Biographies of Staff Members

COURTOIS Bernard


Position:	Directeur de Recherches CNRS
Education:
1981 -	Docteur d'Etat degree
1976 -	Doctor-Engineer degree
1973 -	Engineer degree
1970 - 1973	National School for Informatics and Applied Mathematics in Grenoble
1967 - 1970	Mathematics in Paris
1968 -	Baccalaureat degree – Philosophy
1967 -	Baccalaureat degree – Mathematics
Current responsibilities: Director of CMP Service

Short Biography
Bernard COURTOIS received the Engineer degree in 1973 from the Ecole Nationale Supérieure d’Informatique et Mathématiques Appliquées de Grenoble (Grenoble, France), and next the « Docteur-Ingénieur » and « Docteur-ès-Sciences » degrees from the Institut National Polytechnique de Grenoble. He is currently the Director of CMP Service that serviced already about 1000 Universities and Companies from 66 countries for ICs and MEMS prototyping and small volume production. He was also the founding Director of the Laboratory of Techniques of Informatics and Microelectronics for Computer Architecture (TIMA) where researches include CAD, architecture and testing of integrated circuits and systems. He has been general chair or program chair of various international conferences and workshops, including EDAC-ETC-EUROASIC, Electron and Optical Beam Testing, EUROCHIP, Mixed-Signal Testing, Rapid System Prototyping, THERMINIC, Design, Test and Microfabrication of MEMS/MOEMS, POLYTRONIC and European Nano Systems. He is a member of ACM, ASME, IEEE and IMAPS. He is a IEEE Computer Society’s Golden Core member and he is Doctor Honoris Causa of the Technical University of Budapest.
Recent papers
- Invited paper "Infrastructures for Education, Research and Industry: CMOS and MEMS for BioMed" at the 12th World Multi-Conference or Systemics, Cybernetics and Informatics (WMSCI 2008), Orlando USA, 29 June – 2 July 2008
- "Infrastructures for Education, Research and Industry in Microelectronics - a look worldwide and a look at India " at the 22nd International Conference on VLSI Design (VLSI Design 2009), New Delhi, India, 5-9 January 2009
Full list of Publications
A) 1973-1981 B) Books and magazines : 1982-2008 C) Conferences and Workshops : 1982-2008 A) 1973 - 1981 1973 Computer test program IEEE Workshop on diagnosis and reliable design of digital systems - Pasadena - 12/73, U.S.A.(Nb of co-authors: 4) 1974 Nouvelles perspectives des outils d'évaluation de fiabilité Journées d'études sur les calculateurs numériques embarqués. LAAS et PRIVAT ed. Toulouse, 6/74 (Nb of co-authors: 1) 1975 On the relationships between performance and reliability of computers, 3rd Int. seminar on applied aspects of the automata theory, Varna, 6/75, Bulgarie (Nb of co-authors: 1) Microprogramming as a means of evaluation of a computer's performance and reliability EUROMICRO. North Holland publishing, 6/75, Nice (Nb of co-authors: 1) On balancing hardware-firmware for the design of a fault tolerant computer's series 8th Annual Workshop on microprogramming, Chicago, 10/75, USA (Nb of co-authors: 1) On partitioning a redundant system under realistic assumptions Informatica 10/75, Yougoslavia (Nb of co-authors: 1) 1976 Models for the control of the test and of the reconfiguration of a computer 2nd European meeting on cybernetics and systems research, Vienne, Autriche 4/76, Hemisphere Pub. C°, N.Y. On balancing safety and reliability of hybrid and "bi duplex" systems IEEE Fault Tolerant Computing Symposium, Pittsburgh, USA, 6/76 Etude d'un calculateur tolérant des pannes : ses fiabilité, sécurité, performance et coût Thèse de docteur ingénieur, Grenoble 12/76 Fiabilité et sécurité de quelques systèmes logiques Congrès AFCET Automatismes logiques : recherches et applications industrielles, Paris, 12/76 Interaction fiabilité - sécurité - disponibilité maintenance 3ème Congrès National de fiabilité Perros Guirec, 9/76 Safety and reliability of non-repairable systems Digital processes 2 – 1976 1977 Influence of reliability and safety on the maintenance of logical systems 2nd IFAC Symposium on discrete systems - Desden, DDR 3/77 1979 Failure detection in microcomputer systems IFAC workshop on safety computer controlled systems, Stuttgart, 5/79, FRG Pergamon Press 1980 Some results about the efficiency of simple mechanisms for the detection of microcomputer malfunctions 9th Fault Tolerant Computing Symposium, Madison, 6/79, USA Projet d'architecture pour la commande d'un autocommutateur téléphonique, Inter. Switching Symposium, Paris, 5/79 Projet d'architecture pour la commande d'un autocommutateur téléphonique Inter. switching Symposium, Paris 5/79 1980 Fréquences optimales pour tests concurrents et périodique de systèmes logiques 2nd Colloque Int. sur la fiabilité et la maintenabilité, Perros Guirec 9/80 (Rapport IMAG n° RR 192, Mars 80) 1981 Safety Availability and Maintenance Evaluation of Redundant Systems Digital Processes A methodology for on-line testing of microprocessors 11th Fault Tolerant Computing Symposium, Portland, June 81, USA Failure mechanisms, fault-hypotheses and analytical testing of LSI-NMOS (HMOS) circuits VLSI 81, University of Edinburgh, 18.21.8.81, Academic Press Test et LSI Doctorat d'Etat, 12 Juin 1981 SKALP : Skeleton Architecture for fault tolerant distributed processing EUROMICRO Jounal, Vol. 7, n° 5, May 1981 A light efficient and microprocessor oriented ATE Automatic testing 81 - Brighton, December 8/10 81 On-line oriented functional testing of control sections of integrated CPUs EUROMICRO Symposium, Paris, Septembre 8/10 81. Analytical testing of data processing sections of integrated CPUs Int. Test Confernece, Cheery-Hill, October 27/29 81, Philadelphie, USA B) BOOKS AND MAGAZINES, 1982-2008 1982 COURTOIS B. Sûreté de fonctionnement dans des systèmes distribués Journal NTT, 1982 (in japanese) 1984 COURTOIS B., MARCHAL P., NICOLAIDIS M. Microarchitecture of the MC 6800 and evaluation of a self-checking version Ecole OTAN "Microarchitecture of VLSI Computers" July 1984 - Martinus Nijhoff - Editeur BASCHIERA D., COURTOIS B. "Testing CMOS" : A challenge ? VLSI Design, October 1984 1986 JERRAYA A., COURTOIS B. The SYCO silicon compiler and its environment NATO ASI - July 1986 1987 JERRAYA A., COURTOIS B. The SYCO silicon compiler and its environment NATO ASI on Logic synthesis and silicon compilation for VLSI Design, L'Aquila (Italy), July 86, Martinus Nijhoff Editors, 1987 NICOLAIDIS M., COURTOIS B. Les circuits autotestables en vue du test en ligne Revue "Enjeux" N° 81 - July 1987 DAVID R.* COURTOIS B., SAUCIER G** A history of research in fault tolerant computing at the Grenoble University Dependable Computing and Fault-Tolerant Systems, Vol 4, Springer-Verlag 1987 ---------- * LAG, Grenoble, France; ** LGI, Grenoble, France 1988 JERRAYA A., MHAYA N., GERONIMI J.P., COURTOIS B. "SYCO : a silicon compiler for ASICs specified by algorithms" Invited paper, in Special Issue on silicon compilation in Europe, IEE CAE Journal, June 1988. JANSCH I., COURTOIS B. "Strongly Language Disjoint Checkers" IEEE Transactions on Computers, June 1988 NICOLAIDIS M., COURTOIS B. "Strongly code disjoint checkers" IEEE Transactions on Computers, June 1988 WOLFGANG E., COURTOIS B. Proceedings of the 1st European Conference on Electron and Optical Beam Testing of Integrated Circuits North Holland, 1988 ---------- SIEMENS, Munich, FRG 1989 DAVID R., FUENTES A., COURTOIS B. Self-checking logic arrays In Microprocessors and Microsystems, Butterworth Scientific Ltd, Guilford, England, May 1989 JERRAYA A., MHAYA N., JAMIER R., BEKKARA N., COURTOIS B. Le compilateur de silicium SYCO In Technique et Science Informatiques (TSI) Journal, Vol. 8, N°6, Nov/Dec 1989 ---------- IFATEC - Versailles ** SGS Thomson, Grenoble LAPRIE J.C., POWELL D., GAUDEL M.C.