics (ICM’91), Cairo, Egypt, December 21-23, 1991

COURTOIS B. NICOLAIDIS M., LUBASZEWSKI M.
Design of Self-Checking Integrated Circuits and Boards
2nd International Conference on VLSI and CAD (ICVC), Seoul, Korea, October 1991

GLESNER M., CATTHOOR F., COURTOIS B., WEHN N.
Novel ASIC Architecture and Synthesis Methodologies for Future Multiplex Data-path Design
Invited paper at COMPEURO 91, Bologna, Italy, May 13-16, 1991

LUBASZEWSKI M., COURTOIS B.
B2UBIST: a strategy for Boundary Scan Board Unified BIST
5th Technical Workshop on New Directions for IC Testing, Ottawa, Canada, August 1-2, 1991

MARZOUKI M., LAURENT J., COURTOIS B.
Coupling electron-beam probing with knowledge-based fault localization
22nd IEEE International Test Conference (ITC), Nashville, USA, October 28 - November 1, 1991

NICOLAIDIS M., COURTOIS B.
Design of ICs for on-line and off-line testing
Invited paper presented at "Testmethoden und Zuverlässigkeit von Schaltungen und Systemen" Workshop
Blomberg, Germany, March 18-19, 1991

O’BRIEN K., PARK I., JERRAYA A., COURTOIS B.
Modelling Communicating Processes for the Synthesis of Control-Dominated Machines
Poster presented at EuroVHDL 91 Conference, Stockholm, Sweden, September 8-11, 1991

O’BRIEN K., PARK I., JERRAYA A., COURTOIS B.
Automatic modelling of bus protocols for the synthesis of reactive systems
APK’91, Design Automation Conference, Kaunas, Lithuania, ex USSR, June 3-8, 1991

PARK I., O'BRIEN K., JERRAYA A.A., COURTOIS B.
A new algorithm for the allocation of functional units and connections onto multiplexed datapaths
ICVC'91 Conference, Seoul, Korea, October 1991
SKAF A., RUSSELL J.D., COURTOIS B.
Automated E-beam testing using "multiple adjacent image processing"
1991 International Conference on Microelectronics (ICM'91), Cairo, Egypt, December 21-23, 1991

1992

CASTRO ALVES V., LUBASZEWSKI M., NICOLAIDIS M., COURTOIS B.
Testing embedded single and multi-port RAMs using BIST and boundary scan
European Conference on Design Automation (EDAC 92), Brussels, Belgium, March 16-19, 1992

COURTOIS B., NICOLAIDIS M., LUBASZEWSKI M.
Design of Self-Checking and Fail-Safe Integrated Circuits
1992 IEICE Spring Conference, Chiba, Japan, March 24-27, 1992

COURTOIS B., DELORI H., PAILLOTIN J.F., TORKI K., MARTIN F.
An infrastructure for VLSI design education and research
1992 IEICE Spring Conference, Chiba, Japan, March 24-27, 1992

COURTOIS B.
The French Multi-Projects Circuits Service: CMP
Plenary paper presented at 5th International Conference on VLSI Design,
Bangalore, India, January 4-7, 1992

COURTOIS B.
Self-checking circuits
Invited paper presented at XXIV Riunione Annuale CCTE'92, Taormina, Italy, 21-24 June 1992
COURTOIS B.
Failure analysis of integrated circuits using electron-beam
6th Workshop on New Direction for Testing, Montreal, Canada, May 21-22, 1992

COURTOIS B.
The French CMP Service and other MPC Services worldwide
Asia-Pacific Conference on Circuits and Systems 1992 (APCCAS'92), Sydney, Australia, December 8-11, 1992

COURTOIS B.
Design of self-checking and fail-safe integrated circuits and systems
Opening Conference at "DCIS'92 : VII Congreso de Diseño de Circuitos Integrados",
Toledo, Spain, November 3-5, 1992

HELLEBRAND S*. TARNICK S.**, RAJSKI J***, B. COURTOIS
Generation of vector patterns through reseeding of multiple-polynomial LFSRs
6th Workshop on New Direction for Testing, Montreal, Canada, May 21-22, 1992
---------
* Now with Gesamthochschule, University of Siegen, Germany
** Now with Max-Planck-Society, Fault Tolerant Computing Group, Berlin, Germany
*** On sabbatical leave from McGill University, Montreal, Canada

HELLEBRAND S*. TARNICK S.**, RAJSKI J***, B. COURTOIS
Generation of vector patterns through reseeding of multiple-polynomial linear feedback shift registers
IEEE International Test Conference (ITC), Baltimore, Maryland, USA, 20-24 September, 1992
---------
* Now with Gesamthochschule, University of Siegen, Germany
** Now with Max-Planck-Society, Fault Tolerant Computing Group, Berlin, Germany
*** On sabbatical leave from McGill University, Montreal, Canada

JERRAYA A., O'BRIEN K., PARK I., COURTOIS B.
Towards sytem level modeling and synthesis
5th International Conference on VLSI Design, Bangalore, India, January 4-7, 1992

LUBASZEWSKI M., COURTOIS B.
On the design of self-checking boundary scannable boards
International Test Conference (ITC), Baltimore, Maryland, USA, September 20-24, 1992

LUBASZEWSKI M., COURTOIS B.
On the design of self-checking boundary scannable boards
15th IEEE International Workshop on Design For Testability (DFT), Vail, Co, USA, April 21-24, 1992

LUBASZEWSKI M., MARZOUKI M., COURTOIS B.
Reusing a circuit debugging knowledge-based tool to diagnose boards with partial boundary scan
1st International Systems Test and Diagnosis Workshop, Freiburg, Germany, November 9-12, 1992

O'BRIEN K., PARK I., JERRAYA A., COURTOIS B.
Communication modelling for the system-level synthesis of mixed hardware/software designs
European Conference on Design Automation (EDAC 92), Brussels, Belgium, March 16-19, 1992

1993

COURTOIS B.
CAD and testing of ICs and Systems: Where are we going ?
Invited presentation at the 2nd ESA Electronics Components Conference at ESTEC
Noordwijk, The Netherlands, 24-28 May 1993

COURTOIS B.
The state of the art in CAD
Invited presentation at the Workshop on Computer Aided Methods and Technical Management in Electrical Engineering
Education, Budapest, Hungary, 16-18 June 1993

COURTOIS B.
Trends in fabrication, design and CAD - European perspectives
3rd International Conference on VLSI and CAD (ICVC'93), Taejon, Korea, 15-17 November 1993
COURTOIS B.
Perspectives in IC CAD and test
5th International Symposium on IC Technology, Systems & Applications (ISIC 93)
Singapore, 15-17 September 1993

COURTOIS B.
Future trends for the design and test of microelectronic systems
Invited talk at "25 Jahre UNI DO", Symposium organized to celebrate the 25 years of Dortmund University, Dortmund,
Germany, 16 December 1993

KOLARIK V., LUBASZEWSKI M., COURTOIS B.
Towards self-checking mixed-signal integrated circuits
19th European Solid-State Circuits Conference (ESSCIRC'93), Sevilla, Spain, September 22-24, 1993

LUBASZEWSKI M., CASTRO ALVES V., NICOLAIDIS M., COURTOIS B.
Checking signatures on boundary scan boards
European Test Conference, Rotterdam, NL, April 19-22, 1993

LUBASZEWSKI M., COURTOIS B.
Designing fault-tolerant systems by using self-checking replicas
Built-In Self-Test / Design for Testability Workshop (BIST/DFT)
Kiawah Island, Charleston, SC, USA, March 17-19, 1993

LUBASZEWSKI M., COURTOIS B.
Reliable fail-safe systems
2nd Asian Test Symposium (ATS 93), Beijing, China, 16-18 November 1993

NICOLAIDIS M., VARGAS F., COURTOIS B.
Design of reliable current sensors for radiation exposed environments
30th Annual International Nuclear and Space Radiation Effects Conference (NSREC'93)
Snowbird, Utah, USA, July 19-23, 1993

VARGAS F., NICOLAIDIS M., COURTOIS B.
Quiescent current monitoring to improve the reliability of electronic systems in space radiation environments
1993 International Conference on Computer Design (ICCD'93), Cambridge, Massachusetts, USA, 3-6 October 1993

1994

COURTOIS B.
Some trends in CAD, test and fabrication of circuits and systems
Keynote presentation at Third International Workshop on The Economics of Design, Test and Manufacturing
Austin, Texas, USA, 16-17 May 1994
COURTOIS B.
Perspectives in CAD, test and manufacturing of circuits and systems
Keynote presentation at Second Asia Pacific Conference on Hardware Description Languages (APCHDL(94), Toyohashi,
Japan, 24-25 October 1994