*, COURTOIS B. Sûreté de fonctionnement des systèmes informatiques : matériel et logiciel, Dunod, 1989 ---------- LAAS, Toulouse, France ** LRI, Orsay, France NICOLAIDIS M., COURTOIS B. Self-checking logic arrays In Microprocessors and Microsystems, Butterworth Scientific Ltd, Guilford, England, May 1989 1990 KUBALEK E., WOLFGANG E., COURTOIS B. Proceedings of the 2nd European Conference on Electron and Optical Beam Testing of Integrated Circuits, North Holland, 1990 1991 NICOLAIDIS M., TORKI K., JERRAYA A.A., COURTOIS B. Silicon compilation of hierarchical control sections with unified BIST testability In Microprocessors and Microsystems, Butterworth Scientific Ltd, Guildford, UK, 1991 1992 CONARD D., RUSSELL J., LAURENT J., SKAF A., COURTOIS B. Multiple adjacent image processing for automated failure location using electron beam testing In Microelectronics Reliability, Vol. 32, Number 11, pp. 1615-1620, Pergamon Press Ltd., Great Britain, 1992 CASTRO ALVES V., LUBASZEWSKI M., NICOLAIDIS M, COURTOIS B. BIST scheme for embedded multiport RAMs In Informacije MIDEM N°4, Journal of Microelectronics, Electronic Components and Materials, pp. 215-221, Informacije MIDEM, Letnik 22,ST.4 (63), Ljubljana, Yougoslavia, December 1992 MELGARA M., WOLFGANG E., COURTOIS B., FANTINI F.*, Editors Proceedings of the 3rd European Conference on Electron and Optical Beam Testing of Integrated Circuits, Elsevier, 1992 ---------- CSELT, Turin, Italy SIEMENS, Munich, Germany * Parma University, Italy RUSSELL J.D., VARGAS F.L., COURTOIS B. E-beam testing using multiple adjacent image processing for prototype validation The Microelectronic Engineering Journal, Elsevier Science Publishers, Volume 16, Numbers 1-4, pp 413-420, 1992 1993 COURTOIS B., KERECSEN-RENCZ M.* Trends in Microelectronics - European Perspectives In Journal on Communications, Vol. XLIV, pp. 2-7, July 1993 ---------- * Technical University of Budapest, Hungary NICOLAIDIS M., VARGAS F., COURTOIS B. Design of Built-In Current Sensors for concurrent checking in radiation environments In IEEE Transactions on Nuclear Science, December 1993 O'BRIEN K., PARK I., JERRAYA A., COURTOIS B. Synthesis for control-flow dominated machines Chapter in "Novel Architecture and Synthesis Methodologies for Future Application-Specific Architecture Design: A perspective", Ed. F. Catthoor, L. Svensson, Publ. KluwerAcademic, 1993 1994 COURTOIS B. MPC activities in France (in Japanese) Invited paper in IEICE Transactions, Japan, 1994 COURTOIS B. CAD and testing of ICs and systems: where are we going ? In Journal of Microelectronic System Integration, PLENUM Publishing Corporation, Vol. 2(3), pp. 139-201, 1994 1995 COURTOIS B. The activities of Multiproject Chip Service in the world (in Japanese) Invited paper in the Journal of Future Electron Devices Institute, Tokyo, Japan, 1995 COURTOIS B., DELORI H., PAILLOTIN J.F., TORKI K. MPC fabrication principles and CMP services In the Journal of Solid-State Devices and Circuits, Publication by Brazilian Microelectronics Society, Vol. 3, n° 1, July 1995 COURTOIS B., KARAM J.M. CMP Service: Microsystems low-cost fabrication and CAD tools support MST-News, January 1995 HELLEBRAND S., RAJSKI J., TARNICK S., VENKATARAMAN S.*, COURTOIS B. Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers IEEE Transactions on Computers, Special issue on Fault-Tolerant Computing, 1995 ---------- University of Siegen, Germany; Mc Gill University, Montreal, Canada; * Max-Planck-Society, Fault Tolerant Computing Group at Univ. of Potsdam, Germany; **** C&SRL Laboratory, Univ. of Illinois at Urbana-Champaign, Urbana, USA KARAM J.M., COURTOIS B., PARET J.M. Collective fabrication of microsystems compatible with CMOS through the CMP Service Invited paper in Journal of Materials Science and Engineering B.: Solid-State Materials for Advanced Technology, Elsevier Science Publishers, December 1995 KOLARIK V., MIR S., LUBASZEWSKI M., COURTOIS B. Analogue checkers with absolute and relative tolerances IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol. 14, n° 5, pp. 607-612, May 1995 NICOLAIDIS M., NORAZ S., COURTOIS B. Generalized fail-safe systems Book - Commemorative Silver Jubilee Volume IEEE International Symposium on Fault Tolerant Computing, 25th Anniversary 1971-1995, Editor Dean Siewiorek ---------- Merlin Gérin, Grenoble, France 1996 KAMARINOS G., GUILLEMOT N., COURTOIS B., Editors Proceedings of the 1st European Workshop on Microelectronics Education, Grenoble, France, 5-6 February 1996, World Scientific Publishing Co Pte Ltd, London, 1996 ---------- LPCS-ENSERG, Grenoble, France ; ** CIME, Grenoble, France KAMINSKA B., COURTOIS B. IEEE Design & Test of Computers Special Issue on Design and Test of Analog and Mixed-Signal Circuits Guest Editors, Summer 1996 ---------- Ecole Polytechnique de Montréal, Canada KAMINSKA B., COURTOIS B. JETTA - Journal of Electronic Testing, Theory and Applications Special Issue on Analog and Mixed-Signal Testing Guest Editors, Volume 9, August/October 1996 ---------- Ecole Polytechnique de Montréal, Canada MIR S., LUBASZEWSKI M., KOLARIK V., COURTOIS B. Fault-based testing and diagnosis of balanced filters In Journal: Analogue Integrated Circuits and Signal Processing, Kluwer Academic Publishers Vol. 11, n°1, September 1996 ---------- Technical Univ. of Brno, Czech Republic MIR S., LUBASZEWSKI M., COURTOIS B. Fault-based ATPG for linear analogue circuits with minimal size multifrequency test sets Journal of Electronic Testing, Theory and Applications (JETTA), Special Issue on Mixed-Signal Testing, Kluwer Academic Publishers, Volume 9, 1996 MIR S., LUBASZEWSKI M., COURTOIS B. Unified Built-In Self-Test for fully differential analogue circuits Journal of Electronic Testing, Theory and Applications (JETTA), Special Issue on Mixed-Signal Testing, Kluwer Academic Publishers, Volume 9, 1996 SZEKELY V., MARTA Cs, RENCZ M., BENEDEK Zs., COURTOIS B. Design for thermal testability (DfTT) and a CMOS realization In Journal: "Sensors and Actuators", A-Physical, Vol. A55 N°1, Special Issue on Thermal Investigations of ICs and Microstructures (THERMINIC Workshop 95), July 1996 ---------- * Technical University of Budapest, Hungary SZEKELY V., RENCZ M., COURTOIS B., Guest Editors Sensors and Actuators - A-Physical Special Issue on Thermal Investigations of ICs and Microstructures (THERMINIC Workshop 95), Vol. A55 N°1, July 1996 ---------- Technical University of Budapest, Hungary WOLFGANG E., COURTOIS B., BALK L.J.