COURTOIS B.
The CMP Service
XXI International Conference and School for young scientists and professionals within the framework of "Informatization of Russia Program" ; New information technologies for science, education and business (CAD'94), Yalta, Ukraine, 4-13 May 1994

COURTOIS B., RENCZ M.*
Trends in fabrication, design and CAD - European perspectives
XXI International Conference and School for young scientists and professionals within the framework of "Informatization of Russia Program" ; New information technologies for science, education and business (CAD'94), Yalta, Ukraine, 4-13 May 1994
----------
* Technical University of Budapest, Hungary

COURTOIS B.
The Services available from CMP
Invited paper at IX SBMICRO, Rio de Janeiro, Brazil, 10-12 August 1994

COURTOIS B.
MPC Services available worldwide
Invited talk at IEEE Asia-Pacific Conference on Circuits and Systems (APCCAS'94), Taipei, Taiwan, 5-8 December 1994

HOFMANN K.*, KARAM J.M., GLESNER M.*, COURTOIS B.
Entwurf und Simulation von Mikrosystemen
Gründungssitzung der G1-Fachgruppe 3.5.6 Mikrosystemtechnik,
Schloss Dagstuhl, Dagstuhl, Germany, 21-22 November 1994
----------
* TH Darmstadt, FG Mikroelektronische Systeme, Germany

KOLARIK V., LUBASZEWSKI M., COURTOIS B.
Designing self-exercising analogue checkers
VLSI Test Symposium '94, Cherry Hill, N.J., USA, April 25-28, 1994

LUBASZEWSKI M., KOLARIK V., MIR. S., COURTOIS B.
Self-checking analogue and mixed-signal fully differential circuits
Design For Testability / Built-In Self-Test Workshop (DFT/BIST), Vail, Colorado, USA, April 19-22, 1994

LUBASZEWSKI M., COURTOIS B.
On-line&off-line, analogue&digital, circuit&board, safety&reliability : how to solve the testing puzzle ?
IEEE Asia-Pacific Conference on Circuits and Systems (APCCAS'94), Taipei, Taiwan, December 5-8, 1994
MARZOUKI M., COURTOIS B., CASTRO ALVES V.*
High-level synthesis for testability: where should we go from ?
1st International Test Synthesis Workshop, Santa Barbara, California, USA, May 18-20, 1994
--------
* University of Aveiro, Portugal

MIR S., KOLARIK V., LUBASZEWSKI M., NIELSEN C., COURTOIS B.
Built-in self-test and fault diagnosis of fully differential analogue circuits
International Conference on Computer Aided Design (ICCAD'94),
San Jose, California, USA, November 6-10, 1994

1995

COURTOIS B.
Trends and perspectives in integrated circuits and systems
Invited paper at 4th International Conference on VLSI and CAD (ICVC'95), Seoul, Korea, 15-18 October 1995

COURTOIS B., LUBASZEWSKI M.
On-line and off-line testing: from digital to analog, from circuits to boards
Invited paper at European Solid-State Circuits Conference (ESSCIRC'95), Lille, France, 19-21 September 1995

COURTOIS B., LUBASZEWSKI M.
From digital to analog self-checking circuits
Invited paper at Mixed Design of VLSI Circuits - Education of Computer Aided Design of Modern VLSI Circuits - (MixVLSI'95), Krakow, Poland, 29-31 May 1995

COURTOIS B.
Trends and needs in testing integrated circuits and systems
Invited talk at AT&T Conference on Electronic Testing (ACET'95), Princeton, NJ, USA, 24-25 April 1995

COURTOIS B., KARAM J.M., PARET J.M.
Advances at CMP service: from microelectronics to microsystems
Sixth International Symposium on IC Technology, Systems and Applications (ISIC'95), Singapore, 6-8 September 1995

COURTOIS B.
Trends in CAD, test, manufacturing of ICs and systems
Invited talk at X SBMICRO I IBERMICRO Conference, Gramado, Brazil, 31 July - 4 August 1995

DUMITRESCU M.*, KARAM J.M., COURTOIS B.
Approximation choices for the numerical modeling of some optical guiding structures
Physics and Simulation of Optoelectronic Devices Conference
SPIE's Photonics West'95, San Jose, California, USA, 4-10 February 1995
----------
* "Politehnica" University, Bucharest, Romania
HOFMANN K.*, KARAM J.M., MOLEAVIN V.**, NICULIU T.**, COURTOIS B.,
GLESNER M.*
Modelling and simulation of thermal effects on the system level
International Workshop on Thermal Investigations of ICs and Microstructures
Grenoble, France, 25-26 September 1995
----------
* TH Darmstadt, Germany
** POLITECNICA Univ., Bucharest, Romania

HOFMANN K.*, KARAM J.M., SCHULZE M.*, THEISEN M.*, COURTOIS B., GLESNER M.*
Automatische Übersetzung von FEM-Modellen in eine analoge Hardwarebe-schreibungssprache
Mikrosystemtechnik & Mikroelektronik 95, Chemnitz, Germany, October 16-17, 1995
----------
* TH Darmstadt, Germany

LUBASZEWSKI M., KOLARIK V.*, MIR S., NIELSEN C., COURTOIS B.
Mixed-signal circuits and boards for high safety applications
European Design and Test Conference (EDAC-ETC-EUROASIC'95), Paris, France, 6-9 March 1995
----------
*Technical Univ. of Brno, Czech Republic

MIR S., LUBASZEWSKI M., KOLARIK V.*, COURTOIS B.
Optimal ATPG for analogue built-in self-test and fault diagnosis
IEEE International Mixed-Signal Testing Workshop, Grenoble, France, 20-22 June 1995
----------
* Technical University of Brno, Czech Republic

MIR S., LUBASZEWSKI M., KOLARIK V.*, COURTOIS B.
Analogue on-line/off-line test unification for fully differential circuits
IEEE International Mixed-Signal Testing Workshop, Grenoble, France, 20-22 June 1995
----------
* Technical University of Brno, Czech Republic

MIR S., LUBASZEWSKI M., LIBERALLI V.*, COURTOIS B.
Built-In Self-Test approaches for analogue and mixed-signal integrated circuits
38th IEEE Midwest Symposium on Circuits and Systems, Rio de Janeiro, Brazil,
13-16 August 1995
----------
* University of Pavia, Italy

MIR S., LUBASZEWSKI M., KOLARIK V.*, COURTOIS B.
Programmable self-checking analogue oscillators
1st IEEE International On-Line Testing Workshop, Nice, France, 4-6 July 1995
----------
* Technical University of Brno, Czech Republic

PARET J.M., KARAM J.M., COURTOIS B.
CAD tools for MEMs
CAVE Workshop'95, Kenmare, Ireland, 3-6 December 1995

POPPE A.*, KARAM J.M., HOFMANN K.**, RENCZ M.*, COURTOIS B., GLESNER M.**, SZEKELY V.*
A general CAD concept and design framework architecture for integrated microsystems
1st International Conference on Microsystems and Microstructures (MICROSIM 95)
Southampton, UK, 26-28 September 1995
----------
* Technical University of Budapest, Hungary; ** Darmstadt University of Technology, Germany

POPPE A.*, KARAM J.M., HOFMANN K.**, RENCZ M.*, COURTOIS B., GLESNER M.**, SZEKELY V.*
A CAD framework concept for the design of integrated microsystems
Symposium on Micromachining and Microfabrication (SPIE'95), Austin, Texas, USA, 23-24 October 1995
----------
* Technical University of Budapest, Hungary; ** Darmstadt University of Technology, Germany

SAAB K.*, KAMINSKA B.*, LUBASZEWSKI M., COURTOIS B.
Frequency-based BIST for analogue circuit testing
13th IEEE VLSI Test Symposium (VTS'95), Princeton, New Jersey, USA, 30 April - 3 May 1995
----------
* Ecole Polytechnique de Montréal, Canada
SZEKELY V.*, RENCZ M.*, COURTOIS B.
Trends in thermal management of microcircuits
NATO ARW: Future Trends in Microelectronics, Island of Bendor, France, 17-21 July, 1995
----------
* Technical University of Budapest, Dept. of Electron Devices

SZEKELY V.*, MARTA Cs.*, RENCZ M.*, BENEDEK Zs.*,COURTOIS B.
Design for Thermal Testability (DFTT) and a CMOS realization
Ist THERMINIC Workshop, Grenoble, France, 25-26 September 1995
----------
* Technical University of Budapest, Dept. of Electron Devices