*, Editors Proceedings of the 5th European Conference on Electron and Optical Beam Testing of Electronic Devices, August 27-30, 1995, Wuppertal, Germany Special Issue of Microelectronic Engineering Journal, Vol. 31, Numbers 1-4 Special Issues, Elsevier, February 1996 ---------- SIEMENS AG, Munich, Germany; ** Wuppertal University, Germany 1997 COURTOIS B. Access to microsystem technology : the MPC services solution Microelectronics Journal, Vol.28, N° 4, May 1997 KARAM J.M., COURTOIS B., BOUTAMINE H. CAD tools bridge microsystems and foundries In IEEE Design & Test of Computers, Special Issue on Design, Test & CAD in Europe Summer 1997 SZEKELY V., RENCZ M., COURTOIS B. IEEE Transactions on VLSI Systems Special Issue on Thermal Investigations (THERMINIC Workshop 1996) Vol. 5, N°3, September 1997 Guest Editors ---------- * Technical University of Budapest, Hungary SZEKELY V., RENCZ M., COURTOIS B. Special Issue on Thermal Investigations of ICs and Microstructures (THERMINIC Workshop 1995) Microelectronics Journal, Vol. 28, N° 3, March 1997 Guest Editors ---------- * Technical University of Budapest, Hungary SZEKELY V., RENCZ M., COURTOIS B. Thermal Transient Testing In Microelectronics Journal, N° 43, May 1997 ---------- * Technical University of Budapest, Hungary SZEKELY V., RENCZ M., TÖRÖK S., COURTOIS B. Cooling is a possible way to extend the usability of IDDQ testing Electronics Letters, Vol.33, N°25, 4th December 1997 ---------- * Technical University of Budapest, Hungary VINCI DOS SANTOS F., BOUTAMINE H., VEYCHARD D., KARAM J.M., COURTOIS B. Towards space microsystems : design and manufacturing methodologies for CMOS compatible MEMS MST news, International activities in microsystem technology, N°22, December 1997 1998 BIANCHI R.A., VINCI DOS SANTOS F., KARAM J.M., COURTOIS B., PRESSECQ F., SIFFLET S.* CMOS compatible temperature sensor using lateral bipolar transistor for very wide temperature range applications Special Issue, Journal Sensors & Actuators A-Physical, Vol. 71, No. 1-2, 1 November 1998 ---------- CNES, Toulouse, France ; TRS31, Auterive, France BIANCHI R.A., VINCI DOS SANTOS F., KARAM J.M., COURTOIS B., PRESSECQ F., SIFFLET S.** CMOS-compatible smart temperature sensors Microelectronics Journal, Vol. 29, N° 9, September 1998 ---------- CNES, Toulouse, France ; * TRS31, La Pradelle, Auterive, France COURTOIS B., BLACKBURN, Guest Editors IEEE Transactions on Components Packaging and Manufacturing Technology Special section on Thermal Investigations of ICs and Microstructures (THERMINIC Workshop 1997) Part A, Vol. 21, No. 3, September 1998 ---------- NIST, Jaithersburg, USA COURTOIS B., KARAM J.M., LUBASZEWSKI M., SZEKELY V., RENCZ M., HOFMANN K., GLESNER M. CAD tools and foundries to boost microsystems development Materials Sciences and Engineering B51, 1998 ---------- * Technical University of Budapest, Hungary; ** Darmstadt University of Technology, Germany KRIM N., COURTOIS B., VINCI DOS SANTOS F., DENT T., PEARSON I. A combined approach to the support of SMEs Advances in information technologies : the Business Challenge J.-Y. Roger et al. (Eds.), IOS Press, 1998 ---------- Iprias Ltd, UK LUBASZEWSKI M., COURTOIS B. A reliable fail-safe system IEEE Transactions on Computers, Vol. 47, No. 2, February 1998 ---------- * UFRGS, Porto Alegre, Brazil RIBAS R.P., LECLERCQ J.L., KARAM J.M., COURTOIS B., VIKTOROVITCH P. Bulk micromachining characterization of 0.2 µm HEMT MMIC technology for GaAs MEMS design Materials Sciences and Engineering B51, 1998 ---------- * LEAME, Ecole Centrale de Lyon, Ecully, France RIBAS R.P., LESCOT J., LECLERCQ J.L., BENNOURI N., KARAM J.M., COURTOIS B. Micromachined planar spiral inductor in standard GaAs HEMT MMIC technology IEEE Electron Device Letters, Vol. 19, No. 8, August 1998 ---------- LEMO Laboratory, Grenoble, France; ** LEAME, Ecole Centrale de Lyon, Ecully, France SZEKELY V., RENCZ M., COURTOIS B. Tracing the thermal behavior of ICs IEEE Design & Test of Computers, April-June 1998 ---------- * Technical University of Budapest, Hungary SZEKELY V., RENCZ M., COURTOIS B., Guest Editors Special Issue on Thermal Investigations of ICs and Microstructures (THERMINIC Workshop 1996) Microelectronics Journal, Vol. 29, N° 4-5, April-May 1998 ---------- * Technical University of Budapest, Hungary SZEKELY V., RENCZ M., KARAM J.M., LUBASZEWSKI M., COURTOIS B. Thermal monitoring of self-checking systems JETTA - Journal of Electronic Testing, Theory and Applications Special Issue on On-Line Testing, Vol.12, N°1-2, February-April 1998 ---------- Technical University of Budapest, Hungary SZEKELY V., RENCZ M., COURTOIS B., Guest Editors Sensors and Actuators, A-physical Special issue on Thermal Investigations of ICs and Microstructures (THERMINIC Workshop 1997) Vol. A71 N°s 1-2, 1 November 1998 ---------- Technical University of Budapest 1999 BLACKBURN D., COURTOIS B., Guest Editors IEEE Transactions on Components and Packaging Technology Special issue on Thermal Investigations of ICs and Microstructures (THERMINIC Workshop 1998) Vol.22, No.2, June 1999 ---------- NIST, Jaithersburg, USA COURTOIS B. Quelques tendances en microélectronique Bulletin de liaison du CRITT MICROLOR No.12, January-February-March 1999 COURTOIS B., SZEKELY V., RENCZ M. Thermal investigations of ICs and Microstructures In "Encyclopedia of Microcomputers", a multi-volume work, Executive Ed. A. Kent, J.G. Williams, (Publishers: Marcel Dekker Inc. of New-York), Vol. 23, pp. 361-389, 1999 ---------- * Technical University of Budapest, Hungary COURTOIS B., DEMIDENKO S., Editors Design, Characterization and Packaging for MEMS and Microelectronics Proceedings of SPIE, Vol. 3893, 1999 COURTOIS B., CRARY S.B., EHRFELD W., FUJITA H., KARAM J.M.*, MARKUS K.**, Editors Design, Test, and Microfabrication of MEMS and MOEMS Proceedings of SPIE, DTM’99, Paris, France, Vol. 3680, 30 March - 1 April 1999 ---------- University of Michigan, USA; IMM, Maynz, Germany; * University of Tokyo, Japan; ** MEMSCAP, Grenoble, France; *** Cronos Integrated Microsystems, Inc. , North Carolina, USA COURTOIS B., BLANTON S., Guest Editors Special Issue on MEMS, IEEE Design and Test of Computers October – December 1999 ---------- Carnegie Mellon University, Pittsburg, PA, USA PALAN B., SANTOS F.V., KARAM J.M., COURTOIS B., HUSAK M.* Sensor interface circuit for ISFET based sensors Journal of Solid-State Devices and Circuits, Vol. 7, No. 1, February 1999 ---------- * Czech Technical Univesity in Prague, Prague, Czech Republic PALAN B., SANTOS F.V., KARAM J.M., COURTOIS B., HUSAK M.* New ISFET sensor interface circuit for biomedical applications Journal Sensors and Actuators B : Chemical, Vol. 57, No. 1-3, pp. 63-68, 1999 ---------- * Czech Technical Univesity in Prague, Prague, Czech Republic SZEKELY V., RENCZ M., COURTOIS B., Guest Editors Microelectronics Journal Special Issue on Thermal Investigations of ICs and Microstructures (THERMINIC Workshop 1998) Vol. 30, No.11, November 1999 ---------- Technical University of Budapest, Hungary SZEKELY V., RENCZ M., COURTOIS B. A step forward in the transient thermal characterization of chips and packages Microelectronics Reliability, Vol. 39, pp. 89-96, 1999 2000 BIANCHI R.A., KARAM J.M., COURTOIS B. Analog ALC crystal oscillators for high-temparture applications IEEE Journal of Solid-State Circuits, Vol. 35, N°1, January 2000 (ISSN 0018-9200) BIANCHI R.A., KARAM J.M., COURTOIS B., NADAL R., PRESSECQ F., SIFFLET S.** CMOS-compatible temperature sensor with digital output for wide temperature range Applications Microelectronics Journal. Vol.31, Nos.9-10, Sept.-Oct. 2000 ---------- * STMicroelectronics, Crolles, France ; MEMSCAP, Grenoble, France ; * CNRS, Toulouse, France BLACKBURN D., COURTOIS B., LASANCE C., Guest Editors Special Issue On Thermal Investigations of ICs and Microstructures (THERMINIC 1999) IEEE Transactions on Components and Packaging Technologies, Vol. 23, No.3, September 2000 ---------- NIST, USA; ** Philips, The Netherlands COURTOIS B., CRARY S.B., GABRIEL K.J., KARAM J.M., MARKUS K., TAY A.A.O.