SZEKELY V.*, MARTA Cs.*, RENCZ M.*, COURTOIS B.
A new approach: Design for Thermal Testability (DFTT) of MCMs
2nd Multi-Chip Module Test Advanced Technology Workshop,
Napa Valley, California, USA, 10-13 September 1995
----------
* Technical University of Budapest, Dept. of Electron Devices

TCHOUMATCHENKO V.*, VASSILEVA T.*, GUYOT A.
Delay directed adders synthesis and optimisation
European Conference on Circuit Theory and Design, Istambul, Turkey, 27-31 August 1995
----------
* Technical University of Sofia, Bulgaria

VINCI DOS SANTOS F., COURTOIS B.
A design technique for compensation of MOS transistor total integrated dose degradation
1st Workshop on Electronics for LHC Experiments, Lisbon, Portugal, 11-15 September 1995

1996

COURTOIS B., KARAM J.M., PARET J.M
Developments at CMP Service : from microelectronics to microsystems
Invited paper at First European Workshop on Microelectronics Education
Villard de Lans (Grenoble), France, 5-6 February 1996

COURTOIS B., SZEKELY V.*, RENCZ M.*
Thermal monitoring of memories
IEEE International Workshop on Memory Technology, Design and Testing
Singapore, 13-14 August 1996
----------
* Technical University of Budapest, Hungary

COURTOIS B., DELORI H., KARAM J.M., PAILLOTIN J.F., TORKI K.
CMP Services: basic principles and developments
1996 International Conference on ASIC (ASICON'96), Shanghai, China, 21-24 October 1996

HOFMANN K.*, LANG M.*, KARAM J.M., GLESNER M.*, COURTOIS B.
Generation of a behavioural model of an acceleration sensor from its finite-element-description
MECHATRONICS'96, Besançon, France, 1-3 October 1996
----------
* TH Darmstadt, Institute of Microelectronic Systems, Germany

KARAM J.M., COURTOIS B., BAUGE M.
High level CAD melds microsystems with foundries
European Design and Test Conference (EDAC-ETC-ASIC'96), Paris, France, 11-14 March 1996

KARAM J.M., COURTOIS B., HOFMANN K.*, POPPE A.**, RENCZ M.**, GLESNER M.*, SZEKELY V.**
Microsystems modeling at system level
3rd Asia Pacific Conference on Hardware Description Languages (APCHDL'96), Bangalore, India, 8-10 January, 1996
----------
* TH Darmstadt, Institute of Microelectronic Systems, Germany
**Technical University of Budapest, Dept of Electron Devices, Hungary

KARAM J.M., COURTOIS B., HOFMANN K.*, GLESNER M.*, POPPE A.**, RENCZ M.**,
SZEKELY V.**
Applied design and analysis of microsystems
European Design and Test Conference (EDAC-ETC-ASIC'96), Paris, France, 11-14 March 1996
----------
* TH Darmstadt, Institute of Microelectronic Systems, Germany
**Technical University of Budapest, Dept of Electron Devices, Hungary

KARAM J.M., COURTOIS B., PARET J.M., BOUTAMINE H.
Low cost access to MST: Manufacturing techniques and related CAD tools
MICRO SYSTEM Technologies 96 (MST'96), Potsdam, Germany, 17-19 September 1996

KARAM J.M., COURTOIS B., HOLJO M., LECLERCQ J.L.*; VIKTOROVITCH P.*
Collective fabrication of gallium arsenide based microsystems
SPIE'96 Symposium on Micromachining and Microfabrication, Austin, Texas, USA,
14-15 October 1996
----------
* LEAME, Ecole Centrale de Lyon, France

KARAM J.M., COURTOIS B., RENCZ M.*, POPPE A.*, SZEKELY V.*
Microsystem design framework based on tool adaptation and library developments
SPIE'96 Symposium on Micromachining and Microfabrication, Austin, Texas, USA,
14-15 October 1996
----------
* Technical University of Budapest, Dept. of Electron Devices, Hungary

KARAM J.M., BOUTAMINE H., COURTOIS B., OUDINOT J.*, DRAKE P.**
CAD of MEMS out to the industry
SPIE'96 Symposium on Smart Materials, Structures and MEMS, Bangalore, India, 11-14 December 1996
----------
* Mentor Graphics, Paris ; ** Mentor Graphics, UK

KARAM J.M., COURTOIS B.
Microsystem prototyping: from the idea to the foundry via a continuous design flow
EUROSENSORS X, Leuven, Belgium, 8-11 September 1996

KARAM J.M., COURTOIS B.
From the MEMS idea to the MEMS product: CAD and foundries
WESCON'96, Anaheim, CA, USA, 22-24 October 1996

KARAM J.M., COURTOIS B., HOFMANN K.*, POPPE A.**, RENCZ M.**, GLESNER M.*, SZEKELY V.**
CAD of MEMS: from the idea to the reality
MECHATRONICS'96, Besançon, France, 1-3 October 1996
----------
* TH Darmstadt, Institute of Microelectronic Systems, Germany; **Technical University of Budapest, Dept of Electron Devices, Hungary

KARAM J.M., COURTOIS B., PARET J.M.
Microelectronics compatible manufacturing techniques of microsystems
MECHATRONICS'96, Besançon, France, 1-3 October 1996

KARAM J.M., BIANCHI R.A., VINCI DOS SANTOS F., COURTOIS B.
Design and fabrication of an array of CMOS compatible IR sensors
THERMINIC Workshop, Budapest, Hungary, 25-27 September 1996

KRIM N., COURTOIS B.
OMI/EUROMIC
Invited talk at European Microelectronic Partners Conference (EMPC'96), Vienna, Austria, 29 February - 1 March 1996

SZEKELY V.*, KOHARI Z.*, MARTA Cs.*, RENCZ M.*, COURTOIS B.
Test structure for thermal monitoring
International Conference on Microelectronics Test Structures (ICMTS'96), Trento, Italy, 25-28 March 1996
----------
* Technical University of Budapest, Dept. of Electron Devices

SZEKELY V.*, RENCZ M.*, KARAM J.M., LUBASZEWSKI M., COURTOIS B.
Thermal monitoring of self-checking systems
2nd International On-Line Testing Workshop, Saint Jean de Luz, France, 8-10 July 1996
----------
* Technical University of Budapest, Dept. of Electron Devices

SZEKELY V.*, RENCZ M.*, KARAM J.M., LUBASZEWSKI M., COURTOIS B.
Thermal monitoring of safety-critical integrated systems
6th Asian Test Symposium (ATS'96), Hsinchu, Taiwan, 20-22 November 1996
----------
* Technical University of Budapest, Dept. of Electron Devices

SZEKELY V.*, RENCZ M.*, COURTOIS B.
Thermal transient testing of the quality of encapsulation
MCM Test Workshop'96, Napa Valley, USA, 15-18 September 1996
----------
* Technical University of Budapest, Dept. of Electron Devices, Hungary

SZEKELY V.*, RENCZ M.*, COURTOIS B.
Thermal transient testing
29th International Symposium of Microelectronics (ISHM'96), Minneapolis, USA,
6-10 October 1996
----------
* Technical University of Budapest, Dept. of Electron Devices, Hungary

VINCI DOS SANTOS F., BIANCHI R.A., KARAM J.M., COURTOIS B.
CMOS compatible IR sensors array
Micromechanics Europe Conference (MME'96), Barcelona, Spain, 21-22 October 1996

1997

ABOU-SAMRA S.J., DUDEK V.*, AYACHE F., GUYOT A., COURTOIS B.,
HOEFFLINGER B.*
Designing With 3D SOI CMOS
ECS’97 Symposium on SOI Technology and Devices, Paris, France, September 1997
----------
* Institute for Microelectronics Stuttgart, Germany

BIANCHI R.A., SANTOS F.V., KARAM J.M., COURTOIS B., PRESSECQ F.*, SIFFLET S.**
CMOS compatible temperature sensor using lateral bipolar transistor for very wide temperature range applications
3rd International Workshop on Thermal Investigations of Ics and Microstructures (THERMINIC Workshop 97), Cannes, France, 21-23 September 1997
----------
*CNES, Toulouse, France ; **TRS31, Auterive, France

BOUTAMINE H., KARAM J.M., COURTOIS B., DRAKE P.*, OUDINOT J.*, EL TAHAWI H.*, CAO A.*, RENCZ M.**, POPPE A.**, SZEKELY V.**
Engineering tool set for monolithic and hybrid microsystem design
SPIE's Symposium on Micromachining and Microfabrication, Autin, Texas, USA, 29-30 September 1997
----------
* Mentor Graphics; ** Technical University of Budapest, Hungary

COURTOIS B.
CAD tools and foundries to boost microsystems development
Invited talk at Conference on Low Dimensional Structures and Devices (LDSD'97), Lisbon, 19-21 May 1997