**, Editors Design, Test, Integration and Packaging of MEMS/MOEMS Proceedings of SPIE, DTIP’2000, Paris, France, Vol. 4019, 9-11 May 2000 ---------- University of Michigan, USA; Carnegie Mellon Univ., Pittsburgh, Pa, USA; * MEMSCAP, Grenoble, France; **Cronos Integrated Microsystems, Inc. , North Carolina, USA; **National University of Singapore, Singapore COURTOIS B., GUILLEMOT N., KAMARINOS G., STEHELIN G., Editors Microelectronics Education Proceedings of the 3rd European Workshop on Microelectonics Education (EWME’2000), Aix-en-Provence, France 18-19 May 2000, (ISBN 0-7923-6456-2) ---------- CIME/INPG, Grenoble, France ; LPCS/CNRS, Grenoble, France ; * St University (ST Microelectronics), Fuveau, France COURTOIS B., RENCZ M., LASANCE C., SZEKELY V., POPPE A.**, Editors Proceedings of 6th International Workshop on THERmal Investigations of ICs and Systems (THERMINIC 2000), Budapest, Hungary, September 24-27 2000 (ISBN 2-913329-51-9) ---------- Technical University of Budapest, Hungary; Philips, The Netherlands; * MicRed Microelectronics Res & Dev Ltd., Hungary HENINI M., COURTOIS B., Editors Papers presented at the 1999 Workshop on Thermal Investigations of ICs and Microstructures (THERMINIC 1999) Microelectronics Journal, Vol. 31, Nos 9-10, September – October 2000 (ISSN 0026-2692) ---------- University of Nottingham, UK JEANNOT J.C., SCHROPFER G., GOY J., COURTOIS B., de LABACHELERIE M. Micro-accéléromètre intégré trois axes Chapter in « Microcapteurs et Microsystèmes Intégrés », Nano et Micro Technologies, edited by D. Hauden, Hermès, Vol. 1, N°1, 2000, (ISBN 2-7462-0142-9) ---------- * LPMO/IMFC, Besançon, France; ** SENSONOR/ASA, Horten, Norway LUBASZEWSKI M., MIR S., KOLANIK V., NIELSEN C.*, COURTOIS B. Design of self-checking fully differential circuits and boards IEEE Transactions on VLSI Systems, Vol. 8, No. 2, April 2000 ---------- UFRGS, Porto Alegre, Brazil; University of Brno, Brno, Czechoslovakia; DEIF A/S, Danemark MIR S., CHARLOT B., COURTOIS B. Extending fault-based testing to microelectromechanical systems Journal of Electronic Testing : Theory and Applications, Vol. 16, No. 3, June 2000 PALAN B., SANTOS F.V., COURTOIS B., HUSAK M. Microsystems for space applications full paper from AED'99 Prague will be published in Journal Acta Polytechnica-Journal of Advanced Engineering, Vol. 40, No.3/2000 (ISSN: 1210- 2709) --------- * Czech Technical Univesity in Prague, Prague, Czech Republic RENCZ M., SZEKELY V., TÖRÖK S., TORKI K., COURTOIS B. IDDQ testing of submicron CMOS - by cooling ? Journal of Electronic Testing Theory and Applications, N°16, pp. 453-461, 2000 ---------- Technical University of Budapest, Hungary SZEKELY V., RESS S., POPPE A., TOROK S., MAGYARI D., BENEDEK Z., TORKI K., COURTOIS B., RENCZ M.* New approaches in the transient thermal measurements Microelectronics Journal, Vol.31, Nos.9-10, September-October 2000 ---------- * Technical University Budapest, Hungary 2001 BENEDEK Zs., COURTOIS B., FARKAS G., KOLLAR E., MIR S., POPPE A., RENCZ M., SZEKELY V., TORKI K. A scalable multi-functional thermal test chip family: design and evaluation Journal of Electric Packaging (American Society of Mechanical Engineers), Vol. 123, No. 4, December 2001 ---------- * Technical University Budapest, Hungary; MicRed Microelectronics Res & Dev Ltd., Hungary CHARLOT B., MIR S., PARRAIN F., COURTOIS B. Generation of electrically induced stimuli for MEMS self-test Journal of Electronic Testing : Theory and Applications (JETTA), Kluwer Academic Publishers, Vol.17, No. 6, December 2001 COURTOIS B., Guest Editor Special double issue on MEMS technology (DTIP 2000) An International Journal Analog Integrated Circuits and Signal Processing (ALOG), Kluwer Academic Publishers, Volume 29, Nos. 1/2, October/November 2001 COURTOIS B., Editorial Board in the Proceedings of the 8th Conference Computer Networks Studia Informatica, Vol. 22 , No.1 (43), 2001 COURTOIS B., LASANCE C., Guest Editors Special Issue On Thermal Investigations of ICs and Microstructures (THERMINIC Workshop 2000) IEEE Transactions on Components and Packaging Technologies, Vol.24, No.4, December 2001 ---------- * NIST, USA; ** Philips, The Netherlands COURTOIS B., RENCZ M., LASANCE C., SZEKELY V., Editors Proceedings of 7th International Workshop on THERmal Investigations of ICs and Systems (THERMINIC 2001), Paris, France, September 24-27, 2001 ---------- Technical University of Budapest, Hungary; * Philips, The Netherlands COURTOIS, B., KARAM, J.M., LEVITAN, S.P., MARKUS, K., TAY, A.A.O., WALKER, J.A.**, Editors Design, Test, Integration, and Packaging of MEMS/MOEMS (DTIP 2001), 25-27 April 2001, Cannes, France, SPIE Proceedings Series, Vol. 4408, 2001 ---------- MEMSCAP, Grenoble, France; University of Pittsburgh, USA; * JDS Uniphase/Cronos, USA; ** National University of Singapore; *** Tellium Inc., USA GOY J., COURTOIS B., KARAM J.M., PRESSECQ F.* Design of an APS CMOS image sensor for low light level applications using standard CMOS technology An International Journal Analog Integrated Circuits and Signal Processing (ALOG), Kluwer Academic Publishers, Volume 29, Nos. 1/2, October/November 2001 ---------- * MEMSCAP, Grenoble, France ; ** CNES, Toulouse, France SZEKELY V., RENCZ M., POPPE A., COURTOIS B. THERMODEL: A tool for thermal model generation, and application for MEMS An International Journal Analog Integrated Circuits and Signal Processing (ALOG), Kluwer Academic Publishers, Volume 29, Nos. 1/2, October/November 2001 ---------- Technical University Budapest, Hungary 2002 ABBOTT D., COURTOIS B., Guest Editors Design, modeling and simulation in microlectronics and MEMS smart electronics and MEMS Microelectronics Journal, Vol. 23, Nos 1-2, January-February 2002 PARRAIN F., CHARLOT B., MIR S., COURTOIS B., Capteur infrarouge CMOS à thermopiles comportant des fonctions de selft-test Journal Nano et Micro Technologies – microcapteurs et microsystèmes intégrés, Hermès Sciences Publications, Volume 1, N°3-4, January 2002 2003 COURTOIS B. Infrastructures for education and research: from national initiatives to worldwide development Invited paper at Festkolloquium Zukunftstrendsin der Mikroelektronik Anlass: von 60. Geburtstag Professor Manfred Glesner, Darmstadt, Germany, August 29, 2003 COURTOIS B., MARKUS K., KORVINK J., KARAM J.M., BERGMAN K., MICHEL B.*, Editors Design, Test, Integration, and Packaging of MEMS/MOEMS (DTIP’03), May 5-7, 2003 Mandelieu – La Napoule, France, SPIE Proceedings ---------- JDS Uniphase/Cronos, USA ; Univ. of Freiburg, Germany ; * MEMSCAP, Grenoble, France ; ** Columbia Univ., USA ; *** IZM, Berlin, Germany COURTOIS B., Guest Editor Special Issue on DTIP 2002 (The Symposium on Design, Test, Integration of MEMS/MOEMS held in Cannes, May 6-8, 2002) An International Journal on Analog Integrated Circuits and Signal Processing, Kluwer Academic Publishers, Vol.37, No.1, October 2003 COURTOIS B., RENCZ M., LASANCE C., SZEKELY V.*, Editors Proceedings of 9th International Workshop on THERmal Investigations of ICs and Systems (THERMINIC’03), Aix-en-Provence, France, 24-26 September 2003 ---------- MicRed Microelectronics Res & Dev Ltd., Hungary; Philips, The Netherlands; * Budapest University of Technology and Economics, Hungary 2004 CHARLOT B., PARRAIN F., GALY N., BASROUR S., COURTOIS B. A sweeping mode integrated fingerprint sensor with 256 tactile microbeams IEEE Journal of Microelectromechanical Systems, Vol 4, N°13, August 2004 COURTOIS B., KORVINK J.G., Guest Editors Special Issue on DTIP 2003 An International Journal on Analog Integrated Circuits and Signal Processing, Kluwer Academic Publishers, Vol. 40, No. 2, August 2004 ---------- Albert Ludwig University in Freiburg, Germany COURTOIS B., RENCZ M., LASANCE C., SZEKELY V.*, Editors Proceedings of 10thInternational Workshop on THERmal Investigations of ICs and Systems (THERMINIC’04), Sophia Antipolis, Côte d'Azur, France, 29 September - 1 October 2004 ---------- MicRed Microelectronics Res & Dev Ltd., Hungary; Philips, The Netherlands; * Budapest University of Technology and Economics, Hungary COURTOIS B., MARKUS K., KORVINK J.G., KARAM J.M.*, IONESCU A., ESASHI M., Editors Proceedings of Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2004), Montreux,Switzerland, May 12-14, 2004 COURTOIS B., MICHEL B., Editors Foreword to Special Issue on The Symposium on Design, Test, Integration of MEMS/MOEMS (DTIP 2003) Research Journal on Microsystem Technologies, Springer Publishers, Vol.10, No.5, August 2004 -------- * IZM, Berlin, Germany 2005 COURTOIS B., MARKUS K.* et al., Editors Proceedings of Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2005), Montreux,Switzerland, June 1-3, 2005 COURTOIS B., RENCZ M., LASANCE C., SZEKELY V.*, Editors Proceedings of 11thInternational Workshop on THERmal Investigations of ICs and Systems (THERMINIC’05), Belgirate, Lake Maggiore, Italy, September 27– 30, 2005 ---------- MicRed Microelectronics Res & Dev Ltd., Hungary; Philips, The Netherlands; * Budapest University of Technology and Economics, Hungary COURTOIS B., Guest Editor Special issue on European Micro and Nano Systems (EMN04) held in Paris, 20–21 October, 2004 Microelectronics Journal, Vol. 36, No. 7, Pages 613-686, July 2005 COURTOIS B., Guest Editor Special Issue on selected papers on Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2004) An International Journal on Analogue Integrated Circuits and Signal Processing, Vol.44, No.2, August 2005 DE VENUTO D., COURTOIS B., Editors Proceedings of 1st International Workshop on Advances in Sensors and Interfaces (IWASI’05), Bari, Italy, April 19-20, 2005 (ISBN 88-8231-323-9) ---------- Politecnino di Bari, Italy ROMAN C., CIONTU F., COURTOIS B. Nanoscopic modeling of a carbon nanotube force-measuring biosensors Molecular Simulations Journal, Taylor & Francis Publisher, Vol.31, No.2-3, 123 - 133 , 15 February – 15 March 2005 2006 COURTOIS B., MARKUS K.* et al., Editors Proceedings of Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2006), Stresa, Italy, 26-28 April 2006 COURTOIS B., RENCZ M., LASANCE C., SZEKELY V.*, Editors Proceedings of 12thInternational Workshop on THERmal Investigations of ICs and Systems (THERMINIC’06), Nice, Côte d'Azur, France, September 27-29, 2006 ---------- MicRed Microelectronics Res & Dev Ltd., Hungary; Philips, The Netherlands; * Budapest University of Technology and Economics, Hungary SHAKOURI A., KANG S.M., BAR-COHEN A.*, COURTOIS B., Guest Editors Scanning the Special Issue on On-Chip thermal engineering Proceedings of the IEEE, Vol.94, No.8, pp. 1-3, August 2006 ---------- University of California Santa Cruz, USA; ** University of Maryland, College Park, USA COURTOIS B., MICHEL B., Editorial Special Issue on the Symposium on Design, Test, Integration of MEMS/MOEMS (DTIP’05) Research Journal on Microsystem Technologies, Springer Publishers, Vol. 12, Nos 10-11, September 2006 ---------- IZM, Berlin, Germany COURTOIS B., Guest Editor Special Issue on selected papers on Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2005) An International Journal on Analogue Integrated Circuits and Signal Processing 2007 COURTOIS B., KARAM J.M., Editors Proceedings of Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2007), Stresa, Italy, 25--27 April 2007 ---------- MEMSCAP, Crolles, France GALY N., CHARLOT B., COURTOIS B. A full fingerprint verification system for a single-line sweep sensor IEEE Sensors, vol.7, n°7, July 2007 SZEKELY V., RENCZ M., COURTOIS B. Die attach quality testing structure function evaluation Book chapter 23 in Micro- and opto-electronic materials and structures: Physics, mechanics, design, reliability, packaging, by E. Suhir, Y.C Lee, C.P. Wong (Editors), Springer, Vol. I, pp.629-650, 2007 ---------- Budapest University of Technology and Economics, Hungary; ** MicRed Microelectronics Res & Dev Ltd.,Hungary COURTOIS B., RENCZ M., LASANCE C., SZEKELY V.*, Editors Proceedings of 13thInternational Workshop on THERmal Investigations of ICs and Systems (THERMINIC’07), Budapest, Hungary, September 17-19, 2007 ---------- MicRed Microelectronics Res & Dev Ltd., Hungary; Philips, The Netherlands; * Budapest University of Technology and Economics, Hungary COURTOIS B. Proceedings of ENS 2007, Paris, 3-4 December 2007 COURTOIS B., MICHEL B., Editorial Special Issue on the Symposium on Design, Test, Integration of MEMS/MOEMS (DTIP’06) Research Journal on Microsystem Technologies, Springer Publishers, October 2007 ---------- IZM, Berlin, Germany COURTOIS B., Guest Editor Special Issue on selected papers on Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2006) An International Journal on Analogue Integrated Circuits and Signal Processing 2008 BRIGHT V., BOUROUINA T., COURTOIS B., DESMULLIEZ M., KARAM J.M., WANG G.J. Proceedings of Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2008), Nice, 9-11 April 2008 COURTOIS B., RENCZ M., LASANCE C., SZEKELY V.*, Editors Proceedings of 13thInternational Workshop on THERmal Investigations of ICs and Systems (THERMINIC’08), Rome, Italy, September 24-26, 2008 ---------- MicRed Microelectronics Res & Dev Ltd., Hungary; Philips, The Netherlands; * Budapest University of Technology and Economics, Hungary COURTOIS B., Guest Editor Special Issue ENS 2006, Microelectronics Journal 39 (2008) C) CONFERENCES AND WORKSHOPS, 1982-2008 1982 COURTOIS B. Performance modeling of partially self-checking systems 12th Fault Tolerant Computing Symposium, Santa Monica, June 1982, USA MARCHAL P., COURTOIS B. On detecting the hardware failures disrupting programs in microprocessors 12th Fault Tolerant Computing Symposium, Santa Monica, June 1982, USA COURTOIS B., EYNARD J. P., MARCHAL P., POSTIGO C. Test en-ligne et hors-ligne : classification et résultats récents 3ème Colloque International sur la Fiabilité et la Mayntenabilité, Toulouse, Octobre 1982 COURTOIS B., MARCHAL P., NICOLAIDIS M. Design of testable microprocessors Test Technology Newsletter, 1982 COURTOIS B. Test generation for microprocessors Invited paper, 5th Fault Tolerant Systems and Diagnostics, Katowice, Pologne, September 1982 - Reporté à Février 1983 BEN ROMDHANE M., COURTOIS B. Error confinement/data recovery in distributed systems 2nd Symposium on reliability in distributed software and data base systems Pittsburgh, July 1982, USA BAILLE G., COURTOIS B., LAURENT J. Analyse de défaillances par microscopie électronique International Conf. on quality of electronic devices : Strategy for the next years, Bordeaux, France, Octobre 1982 COURTOIS B. Failure analysis using SEM Invited paper at 2nd Symposium on Microelectronics, Sao Paulo, Brésil, July 27/29 1982 1983 COURTOIS B. E-beam testing of integrated circuits Workshop on design for testability, Vail Colorado, Avril 1983, USA COURTOIS B. Built in self test during the life cycle of integrated circuits Built In Self Test Workshop, Kiawah Island, March 15-16 1983 USA RUBAT DU MERAC C., JUTIER P., LAURENT J., COURTOIS B. (En coopération avec le CICG et l'INSERM) A new doMayn for image analysis : VLSI circuit testing, with ROMUALD, specialized in parallel image processing British Pattern Recognition Association, Oxford, Sept. 19-21 1983 GB Pattern Rcognition Letters 1/5-6:347-57 BERGER SABBATEL G., COURTOIS B. E-beam testing strategies for VLSI European Conference on circuit theory and design 1983, Stuttgart September 5-9 1983, FRG COURTOIS B. E-beam testing of integrated circuits Workshop on design for