COURTOIS B., KARAM J.M., LUBASZEWSKI M., SZEKELY V.*, RENCZ M.*, HOFMANN K.**, GLESNER M.**
CAD, test and manufacturing of microsystems
Invited talk at 1st Electronic Circuits and Systems Conference (ECS'97), Bratislava, Slovakia, 4-5 September 1997
----------
* Technical University of Budapest, Hungary; ** Darmstadt University of Technology, Germany

COURTOIS B., SZEKELY V.*, RENCZ M.*, NAPIERALSKI A.**, KOVAL V.***, BELEZNAY F.****
Main goals and obtained results of the THERMINIC Project
EUROTHERM'97, Nantes, 24-27 September 1997
----------
* Technical University of Budapest, Hungary; ** Technical University of Lodz, Poland; *** State Polytechnic of Lviv, Ukraine; **** SEMILAB, Hungary

HOFMANN K*, KARAM J.M., COURTOIS B., GLESNER M.*
Generation of HDL-A code for non linear behavioral models
IEEE International Workshop on Behaviourial Modeling and Simulations (BMA’97)
Washington DC, USA, 20-21 October 1997
----------
* Darmstadt University of Technology, Germany

HOFMANN K.*, GLESNER M.*, SEBE N.**, MANOLESCU A.**, MARCO S.***,
SAMITIER J.***, KARAM J.M., COURTOIS B.
Generation of the HDL-A-Model of a micromembrane from its finite-element-description
1997 European Design and Test Conference (ED&TC'97), Paris, France, 17-20 March 1997
----------
* Darmstadt University of Technology, Germany; ** "Politechnica" University Bucharest, Romania; *** University of Barcelona, Spain

KARAM J.M., COURTOIS B., BOUTAMINE H., DRAKE P.*, POPPE A.**, SZEKELY V.**, RENCZ M.**, HOFMANN K.***, GLESNER M.***
CAD and foundries for microsystems
Design Automation Conference (DAC'97), Anaheim, Ca, USA, 9-13 June 1997
----------
* Mentor Graphics, UK; ** Technical University of Budapest, Hungary; *** Darmstadt University of Technology, Germany

MARTA C.*, SZEKELY V.*, RENCZ M.*, COURTOIS B.
Self-checking current output temperature sensor for DfTT
3rd IEEE International On-Line Testing Workshop, Aghia Pelaghia Headland, Crete, Greece, 7-9 July 1997
----------
* Technical University of Budapest, Hungary

PEREZ-RIBAS R., KARAM J.M., COURTOIS B., LECLERCQ J.L.*, VIKTOROVITCH P.*
Bulk micromachining characterization of 0.2µm HEMT MMIC technology for GaAs MEMS design
Conference on Low Dimensional Structures and Devices (LDSD'97), Lisbon, 19-21 May 1997
----------
* LEAME, Lyon, France

PEREZ- RIBAS R., BENNOURI N., KARAM J.M., COURTOIS B.
GaAs MEMs design using 0.2µm HEMT MMIC technology
IEEE GaAs IC Symposium, Anaheim, California, USA, 12-15 October 1997

RENCZ M.*, SZEKELY V.*, COURTOIS B.
A step forward in the transient thermal characterization of packages
30th International Symposium on Microelectronics (ISHM'97), Philadelphia, PA, USA, 12-16 October 1997
----------
* Technical University of Budapest, Hungary

SZEKELY V.*, RENCZ M.*, COURTOIS B.
Thermal testing of MCMs using Boundary-Scan access
IMAPS Advanced Technology Workshop on MCM Test IV, Napa Valley, California, USA
September 14-17, 1997
----------
* Technical University of Budapest, Hungary

SZEKELY V.*, RENCZ M.*, COURTOIS B.
CAD tools for thermal testing of Electronic Systems
InterPACK'97 Conference, Mauna Lani, USA, 15-19 June 1997
--------
* Technical University of Budapest, Dept. of Electron Devices, Hungary

SZEKELY V.*, RENCZ M.*, COURTOIS B.
Thermal testing of MCMs using Boundary-Scan access
IMAPS Advanced Technology Workshop on MCM Test IV ,
Napa Valley, California, USA, September 14-17, 1997

VINCI DOS SANTOS F.V., BOUTAMINE H., VEYCHARD D., KARAM J.M., COURTOIS B.
Towards space microsystems : design and manufacturing methodologies for CMOS compatible MEMS
2nd Round table on micro-nano technologies for space, ESTEC, Noordwijk, The Netherlands, 15-17 October 1997
1998

ABOU-SAMRA S.J., AISA P.A.*, GUYOT A., COURTOIS B.
3D CMOS SOI for high performance computing
International Symposium on Low-Power Electronics and Design (ISLPED), Monterey, CA, 10-12 August 1998
--------
* University of Bologna, Bologna, Italy

CASTILLEJO A., VEYCHARD D., MIR S., KARAM J.M., COURTOIS B.
Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems
International Test Conference (ITC), Washington D.C., USA, 20-22 October 1998

COURTOIS B.
From microelectronics to microsystems : CAD, CAT and MPW
Invited talk in the Vth NEXUSPAN Workshop, Budapest, Hungary, 6-8 May 1998

COURTOIS B.
Multidisciplinary and collaborative design for systems on silicon
Invited paper at FED-PDI Joint Conference on 21st Century Electron Devices, Berlin, Germany, 29 June – 2 July 1998

COURTOIS B., DELORI H., KARAM J.M., PAILLOTIN J.F., TORKI K.
The services available from CMP
Invited paper at 3rd International Conference on ASIC (ASICON’98), Beijing,China, 20-23 October 1998

COURTOIS B., KARAM J.M., LUBASZEWSKI M.*, SZEKELY V.**, RENCZ M.**, KELLY G.***, ALDERMAN J.***,
MORRISSEY A.***, HOFMANN K.****, GLESNER M.****
CAD, CAT and MPW for MEMS
Invited talk in the Eighth Workshop on Synthesis and System Integration of Mixed
Technologies (SASIMI’98), Sendai, Japan, 19-20 October 1998
----------
* UFRGS, Porto Alegre (RS), Brazil; ** Technical University of Budapest, Hungary; ***NMRC, University College, Cork, Ireland;
**** Darmstadt University of Technology, Darmstadt, Germany

KARAM J.M., COURTOIS B., BOUTAMINE H., CAO A.*, RODRIGUEZ J.*,
SZEKELY V.**, RENCZ M.**, HOFMANN K.***, GLESNER M.***
A composite integrated mixed-technology design environment to support micro-electro mechanical systems development
The First International Conference on Modeling and Simulation of Microsystems, Semiconductors, Sensors and Actuators,
MSM’98, Santa Clara Marriott, California, USA, April 5-8, 1998
----------
*Mentor Graphics Corporation, Oregon, USA; **Technical University of Budapest, Budapest, Hungary;
***Darmstadt University of Technology, Darmstadt, Germany

KRIM N., COURTOIS B.
Low cost access to advanced technologies for prototyping and small volume
European Multimedia, Microprocessor Systems and Electronic Commerce (EMMSEC’98) Conference and Exhibition,
Bordeaux, France, 28-30 September 1998

KRIM N., COURTOIS B., CONQ B.*
CADnet framework: an open platform for multidisciplinary and collaborative design
European Multimedia, Microprocessor Systems and Electronic Commerce (EMMSEC’98), Conference and Exhibition,
Bordeaux, France, 28-30 September 1998
----------
* CNET/DTM/Grenoble, France

LUBASZEWSKI M.*, COTA E.F.*, COURTOIS B.
Microsystems testing : an approach and open problems
Design, Automation and Test in Europe, Conference and Exhibition (DATE’98), Paris, France, 23-26 February 1998
----------
* DELET/UFRGS, Brazil

MIR S., KARAM J.M., COURTOIS B.
Technologies and fabrication processes for microsystems
Forum and Exhibition on Microtechnologies : from microsystems to measurement of micro and nano mechanical properties of materials, Liège, Belgium, 26-27 May 1998

PALAN B.*, VINCI DOS SANTOS F., KARAM J.M, COURTOIS B., HUSAK M.*
Integrated microsystem for biomedical applications
7th Annual university-wide seminar Workshop 98, Czech Technical University, Prague,
February 3-5, 1998
----------
* Czech Technical Univesity in Prague, Prague, Czech Republic

PALAN B.*, VINCI DOS SANTOS F., KARAM J.M, COURTOIS B., HUSAK M.*
A new ISFET sensor interface circuit
Eurosensors XII, 12th European Conference on Solid-State Transducers and the 9th UK
Conference on Sensors and their Applications, Southampton, UK, 13-16 September 1998
----------
* Czech Technical Univesity in Prague, Prague, Czech Republic