testability, Vail, Colorado, Avril 1983, USA BAILLE G., COURTOIS B., RUBAT DU MERAC C. Inspection automatique de circuits intégrés INOVA 83, Avril 1983, Paris BAILLE G., BERGHER L., COURTOIS B., LAURENT J., RUBAT DU MERAC C. Testing for failure analysis : new tools and new test methods 13th Fault Tolerant Computing Symposium Milano June 1983 MARCHAL P., COURTOIS B., NICOLAIDIS M. Low level fault modeling and design consequences VLSI Test Workshop, Munich, March 1983 BAILLE G., COURTOIS B., LAURENT J. E-beam test methodologies for VLSI IFIP VLSI Test Workshop, Munich, March 1983 JANSCH I., COURTOIS B. Design of checkers based on analytical fault hypotheses 3ème Symposium on Microelectronics. Sao Paulo, Brazil, July 1983 COURTOIS B. Testing integrated circuits Invited paper, Journées Conception logique, Barcelone, Spain, December 1983 BAILLE G., COURTOIS B., LAURENT J., RUBAT DU MERAC C. Prospective of methodologies for microprocessors and memories failure analysis Journées d'électronique : test des circuits intégrés, Lausanne, October 83 1984 COURTOIS B. Methodology for the use of an electron beam tester of integrated circuits. Invited paper Int. Symp. on circuits and Systems, Montréal, Canada, May 1984 BERGHER L., LAURENT J., RUBAT DU MERAC C., COURTOIS B. Inspection automatique et test MEB de circuits intégrés Congrés Fiabilité et Mayntenabilité, Peros-Guirec, May 1984 NICOLAIDIS M., COURTOIS B. Design of self-checking N-MOS (H-MOS) integrated circuits NATO Avionics panel symposium, Bruxelles, May 1984 BERGHER L., LAURENT J., RUBAT DU MERAC C., COURTOIS B. Inspection Automatique et test MEB de circuits intégrés Congrès Fiabilité et Mayntenabilité, Peros-Guirec, May 1984 COURTOIS B. Advances in test pattern generation for integrated circuits, ATE 84, Paris, December 1984 RUBAT DU MERAC C., BAILLE G., COURTOIS B. Inspection automatique de la qualité des circuits intégrés Colloque qualité des composants électroniques, Bordeaux, March 1984 COURTOIS B. Design of NMOS self-checking systems. Workshop on Design for Testability, Vail, USA, April 1984 JANSCH I., COURTOIS B. On the design of checkers based on analytical fault hypotheses ESSIRC 1984 – Edinburgh, UK, August 1984 NICOLAIDIS M., JANSCH I., COURTOIS B. Strongly code disjoint checkers 14th Fault-Tolerant-Computing Symposium – Orlando, USA, June 1984 COURTOIS B. CAD needs with respect to fault medeling Euromicro 1984, Coppenhaguen, DK, September 1984 SAHAMI H., COURTOIS B. Functional vs. analytical test of RAMs 2nd conference on Fault Tolerant Systems, Bonn – RFA, September 1984 1985 NICOLAIDIS M., COURTOIS B. Design of self-checking systems based on analytical fault hypotheses VLSI 1985, Academic Press, Tokyo, Japan., August 1985 JANSCH I., COURTOIS B. Strongly Language Disjoint checkers 15th Fault Tolerant Computing Symposium. Ann Arbor, Michigan, USA, .June 1985 COURTOIS B. Les circuits intégrés sont ils testables ? Convention Informatique, Paris, September 1985 NICOLAIDIS M., COURTOIS B. Layout rules for the design of self-checking circuits VLSI 85, Tokyo, Japan, August 1985 JERRAYA A., ROUGEAUX F.R., ROSIER E., COURTOIS B. A hierarchical symbolic layout tool STYX VLSI 85, Tokyo, Japan, August 1985 JERRAYA A., GUIGUET I., JAMIER R., ROUGEAUX F.R., COURTOIS B. An environnement for automatic design and validation of large integrated circuits. Journées sur : Technologie et conception des circuits intégrés au silicium, Barcelone-Spain, December 1985 1986 OSSEIRAN A. NICOLAIDIS M., SHCOELLKOPF J.P., COURTOIS B, LE TRUNG B., BIED CHARRETON D. Design of a self-checking microprocessor for real-time application in transportation systems. 5th IFAC/ IFIP/ IFORS, Vienna - Austria, July 1986 ---------- * Institut de Recherche des Transports JERRAYA A., VARINOT P., JAMIER R., COURTOIS B. SYCO : A silicon compiler for VLSI circuits described by algorithms. Physical Design 1986, Houston, Texas, USA, March 1986 JERRAYA A., VARINOT P., JAMIER R., COURTOIS B. Principles of the SYCO compiler This report will appear in Design Automation Conference, Las Vegas, June 1986 NICOLAIDIS M., COURTOIS B. Design of NMOS Strongly Fault Secure Circuits using unidirectional errors detecting codes This report will appear in Fault Tolerant Computing Symposium 16, Vienna, July 1986 BASCHIERA D., COURTOIS B. Advances in fault modeling and test pattern generation for CMOS This report will appear in International Conference on Computer Design, New York, October 1986 BERGHER L., LAURENT J., COLLIN J. P., COURTOIS B. Towards automatic analysis of complex ICs through e-beam testing This report will appear in International Test Conference, Washington USA, September 1986 ---------- IBM France FUENTES A., DAVID R., COURTOIS B. Random testing versus deterministic testing of RAMs This report will appear in Fault Tolerant Computing Symposium 16, Vienna, July 1986 ---------- Laboratoire d'Automatique de Grenoble NICOLAIDIS M., COURTOIS B. Self-Checking Circuits : from the theory to Practice This report will appear in SAFECOMP'86, Sarlat, France, 14-17 October 1986 JERRAYA A., VARINOT P., JAMIER R., COURTOIS B. SYCO a silicon compiler for VLSI circuits described by algorithms Physical Design Workshop, Houston Texas, USA, March 1986 REIS R., JERRAYA A., COURTOIS B. A microprocessor design using the SYCO COMPILER Workshop Italy, May 1986 ---------- PGCC/UFRGS Porto Alegre BRAZIL BASCHIERA D., COURTOIS B. BIST for CMOS Built In Self Test Workshop , Kiawah Island, Charleston, USA, March 1986 1987 OSSEIRAN A., NICOLAIDIS M., COURTOIS B, LE TRUNG B., BIED CHARRETOND. Microprocesseurs à contrôle incorporé Colloque sur les Transports terrestres : automatismes, communication, systèmes, Paris, 3 – 5 February 1987 --------------- * Institut National de Recherche sur les Transports et leur Sécurité BERGHER L., GUIGUET I., MARZOUKI M., COURTOIS B. Electron-beam testing : failure analysis and debug of integrated circuits New directions for IC testing, Winnipeg, Canada, April 8 – 10 1987 ---------------- THOMSON EFCIS Grenoble, France JERRAYA A., MHAYA N., COURTOIS B. About Controlling SILICON Compiler Output Presented at the International Workshop on Logic Synthesis Research Triangle Park, North Carolina, USA, May 12 - 15, 1987 MICOLLET D., COURTOIS B. Electron beam sensitive devices design methods Presented at the ESSIRC 87, Bad Soden, FRG, September 1987 GUIGUET I., MARZOUKI M., COURTOIS B. An integrated debugging system based on e-beam test 1st European Conference on Electron and Optical beam testing of integrated circuits, Grenoble, France, December 9-11, 1987 SAVART D., COURTOIS B. Automatic failure analysis of VLSI circuits using e-beam 1st European Conference on Electron and Optical beam testing of integrated circuits, Grenoble, France, December 9-11, 1987 MICOLLET D., COURTOIS B. Design methods of electron beam sensitive devices in NMOS and CMOS technologies 1st European Conference on Electron and Optical beam testing of integrated circuits, Grenoble, France, December 9-11, 1987 COLLIN J.P., COURTOIS B. Device testing and SEM testing tools Presented at the Nato ASI on testing and diagnosis of VSLI and ULSI, Como, Italy, June-July 1987 ------------- IBM Compec, Bordeaux JERRAYA A., COURTOIS B. Architecture experimentation with SYCO Presented at the Advanced summer course on logic synthesis and silicon compilation for VLSI design, L'Aquila, Italy, July 13-18, 1987 NICOLAIDIS M., COURTOIS B. Systèmes autotestables : théorie et pratique Présenté au séminaire Tuniso-français d'Informatique, Tunis, 27-29 avril 1987 COCITO M., MELGARA M., PROCTOR G., VERNAY Y.J., BOLAND F.