SZEKELY V.*, RENCZ M.*, COURTOIS B.
Thermal transient testing without a tester
SEMICON West 98, Technical Symposium on Semiconductor Packaging Technology,
San Jose, CA, USA, 15-17 July 1998
----------
*Technical University of Budapest

SZEKELY V.*, RENCZ M.*, COURTOIS B.
Application results of a new thermal benchmark chip
SEMITHERM’98, Semiconductor Thermal Measurement and Management Symposium
San Diego, California, 10-12 March 1998
----------
*Technical University of Budapest

SZEKELY V.*, RENCZ M.*, COURTOIS B.
Thermal monitoring through boundary-scan
IMAPS Advanced Technology Workshop on MCM Test V
Napa Valley, California, 20-23 September 1998
--------
* Technical University of Budapest, Dept. of Electron Devices, Hungary

SZEKELY V.*, RENCZ M.*, COURTOIS B.
Thermal transient testing of packages without a tester
2nd EPTC’98 (Electronics Packaging Technology Conference), Raffles City Convention Centre,
Singapore, 8-10 December 1998
----------
*Technical University of Budapest, Hungary

SZEKELY V.*, RENCZ M.*, COURTOIS B.
Thermal transient testing of packages without a tester
31st IMAPS’98 (International Symposium on Microelectronics), San Diego, California, 2 – 4 November 1998
----------
*Technical University of Budapest, Hungary

SZEKELY V.*, RENCZ M.*, TÖRÖK S.*, COURTOIS B.
Iddq testing of submicron CMOS by cooling
Seventh Asian Test Symposium (ATS’98), Singapore, 2-4 December 1998
----------
*Technical University of Budapest, Hungary

1999

CHARLOT B., MIR S., COTA E.F.*, LUBASZEWSKI M.*, COURTOIS B.
Fault simulation of MEMS using HDLs
SPIE Symposium on Design, Test and Microfabrication of MEMS/MOEMS, Paris, France, March-April 1999
----------
*UFRGS, Porto Alegre, Brazil

CHARLOT B., MOUSSOURIS S., MIR S., COURTOIS B.
Fault modeling of electrostatic comb-drives for mems
SPIE Symposium on Design, Test and Microfabrication of MEMS/MOEMS, Paris, France, March-April 1999

CHARLOT B., MIR S., COTA E.F.*, LUBASZEWSKI M.*, COURTOIS B.
Fault modeling of suspended thermal MEMS
In International Test Conference, pp. 319-328, Atlantic city, USA, 28-30 September 1999
----------
*UFRGS, Porto Alegre, Brazil

COURTOIS B., KARAM J.M., MIR S., LUBASZEWSKI M.*, SZEKELY V.**, RENCZ M.**, HOFMANN K***., GLESNER M.***
Design and Test of MEMS
The Twelfth International Conference on VLSI DesignGoa, India, 7-10 January 1999
----------
* UFRGS, Porto Alegre, Brazil
** Technical University of Budapest, Hungary
*** Darmstadt University of Technology, Germany

LIATENI K.*, MOULINIER D.*, AFFOUR B.*, BOUTAMINE H.*, KARAM J.M.*, VEYCHARD D., COURTOIS B.
Advanced integrated solution for MEMS design
In Design, Test and Microfabrication of MEMS/MOEMS, B. Courtois, S.B. Crary, Wolfgang
Ehrfeld, H. Fijuta, J.M. Karam, K. Markus, Editors, Proceedings of SPIE, Vol. 3680, pp. 161-170
Paris, France, 30 March - 1 April 1999
----------
*MEMSCAP, Grenoble, France

MIR S., CHARLOT B., COURTOIS B.
Extending fault-based testing to microelectromechanical systems
European Test Workshop (ETW’99), Constance, Germany May 25-28, 1999

PALAN B., COURTOIS B.
Fundamental noise limits of ISFET-based microsystems
Eurosensors XIII, The 13th European Conference on Solid-State Transducers
The Hague, The Netherlands, 12-15 September 1999

PALAN B., COURTOIS B., HUSAK M.*
Microsystems in Space, WORKSHOP'99 proceedings, CTU in Prague, February 2-3, pp. 202, 1999
----------
* Czech Technical Univesity in Prague, Prague, Czech Republic

PALAN B., SANTOS F.V., COURTOIS B., HUSAK M.*
Noise Analysis of ISFET Based Sensors
3rd International Student Conference on Electrical Engineering POSTER'99, CTU in Prague, pp.130-131, May 27, 1999
----------
* Czech Technical Univesity in Prague, Prague, Czech Republic

PALAN B., SANTOS F.V., COURTOIS B., HUSAK M.*
Microsystems for Space Applications
1st International Conference on Advanced Engineering Design, Abstract proceedings, Prague, pp.133-134,
31 May-2 June 1999. Conference proceedings pp.117 ISBN: 80-01-02055-X
----------
* Czech Technical Univesity in Prague, Prague, Czech Republic

RIBAS R.P., VEYCHARD D., KARAM J.M., COURTOIS B.
Providing technology infrastructure for MEMS
In Design, Test and Microfabrication of MEMS/MOEMS, B. Courtois, S.B. Crary, Wolfgang
Ehrfeld, H. Fijuta, J.M. Karam, K. Markus, Editors, Proceedings of SPIE, Vol. 3680, pp. 298-303
Paris, France, 30 March - 1 April 1999

RIBAS P.R., COURTOIS B.
CAD environment for MEMS
Invited paper at International Conference on Microelectronics and Packaging (SBMicro’99)
Campinas, Brazil, Technical Digest, pp. 316-325, 3-6 August 1999

RIBAS P.R., VEYCHARD D., LECLERQ J.L., COURTOIS B.
Thermopile-based GaAs micromachined devices
International Conference on Microelectronics and Packaging (SBMicro’99)
Campinas, Brazil, Technical Digest, pp. 238-243, 3-6 August 1999

SZEKELY V.*, RENCZ M.*, POPPE A.**, COURTOIS B.
New way for thermal transient testing
Fifteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMITHERM 99)
San Diego, CA, USA, 9-11 March 1999
----------
*Technical University of Budapest, Hungary; ** MicRed Microelectronics Res & Dev Ltd., Hungary

SZEKELY V.*, RENCZ M.*, COURTOIS B.
Thermal transient evaluation of packages with the TTMK toolkit
The PACIFIC RIM / ASME International, Intersociety ElectronicPackaging Conference, InterPACK’99
Maui, Lahaina, Hawaii, USA, 13-19 June 1999
----------
*Technical University of Budapest, Hungary

SZEKELY V.*, RENCZ M.*, COURTOIS B.
Simulation, testing, and modeling of the thermal behavior and electro-thermal interactions in
ICs, MCMs, and PCBs
The 1999 Southwest Symposium on Mixed-Signal Design (SSMD’99)
Tucson, Arizona, USA, 11-13 April 1999
---------
* Technical University of Budapest, Hungary

SZEKELY V.*, RENCZ M.*, COURTOIS B.
Tool and method for the thermal transient evaluation of packages
Microelectronics and Micro-Electro-Mechanical Systems Symposium (MICRO/MEMS’99)
Queensland, Australia, 27-29 October 1999
---------
* Technical University of Budapest, Hungary

TORKI K., COURTOIS B.
Advanced low cost manufacturing from CMP service
1999 International Conference on Microelectronic Systems Education (MSE’99)
Arlington, USA, 19-21 July 1999

2000

COURTOIS B.
Design and test of MEMS
Invited talk, VLSI Test Symposium, Montreal, Canada, 1-3 May 2000

COURTOIS B., TORKI K., CHARLOT B., DELORI H., EYRAUD S., PAILLOTIN J.F.
Achievements and advances at CMP
3rd European Workshop on Microelectronics Education (EWME’2000), Aix-en-Provence,
France, 18-19 May 2000

COURTOIS B., MIR S., CHARLOT B., LUBASZEWSKI M.
From microelectronics to MEMS testing
IEEE Microelectronics Reliability and Qualification Workshop, Glendale, California, USA,
October 31 - 1 November 2000

GOY J., COURTOIS B., KARAM J.M.*, PRESSECQ F.**
Design of an APS CMOS image sensor for space applications using standard CAD tools and
CMOS technology
Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP of MEMS/MOEMS), Paris, France, 9-11 May 2000
----------
* MEMSCAP, Grenoble, France; ** CNRS, Toulouse, France
MIR S., CHARLOT B., NICOLESCU G., COSTE P., PARRAIN F., ZERGAINOH N., COURTOIS B., JERRAYA A., RENCZ M.*

Towards design and validation of mixed-technology SOCs
Tenth Great Lakes Symposium on VLSI (GLSVLSI 2000), Chicago, Illinois, USA, March 2-4
2000 (ISBN 1-58113-251-4)
----------
* Technical University Budapest, Hungary

PALAN B. ., ROUBIK K*., HUSAK M.*, COURTOIS B.
CMOS ISFET-based structures for biomedical applications
1st Annual International IEEE-EMBS Special Topic Conference on Microtechnologies in
Medicine and Biology, Lyon, France, October 12-14, 2000
----------
* Czech Technical Univesity in Prague, Prague, Czech Republic

POPPE A.*, FARKAS G.*, RENCZ M.*, BENEDEK Zs.*, POHL L.*, SZEKELY V.*, TORKI K.,
MIR S., COURTOIS B.
Design of scalable multi-fonctional thermal test die with direct and boundary scan access for
programmed excitation and measurement data acquisition
6th International Workshop on Thermal Investigations of Ics and Systems (THERMINIC 2000),
Budapest, Hungary, September 24-27, 2000
----------
* Technical University Budapest, Hungary

RENCZ M.*, SZEKELY V.*, KOHARI Zs.*, COURTOIS B.
A method for thermal model generation of MEMS packages
MSM’2000, San Diego, USA, 27-29 March 2000
----------
* Technical University Budapest, Hungary

RENCZ M.*, SZEKELY V.*, KOHARI Zs.*, COURTOIS B.
Thermal evaluation and modeling of MEMS packages
IEMT/ITC Symposium, Omiya, Japan, April 2000
----------
* Technical University Budapest, Hungary

RENCZ M.*, SZEKELY V.*, KOHARI Zs.*, COURTOIS B.
Thermal evaluation and modelling of the SIP9 and SP10 MEMS packages
Seventh Intersociety Conference on Thermal and Thermomechanical Phenomena in
Electronic Systems (ITHERM 2000)
Las Vegas, Nevada, USA, 23-26 May 2000
----------
* Technical University Budapest, Hungary

RENCZ M.*, SZEKELY V.*, POPPE A.**, COURTOIS B.
Fast and user friendly tool for the thermal simulation of power packages
International Workshop on Integrated Power Packaging (IWIPP 2000), Waltham-Boston, Ma,
USA, July 14-15, 2000
----------
* Technical University Budapest, Hungary; ** MicRed Microelectronics Res & Dev Ltd., Hungary

RENCZ M.*, SZEKELY V.*, POPPE A.**, COURTOIS B.
From MEMS to the global simulation of SoCs
Design, Modeling and Simulation in Microelectronics (DMSM 00), Singapore,
November 28-30, 2000
----------
* Technical University Budapest, Hungary
** MicRed Microelectronics Res & Dev Ltd., Hungary

SZEKELY V.*, RENCZ M.*, POPPE A.**, COURTOIS B.
New hardware tools for the thermal transient testin of packages
3rd Electronics Packaging Technology Conference (EPTC 2000), Singapore,
December 5-7, 2000
----------
* Technical University Budapest, Hungary; ** MicRed Microelectronics Res & Dev Ltd., Hungary

SZEKELY V.*, RENCZ M.*, POPPE A.**, COURTOIS B.
THERMODEL : a tool for thermal model generation, and application for MEMS packages
Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP of MEMS/MOEMS)
Paris, France, 9-11 May 2000
----------
* Technical University Budapest, Hungary; ** MicRed Microelectronics Res & Dev Ltd., Hungary

TORKI K., COURTOIS B.
CMP Experience on deep sub-micron design-methodology support and transfer
3rd European Workshop on Microelectonics Education (EWME’2000), Aix-en-Provence, France
18-19 May 2000, (ISBN 0-7923-6456-2)

2001

CHARLOT B., MIR S., PARRAIN F., COURTOIS B.
Electrically induced stimuli for MEMS self-test
19th VLSI test symposium (VTS 2001), Los Angeles, USA, April 29 - May 3, 2001

CHARLOT B., PARRAIN F., MIR S., COURTOIS B.
A self-testable CMOS thermopile-based infrared imager
Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP'2001),
Cannes - Mandelieu, France, 25-27 April 2001

COURTOIS B., MIR S., CHARLOT B., LUBASZEWSKI M.*
An analog-based approach for MEMS testing
IEEE Latin-American Test Workshop (LATW 2001 ), Cancun, Mexico,
February 11-14 2001
----------
* UFRGS, Porto Alegre, Brazil

JUNEIDI Z., TORKI K., CHARLOT B., COURTOIS B.
MEMS synthesis and optimization
Design, Test, Integration, and Packaging of MEMS/MOEMS (DTIP 2001), Cannes,
France, April 25-27 2001

JUNEIDI Z., TORKI K., MARTINEZ S., NICOLESCU G., COURTOIS B., JERRAYA A.
Global modeling and simulation of system-on-Chip embedding MEMS devices
4th International Conference on ASIC, ASICON 2001, Beijing, China, 23-25 October 2001

GOY J., COURTOIS B., KARAM J.M.*, PRESSECQ F.**
Design and test of an active pixel sensor (APS) CMOS image sensor for space applications
Electroning Imaging 2001 Conference on sensors, cameras, and systems for scientific/industrial
applications III (E117), San Jose, California, USA, January 21-26 2001
----------
* MEMSCAP, Grenoble, France ; ** CNRS, Toulouse, France

MARTINEZ S.O., COURTOIS B.
Study of scalability for micromachined free-spaceoptical cross-connects
Photonics Packaging and Integration III part of SPIE Symposium on Integrated Optics, San
Jose, California, USA, 20-26 January 2001

MARTINEZ S.O., COURTOIS B.
Insertion losses in micromachined free-space optical cross-connects due to fiber
misalignments
Design, Test, Integration, and Packaging of MEMS/MOEMS (DTIP 2001), Cannes,
France, April 25-27 2001

POPPE A.,* FARKAS G.**, RENCZ M.*, BENEDEK Zs.*, POHL L.*, SZEKELY V.*, TORKI K., MIR S., COURTOIS B.
Design issues of a multi-functional intelligent thermal test die
17th IEEE Semiconductor Thermal Measurement and Management Symposium
(SEMITERM 2001), San Jose, California, USA, March 20-23 2001
----------
*Technical University of Budapest, Hungary; **MicRed Microelectronics Res & Dev Ltd., Hungary

RIBAS R.P.*, LESCOT J.**, LECLERCQ J.-L.***, COURTOIS B.
Thermal and mechanical evaluation of micromachined planar spiral inductors
Design, Test, Integration, and Packaging of MEMS/MOEMS (DTIP 2001), Cannes, France,
April 25-27 2001
----------
* Univ. Federal do Rio Grande do Sul, Brazil; ** LEMO/CNRS, France ; *** LEOM/CNRS, France

TORKI K., COURTOIS B.
CMP: The access to advanced low cost manufacturing
2001 International Conference on Microelectronic Systems Education (MSE 2001)
Las Vegas, USA, 17-18 June 2001

2002

CHARLOT B., COURTOIS B., DELORI H., PAILLOTIN J.-F., TORKI K.
The CMP Service
4th European Workshop on Microelectronics Education (EWME 2002), Parador de Baiona,
Spain, May 23-24 2002

SZEKELY V.*, RENCZ M.*, FARKAS G.**, COURTOIS B.
Measuring interface thermal resistance values by transient testing
Eight Intersociety Conference on Thermal and Thermomechanical Phenomena in
Electronic Systems (ITHERM 2002), Marina San Diego, California, USA, May 29 –
June 1 2002
----------
* Technical University Budapest, Hungary; ** MicRed Microelectronics Res & Dev Ltd., Hungary

RENCZ M.*, SZEKELY V.*, COURTOIS B.
An algorithm for the inclusion of RC compact models of packages into board level thermal
simulation tools
International Conference on Computational Nanoscience and Nanotechnology - Fifth International Conference on Modeling and Simulation of Microsystems (ICCN-MSM 2002), San Juan, Puerto Rico, USA, April 22-25, 2002
----------
* Technical University Budapest, Hungary

RENCZ M.*, COURTOIS B.
Co-simulation of dynamic compact models of packages with the detailed models of printed
circuit boards, SEMICON West STS’02, San Jose, USA, July 17-18 2002
----------
* Technical University Budapest, Hungary