**, COURTOIS B. ADVICE : Automatic Design Validation of Integrated Circuits using E-Beam Presented at Esprit Conference, Brussels, Belgium, September 1987 ---------- C.S.E.L.T., Torino, Italy; B.T.R.L., Ipswich, UK; * C.N.E.T., Meylan, France ; **** Trinity College, Dublin, Ireland. 1988 JERRAYA A., BONDONO Ph., GERONIMI J.P., HORNIK A., COURTOIS B. Nautile : a physical design environment based on a object oriented data manager Presented at the Annual IEEE Design Automation Workshop, Apache Junction, USA, January 13-15, 1988 TORKI K., NICOLAIDIS M., JERRAYA A.A., COURTOIS B. UBIST version of the SYCO's control section compiler IEEE International Conference on Computer Design, Rye Brook, New York, USA, October 3-5, 1988 CAISSO J.P., COURTOIS B. Fault simulation and test pattern generation at the multiple-valued switch level International Test Conference, Washington, USA, September 12-14, 1988 MARZOUKI M., COURTOIS B. PESTICIDE : a Prolog-written Expert System as a Tool for Integrated Circuits Debugging Sixth European Workshop on Design For Testability, Garderen, The Netherlands, June 13-16, 1988 CAISSO J.P., COURTOIS B. Fault simulation and test pattern generation at the multiple-valued switch level IEEE Workshop on Design for Testability, Vail, Colorado, USA, April 19-22, 1988 MARZOUKI M., COURTOIS B. Debugging integrated circuits : a knowledge-based approach Presented at 11th Fault-Tolerant Systems and Diagnostics, Suhl, German Democratic Republic, June 6-9, 1988 MARZOUKI M., LAURENT J., COURTOIS B. Testing integrated circuits from an ergonomic point of view : the expert system PESTICIDE Presented at AFCET Conference "ERGO-IA", Biarritz, October 4-6, 1988 1989 CABESTANY MONCUSI J., LAURENT J., CONARD D., COURTOIS B. Technis per l’analisi del funcionament de circuits integrats emprant microscopia electronica Trobades Cientifiques de la Mediterranea Microelectronica, Menorca, Spain, September 1989 COLLIN J.P., CONARD D., COURTOIS B., DENIS P., SAVART D. Failure analysis using E-beam Invited paper at 2nd European Conference on Electron and Optical Beam Testing of Integrated Circuits, Duisburg, FRG, October 1-4, 1989 ---------- * IBM COMPEC 6 CESTAS, France CONARD D., COURTOIS B. Automatic failure analysis on VLSI circuits by electron beam test 4th International Conference on Quality in electronic components, Bordeaux, France, April 25-28, 1989 CONARD D., COURTOIS B. Failure analysis using E-beam : a fully automatic process Invited paper at 2nd European Conference on Electron and Optical Beam Testing of Integraed Circuits Duisburg, FRG, October 2-4, 1989 DARLAY F., COURTOIS B. A BIST device for CMOS circuits Built-in-Self-Test Workshop, Charleston, USA, March 29-31, 1989 DARLAY F., COURTOIS B. Test and design for testability of reconvergent fan-out CMOS logic networks International Test Conference 1989, Washington, USA, August 29-31, 1989 DARLAY F., COURTOIS B. Definition & evaluation of a test pattern generator for CMOS circuits 1st European Workshop on Dependable Computing (EWDC-1), Toulouse, France, March 1-3, 1989 DARLAY F., COURTOIS B. Test sequence generation for built-in-self-test of CMOS circuits 12th Fault Tolerant Systems and Diagnostics Conference (FTSD-12), Prague, Tchecoslovaquia, September 4-7, 1989 JERRAYA A.A., COURTOIS B. Architecture experimentation with the behavioral silicon compiler SYCO Invited paper at MELECON’89, Lisbon, Portugal, April 11-13, 1989 MARZOUKI M., COURTOIS B. Debugging integrated circuits : A.I. can help ! European Test Conference, Paris, France, April 12-14, 1989 MARZOUKI M., LAURENT J., COURTOIS B. A unified use of deep and shallow knowledge in an expert system for prototype validation of integrated Circuits 9th Workshop on Expert Systems and their applications, specialized Conference on 2nd generation of Expert Systems, Avignon, France, May 29-June 2, 1989 NICOLAIDIS M., COURTOIS B. Basic structure for the control of critical systems 1st European Workshop on Dependable Computing (EWDC-1), Toulouse, France, March 1-3, 1989 NICOLAIDIS M., NORAZ S., COURTOIS B. Generalized fail-safe systems Fault Tolerant Computing Symposium, Chicago, USA, June 21-23, 1989 NICOLAIDIS M., NORAZ S., COURTOIS B. Design of critical systems 12th Annual IEEE Design for Testability Workshop, Vail, Colorado, USA, April 18-21, 1989 NICOLAIDIS M., COURTOIS B. Self-checking circuits : a tutorial Invited paper at 12th Fault Tolerant Systems and diagnostics Conference (FTSD-12), Prague, Tchecoslovaquia, September 4-7, 1989 NORAZ S., NICOLAIDIS M., COURTOIS B. VLSI implementation for control of critical systems IFAC/IFIP SAFECOMP 1989, Vienna, Austria, December 5-7, 1989 1990 BONDONO P., BONIFAS D., HORNIK A., JERRAYA A., COURTOIS B. NAUTILE : a safe environment for silicon compilation European Design Automation Conference (EDAC 90), Glasgow, Scotland, March 1990 ---------- IBM Corbeil BONDONO P., BONIFAS D., HORNIK A., JERRAYA A., COURTOIS B. NAUTILE : an open physical design environment based on an object oriented data manager 3rd International Workshop on VLSI Design, Bangalore, January 8-9, 1990 ---------- IBM Corbeil CHAUMONTET G , GUYOT A., NICOLAIDIS M., CASTRO ALVES V., COURTOIS B. Description d’un micro-automate programmable de sécurité (MAPS) à l’usage de la signalisation ferroviaire 7th International Conference on Reliability and Maintainability, Brest, France, June 18-22, 1990 CHAUMONTET G , CASTRO ALVES V., NICOLAIDIS M., GUYOT A., COURTOIS B. MAPS : a safety microcontroller dedicatd to the railway control 13th International Conference on Fault-Tolerant Systems & Diagnostics, Varna, Bulgaria, June 20-22, 1990 CHAUMONTET G , CASTRO ALVES V., NICOLAIDIS M., GUYOT A., COURTOIS B. A fail-safe microcontroller for railway signalling 16th European Solid State Circuits Conference (ESSCIRC 90), Grenoble, France, September 19-21, 1990 CONARD D., LAURENT J., MARZOUKI M., COURTOIS B. High level tools and methods for electron-beam debug and failure analysis of integrated circuits Seminar on Integrated Measurement Systems, Budapest, Hungary, July 2-4, 1990 COURTOIS B., DELORI H., GUYOT A., PAILLOTIN J.F. The French Multi-Projects Circuits Service : CMP International Conference on Microelectronics (ICM 90), Dams, Syria, October 13-17, 1990 COURTOIS B. New trends in testing integrated circuits Invited presentation at Seminario « Microelectronica : Diseno y Test de Circuitos Integrados Digitales », Sevilla, Spain, October 8-11, 1990 DARLAY D., COURTOIS B. Robust tests for stuck-open faults and design for testability of reconvergent fan-out CMOS logic networks European Design Automation Conference (EDAC 90), Glasgow, Scotland, 12-15 March, 1990 NICOLAIDIS M., COURTOIS B. Design of testable ASICs IFIF Workshop on Design & Test of ASICs, Hiroshima, Japan, June 11-12, 1990 O’BRIEN K., PARK I., COURTOIS B. et al. Novel architecture design methodologies and systhesis strategies for future ASIC design Invited paper at Norsile 90 Conference, Lund, Sweden, October 1990 SKAF A., AIT-MESSAOUD H., LAURENT J., GUYOT A., COURTOIS B. A contribution to the study of the MHS 80C86 microprocessor in an hostile environment International Conference on Microelectronics (ICM 90), Damas, Syria, October 13-17, 1990 1991 CASTRO ALVES V., NICOLAIDIS M., LESTRAT P., COURTOIS B. Test algorithms for multi-port RAMs 14th Annual IEEE Workshop on Design For Testability (DFT), Vail, USA, April 16-19, 1991 ---------- THOMSON Composants Militaires et Spatiaux, Saint-Egrève, France CASTRO ALVES V., NICOLAIDIS