2003

RENCZ M.*, SZEKELY V.**, COURTOIS B.
Studies with transient compact models of packages and heat sinks
International Electronics Packaging Conference, Maui, Hawaii, USA, July 6-11, 2003
----------
* MicRed Microelectronics Res & Dev Ltd., Hungary; ** Budapest University of Technology and Economics, Hungary

RENCZ M.*, SZEKELY V.**, POPPE A.**, COURTOIS B.
Algorithmic and modeling in the electro-thermal simulation of thermally operated microsystems
Nanotechnology Conference and Trade Show (NanoTech’03), San Francisco, California, USA, February 23-27, 2003
----------
* MicRed Microelectronics Res & Dev Ltd., Hungary; ** Budapest University of Technology and Economics, Hungary

RENCZ M.*, SZEKELY V.**, POPPE A.**, TORKI K., COURTOIS B.
Electro-thermal simulation for the prediction of chip operation within the package
19th Semiconductor Thermal Measurement and Management Symposium (SEMITHERM’03), San Jose,
California, USA, March 11-13, 2003
----------
* MicRed Microelectronics Res & Dev Ltd., Hungary; ** Budapest University of Technology and Economics, Hungary

RENCZ M.*, SZEKELY V.**, POPPE A.**, TORKI K., COURTOIS B.
Electro-thermal simulation of chip operation within the package
Workshop on Thermal Management Challenges for the Navy, Annapolis, Maryland, USA, April 8-9, 2003
----------
* MicRed Microelectronics Res & Dev Ltd., Hungary; ** Budapest University of Technology and Economics, Hungary

RENCZ M.*, SZEKELY V.**, POPPE A.**, COURTOIS B.
Electro-thermal simulation of MEMS elements
SPIE Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP’03), Cannes, France, May 5-7, 2003
----------
* MicRed Microelectronics Res & Dev Ltd., Hungary ; ** Budapest University of Technology and Economics, Hungary

RENCZ M.*, FARKAS G.*, SZEKELY V.**, POPPE A.**, COURTOIS B.
Boundary condition independent dynamic compact models of packages and heat sinks from thermal transient measurements, 5th Electronics Packaging and Technology Conference 2003 (EPTC’03), Singapore, December 10-12, 2003
----------
MicRed Microelectronics Res & Dev Ltd., Hungary ; ** Budapest University of Technology and Economics, Hungary

2004

CHARLOT B., SZEKELY V.*, RENCZ M.*, BOGNAR G.*, COURTOIS B.
An 8x8 thermopile based uncooled infrared sensor
Europen Micro and Nano Systems (EMN’04), Paris, France, October 20-21, 2004
---------
* Technical University of Budapest, Hungary

COURTOIS B., TORKI K., COLIN S., DELORI H., EYRAUD S., PAILLOTIN J-F., DI PENDINA G
Infrastructures for education, research and industry in microelectronics – Developments at CMP and worldwide cooperation
10th International Symposium on Integrated Circuits, Devices & Systems (ISIC’04), Integrated Systems on Silicon, Singapore, 8-10 September 2004

GALY N., CHARLOT B., PARRAIN F., COURTOIS B.
A full identification system for a tactile fingerprint sensor
Design, Test, Integration, and Packaging of MEMS/MOEMS (DTIP’04), Montreux, Switzerland, May 12-14, 2004

MIR S., RUFER L., COURTOIS B.
On-chip testing of embedded transducers
Invited talk at 17th International Conference on VLSI Design, Mumbai, India, pp. 463-472, January 5-9, 2004

MIR S., CHARLOT B., RUFER L., COURTOIS B.
On-chip testing of embedded silicon transducers
Invited talk at IEEE International SOC Conference (SOCC’04), San Clara, California, USA,
September 12-15, 2004

MIR S., CHARLOT B., RUFER L., COURTOIS B.
On-chip testing of embedded silicon transducers
Invited talk at the 16th International Conference on Microelectronics (ICM’04), Tunis, Tunisia, December 6-8,2004

ROMAN C., CIONTU F., COURTOIS B.
A carbon nanotube-based sensor for measuring forces developed by cells
Nanotechnology Conference and TradeShow (NanoTech’04), Boston, Massachusetts, U.S.A.,
March 7-11, 2004

ROMAN C., CIONTU F., COURTOIS B.
Single molecule detection and macromolecular weighting using an all-carbon-nanotube nanoelectromechanical sensor
Fourth IEEE Conference on Nanotechnology (NANO’04), Munich, Germany, August 17-19, 2004

ROMAN C., CIONTU F., COURTOIS B.
Aromatic amino acids physisorbed on graphene :electronic properties and hamiltonian model reduction
Europen Micro and Nano Systems (EMN’04), Paris, France, October 20-21, 2004

RENCZ M.**, POPPE A.**, COLLARD E.*, RESS S.*, SZEKELY V.*, COURTOIS B.
A procedure to correct the error in the structure function based thermal measuring methods
20th Semiconductor Thermal Measurement and Management Symposium (SEMITHERM’04), San Jose, California, USA, March 7-11, 2004
----------
* Budapest University of Technology and Economics, Hungary; ** MicRed Microelectronics Res & Dev Ltd., Hungary

RENCZ M.**, POPPE A.**, COLLARD E.*, RESS S.*, SZEKELY V.*, COURTOIS B.
Increasing the accuracy of structure function based evaluation of thermal transient measurements
International Conference on Thermal, Mechanics and Thermomechanical Phenomena in Electronic Systems (ITHERM’04), Las Vegas, USA, June 1-4, 2004
----------
* Budapest University of Technology and Economics, Hungary; ** MicRed Microelectronics Res & Dev Ltd., Hungary

RENCZ M.*, SZEKELY V.**, POPPE A.*, COURTOIS B., ZHANG L.***
Testing the die attach quality of 3D Stacked dies
International Mechanical Engineering Congress and Exposition (IMECE’04), Anaheim, California, USA, November 13-19, 2004
----------
* MicRed Microelectronics Res & Dev Ltd., Hungary; ** Budapest University of Technology and Economics, Hungary; *** National Semiconductor Corporation, Santa Clara, CA, USA

RENCZ M.*, FARKAS G.*, SZEKELY V.**, POPPE A.**, COURTOIS B.
Thermal qualification of 3D stacked die packages
6th Electronics Packaging and Technology Conference (EPTC’04), Singapore, December 8-10, 2004
----------
* MicRed Microelectronics Res & Dev Ltd., Hungary; ** Budapest University of Technology and Economics, Hungary

SZEKELY V.*, BOGNAR G.*, RENCZ M.**, CIONTU F., CHARLOT B., COURTOIS B.
Design and verification of an electrostatic MEMS simulator
Nanotechnology Conference and TradeShow (NanoTech’04), Boston, Massachusetts, U.S.A.,
March 7-11, 2004
----------
* Budapest University of Technology and Economics, Hungary; ** MicRed Microelectronics Res & Dev Ltd., Hungar

2005

COURTOIS B., RENCZ M.*
Thermal modeling of multiple die packages
7th Electronics Packaging Technology Conference (EPTC’05), Singapore, December 7-9, 2005
----------
* MicRed Microelectronics Res & Dev Ltd., Hungary

ROMAN C., CIONTU F., COURTOIS B.
Electronic properties of graphitic surfaces with absorbed aromatic amine acids
Nanotechnology Conference and TradeShow (NanoTech’05), Anaheim, California, U.S.A., March 8-12, 2005

ROMAN C., CIONTU F., COURTOIS B.
A framework for computing transport properties of carbon nanotube-based conductance biochemical
sensors
European Nano Systems (ENS’05), Paris, Rance, 14-16 December 2005

SZABO P.*, PERLAKY G.**, BOGNAR GY.**, HORVATH GY.**, RESS S.**, POPPE A.**, SZEKELY V.*,
RENCZ M.**, COURTOIS B.
Thermo-mechanical characterization and integrity checking of packages and movable-structures
Nanotechnology Conference and Trade Show (NANOTECH’05), Anaheim, California, USA,
May 8-12, 2005
----------
* Budapest University of Technology and Economics, Hungary; ** MicRed Microelectronics Res & Dev Ltd., Hungary

SZABO P.*,**, SZEKELY V.*, POPPE A. *,**, FARKAS G.**, COURTOIS B., RENCZ M. *,**
Thermal characterization and modeling of stacked die packages
Technical Conference and Exhibition on Integration and Packaging of Micro, Nano and Electronic Systems (InterPACK 2005), San Francisco, Ca., USA, July 17-22, 2005
----------
* Budapest University of Technology and Economics, Hungary; ** MicRed Microelectronics Res & Dev Ltd., Hungary

SZABO P.*, RENCZ M.*, SZEKELY V.**, POPPE A.*, FARKAS G.*, COURTOIS B.
Thermal modeling of multiple die packages
7th Electronics Packaging Technology Conference (EPTC’05), Singapore, December 7-9, 2005
----------
* MicRed Microelectronics Res & Dev Ltd., Hungary; **Budapest University of Technology and Economics, Hungary

TORKI K., COURTOIS B.
CMP service for prototyping and low volume production
CEPA 2 Workshop – Digital Platforms for Defence, Brussels, Belgique, March 15-16, 2005

2006

RENCZ M. *,**, NEMETH B.*, SZABO P.*,**, POPPE A. *,**, COURTOIS B.
Characterization of the etching quaality in micro-electro-mechanical systems by thermal transient methodology
Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP’06), Stresa, Italy, 26-28 April 2006
----------
* Budapest University of Technology and Economics, Hungary; ** MicRed Microelectronics Res & Dev Ltd., Hungary

RENCZ M. *,**, SZABO P.*,**, POPPE A. *,**, COURTOIS B.
Thermal testing and dynamic modeling of multiple die packages
International Conference on Thermal and Thermomechanical Phenomena in Electronic Systems
(ITherm’06), San Diego, California, USA, May 30 – June 2, 2006
----------
* Budapest University of Technology and Economics, Hungary; ** MicRed Microelectronics Res & Dev Ltd., Hungary

SZABO P.*,**, NEMETH B.*, RENCZ M. *,**, COURTOIS B.
Characterization of the etching quality in micro-electro-mechanical systems by thermal transient methodology
Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP’06), Stresa, Italy,
April 26-28, 2006
----------
* Budapest University of Technology and Economics, Hungary; ** MicRed Microelectronics Res & Dev Ltd., Hungary

SZABO P.*, POPPE A. *,**, FARKAS G.*, SZEKELY V.**, RENCZ M. **, COURTOIS B.
Thermal characterization and compact modeling of stacked die packages
International Conference on Thermal and Thermomechanical Phenomena in Electronic Systems
(ITherm’06), San Diego, California, USA, May 30 – June 2, 2006
----------
* MicRed Microelectronics Res & Dev Ltd., Hungary; ** Budapest University of Technology and Economics, Hungary

2007

COURTOIS B., TORKI K., COLIN S., DELORI H., EYRAUD S., PAILLOTIN J.-F., DI PENDINA G., DUMONT S.
Infrastructures for Education, Research and Industry in Microelectronics – Recent Developments.
International Symposium on INtegratied Circuits (ISIC’2007), Singapore, 26-28 September 2007.

O’CONNOR I., COURTOIS B., CHAKRABARTY K., DELORME N., HAMPTON M., HARTUNG J.
Heterogeneous Systems on Chip and Systems in Package
Design, Automation and Test in Europe (DATE 2007), Nice, France, April 17-19, 2007

2008

COURTOIS B, TORKI K., DUMONT S., EYRAUD S., PAILLOTIN J-F., DI PENDINA G.
Infrastructures for Education, Research and Industry in Microelectronics
14th IEEE Mediterranean Electrotechnical Conference (MELECON 2008), Ajaccio (France), 5-7 May 2008.

COURTOIS B.
Infrastructures for Education, Research and Industry in ICs and MEMS
Invited paper at the International Conference on MEMS and Nanotechnology (ICMN 2008), Kuala Lumpur (Malaysia),
13-15 May 2008.

COURTOIS B., EYRAUD S., PAILLOTIN J-F, DI PENDINA G., TORKI K.
Infrastructures for Education, Research and Industry in Microelectronics
7th European Workshop on Microelectronics Education (EWME 2008), Budapest (Hungary) 28-30 May 2008

COURTOIS B., CHARLOT B.*, DI PENDINA G., RUFER L.**
Infrastructures for mixed signals in biology and medicine
14th IEEE International Mixed-Signals, sensors, and systems Test Workshop (IMS3TW 2008), Vancouver
Canada, 18-20 June 2008
----------
*IES/MITEA, Montpellier – France, **TIMA, Grenoble - France

COURTOIS B., CHARLOT B.*, DI PENDINA G., RUFER L.**
Infrastructures for Education, Research and Industry: CMOS and MEMS for BioMed
Invited paper at the 12th World Multi-Conference or Systemics, Cybernetics and Informatics (WMSCI
2008), Orlando USA, 29 June – 2 July 2008
----------

*IES/MITEA, Montpellier - France, **TIMA, Grenoble – France

COURTOIS B., CHARLOT B.*, DI PENDINA G., RUFER L.**
Electronics Manufacturing Infrastructures for Education and Commercialization
30th Annual International IEEE EMBS Conference, August 20-24, 2008, Vancouver, British Columbia, Canada
----------
*IES/MITEA, Montpellier – France, **TIMA, Grenoble – France

COURTOIS B.
Services like CMP: where do they come from, where are they going?
Keynote in IEEE International Conference on Microelectronics (ICM’08), December 14-17, 2008 in Sharjah, UAE

2009

COURTOIS B.
CMP Service: BioMed applications
12th International Symposium on Integrated Circuits (ISIC), December 14-16 2009, Singapore

COURTOIS B.
SOC/SIP for energy management
Invited paper, International SoC Design Conference (ISOCC), November 22-24 2009, Busan, Korea

COURTOIS B., TORKI K., DUMONT S., EYRAUD S., PAILLOTIN J-F, DI PENDINA G.
Infrastructures for Education and Research: from National Initiatives to global operations
The 13th World Multi-Conference on Systemics, Cybernetics and Informatics (WMSCI), July 10-13 2009, Orlando, USA

COURTOIS B.
Prototyping custom circuits and systems: 20 years back, X years forward.
Keynote in 20th IEEE/IFIP International Symposium on Rapid System Prototyping (RSP’09), June 22-26 2009,
Paris, France

COURTOIS B.
Infrastructures for Education and Research: from National initiatives to global operations and from EE&CS communities to other communities and key applications
Keynote in 4th IEEE International Conference on Design & Technology of Integrated
Systems in Nanoscale Era (DTIS), April 6-7 2009, Cairo, Egypt

COURTOIS B.
CMP Service: past, present, future
Invited paper in 15th Workshop on Synthesis and System Integration of Mixed Information technologies (SASIMI),
March 9-10 2009, Okinawa, Japan

COURTOIS B.
Infrastructures services like CMP: where should they be heading?
Invited talk in CMOS Emerging Technologies Workshop, February 18-20 2009, Banff, Canada

COURTOIS B., TORKI K., DUMONT S., EYRAUD S., PAILLOTIN J-F, DI PENDINA G.
Infrastructures for Education, Research and Industry in Microelectronics - a look worldwide and a look at India
22nd International Conference on VLSI Design, 5-9 January 2009, New-Delhi, India

2010

COURTOIS B.
Electronics for energy management
Keynote at 5th International Design & Test Workshop (IDT), December 14-16, 2010, Abu Dhabi, UAE

COURTOIS B.
Electronics and sensors for biomed applications
IEEE SENSORS 2010 Conference, November 1 - 4, 2010, Waikoloa, USA

COURTOIS B.
Infrastructure for ICs and MEMS manufacturing
IEEE/ASME International Conference on Mechatronic and Embedded Systems and Applications (MESA)
July 15-17, 2010, Qingdao, ShanDong, China

COURTOIS B.
And now, where do we go?
Keynote at 8th European Workshop on Microelectronics Education (EWME), May 10-12, 2010, Darmstadt, Germany

COURTOIS B.
Energy management: how electronics can help?
International Multi-Conference on Complexity, Informatics and Cybernetics (IMCIC), April 6-9 2010, Orlando, USA

COURTOIS B.
ICs and MEMS for energy management
Keynote at 11th IEEE Latin-American Test Workshop (LATW), March 28-31 2010, Punta del Este, Uruguay

COURTOIS B.
Gestion de l'énergie par les composants
Invited speaker at Journée d’étude « Les SEC se mettent au vert »
March 4 2010 – Université Paul Sabatier, Toulouse, France

2011

COURTOIS B.
Electronics vs. Energy: general considerations and opportunities from CMP
Keynote at ICECS/IDT 2011, 11-14 December 2011, Beirut, Lebanon

COURTOIS B.
Electronics for Energy Management
Keynote at ASQED 2011, July 19-20 2011, Kuala Lumpur, Malaysia

2012

LANDROCK C.K, DI PENDINA G., OMRANE B., ARISTIZABAL J., KAMINSKA B., COURTOIS B.
Integrated Circuit and MEMS self powering Applications based on Organic Polymer Solar Cells and Hybrid Polymer Super-Capacitors
Invited paper at MRS Spring Meeting, 9-13 April 2012, San Francisco, USA