M., LESTRAT P., COURTOIS B. Built-In Self-Test for multi-port memories IEEE International Conference on Computer-Aided Design (ICCAD), Santa Clara, USA, November 10-13, 1991 ---------- THOMSON Composants Militaires et Spatiaux, Saint-Egrève, France CHAGOYA A., COURTOIS B., DELORI H., GUYOT A., PAILLOTIN J.F., TORKI K. The French Multi-Projects Circuits Service : CMP APK’91, Design Automation Conference, Kaunas, Lithuania, USSR, June 3-8, 1991 CONARD D., RUSSELL J.D., LAURENT J., SKAF A., COURTOIS B. "Multiple adjacent image processing" for automated failure location using electron beam testing Invited Paper at Relectronic'91 Conference, Budapest, Hungary, August 26-30, 1991 CONARD D., COURTOIS B., LAURENT J., MARZOUKI M. High level tools and methods for electron-beam testing Invited paper at "IV Simposio de Computadores Tolerantes a Falhas", Gramado (RS), Brazil, October 2-4, 1991 COURTOIS B., DELORI H., GUYOT A., PAILLOTIN J.F., TORKI K. The French Multi-Projects Circuits Service : CMP Invited paper at VI SBMICRO Congress, Belo Horizonte, Brazil, July 15-19, 1991 COURTOIS B., NICOLAIDIS M. Design of self-checking systems Tutorial course and invited paper presented at VI SBMICRO Congress, Belo Horizonte, Brazil, July 15-19, 1991 COURTOIS B., DELORI H., GUYOT A., PAILLOTIN J.F., TORKI K. The CMP Service for chip fabrication Invited paper presented at the International Conference on Microelectronics (ICM’91) Cairo, Egypt, December 21-23, 1991 COURTOIS B. The Multi-Projects Circuits Service : CMP Invited paper presented at "Seminario de Microelectronica", Montevideo, Uruguay, September 23-24, 1991 COURTOIS B., NICOLAIDIS M. Design of self-checking systems : theory and practise International Conference on Microelectronics (ICM’91), Cairo, Egypt, December 21-23, 1991 COURTOIS B. NICOLAIDIS M., LUBASZEWSKI M. Design of Self-Checking Integrated Circuits and Boards 2nd International Conference on VLSI and CAD (ICVC), Seoul, Korea, October 1991 GLESNER M., CATTHOOR F., COURTOIS B., WEHN N. Novel ASIC Architecture and Synthesis Methodologies for Future Multiplex Data-path Design Invited paper at COMPEURO 91, Bologna, Italy, May 13-16, 1991 LUBASZEWSKI M., COURTOIS B. B2UBIST: a strategy for Boundary Scan Board Unified BIST 5th Technical Workshop on New Directions for IC Testing, Ottawa, Canada, August 1-2, 1991 MARZOUKI M., LAURENT J., COURTOIS B. Coupling electron-beam probing with knowledge-based fault localization 22nd IEEE International Test Conference (ITC), Nashville, USA, October 28 - November 1, 1991 NICOLAIDIS M., COURTOIS B. Design of ICs for on-line and off-line testing Invited paper presented at "Testmethoden und Zuverlässigkeit von Schaltungen und Systemen" Workshop Blomberg, Germany, March 18-19, 1991 O’BRIEN K., PARK I., JERRAYA A., COURTOIS B. Modelling Communicating Processes for the Synthesis of Control-Dominated Machines Poster presented at EuroVHDL 91 Conference, Stockholm, Sweden, September 8-11, 1991 O’BRIEN K., PARK I., JERRAYA A., COURTOIS B. Automatic modelling of bus protocols for the synthesis of reactive systems APK’91, Design Automation Conference, Kaunas, Lithuania, ex USSR, June 3-8, 1991 PARK I., O'BRIEN K., JERRAYA A.A., COURTOIS B. A new algorithm for the allocation of functional units and connections onto multiplexed datapaths ICVC'91 Conference, Seoul, Korea, October 1991 SKAF A., RUSSELL J.D., COURTOIS B. Automated E-beam testing using "multiple adjacent image processing" 1991 International Conference on Microelectronics (ICM'91), Cairo, Egypt, December 21-23, 1991 1992 CASTRO ALVES V., LUBASZEWSKI M., NICOLAIDIS M., COURTOIS B. Testing embedded single and multi-port RAMs using BIST and boundary scan European Conference on Design Automation (EDAC 92), Brussels, Belgium, March 16-19, 1992 COURTOIS B., NICOLAIDIS M., LUBASZEWSKI M. Design of Self-Checking and Fail-Safe Integrated Circuits 1992 IEICE Spring Conference, Chiba, Japan, March 24-27, 1992 COURTOIS B., DELORI H., PAILLOTIN J.F., TORKI K., MARTIN F. An infrastructure for VLSI design education and research 1992 IEICE Spring Conference, Chiba, Japan, March 24-27, 1992 COURTOIS B. The French Multi-Projects Circuits Service: CMP Plenary paper presented at 5th International Conference on VLSI Design, Bangalore, India, January 4-7, 1992 COURTOIS B. Self-checking circuits Invited paper presented at XXIV Riunione Annuale CCTE'92, Taormina, Italy, 21-24 June 1992 COURTOIS B. Failure analysis of integrated circuits using electron-beam 6th Workshop on New Direction for Testing, Montreal, Canada, May 21-22, 1992 COURTOIS B. The French CMP Service and other MPC Services worldwide Asia-Pacific Conference on Circuits and Systems 1992 (APCCAS'92), Sydney, Australia, December 8-11, 1992 COURTOIS B. Design of self-checking and fail-safe integrated circuits and systems Opening Conference at "DCIS'92 : VII Congreso de Diseño de Circuitos Integrados", Toledo, Spain, November 3-5, 1992 HELLEBRAND S. TARNICK S., RAJSKI J*, B. COURTOIS Generation of vector patterns through reseeding of multiple-polynomial LFSRs 6th Workshop on New Direction for Testing, Montreal, Canada, May 21-22, 1992 --------- Now with Gesamthochschule, University of Siegen, Germany Now with Max-Planck-Society, Fault Tolerant Computing Group, Berlin, Germany * On sabbatical leave from McGill University, Montreal, Canada HELLEBRAND S. TARNICK S., RAJSKI J*, B. COURTOIS Generation of vector patterns through reseeding of multiple-polynomial linear feedback shift registers IEEE International Test Conference (ITC), Baltimore, Maryland, USA, 20-24 September, 1992 --------- Now with Gesamthochschule, University of Siegen, Germany Now with Max-Planck-Society, Fault Tolerant Computing Group, Berlin, Germany * On sabbatical leave from McGill University, Montreal, Canada JERRAYA A., O'BRIEN K., PARK I., COURTOIS B. Towards sytem level modeling and synthesis 5th International Conference on VLSI Design, Bangalore, India, January 4-7, 1992 LUBASZEWSKI M., COURTOIS B. On the design of self-checking boundary scannable boards International Test Conference (ITC), Baltimore, Maryland, USA, September 20-24, 1992 LUBASZEWSKI M., COURTOIS B. On the design of self-checking boundary scannable boards 15th IEEE International Workshop on Design For Testability (DFT), Vail, Co, USA, April 21-24, 1992 LUBASZEWSKI M., MARZOUKI M., COURTOIS B. Reusing a circuit debugging knowledge-based tool to diagnose boards with partial boundary scan 1st International Systems Test and Diagnosis Workshop, Freiburg, Germany, November 9-12, 1992 O'BRIEN K., PARK I., JERRAYA A., COURTOIS B. Communication modelling for the system-level synthesis of mixed hardware/software designs European Conference on Design Automation (EDAC 92), Brussels, Belgium, March 16-19, 1992 1993 COURTOIS B. CAD and testing of ICs and Systems: Where are we going ? Invited presentation at the 2nd ESA Electronics Components Conference at ESTEC Noordwijk, The Netherlands, 24-28 May 1993 COURTOIS B. The state of the art in CAD Invited presentation at the Workshop on Computer Aided Methods and Technical Management in Electrical Engineering Education, Budapest, Hungary, 16-18 June 1993 COURTOIS B. Trends in fabrication, design and CAD - European perspectives 3rd International Conference on VLSI and CAD (ICVC'93), Taejon, Korea, 15-17 November 1993 COURTOIS B. Perspectives in IC CAD and test 5th International Symposium on IC Technology, Systems & Applications (ISIC 93) Singapore, 15-17 September 1993 COURTOIS B. Future trends for the design and test of microelectronic systems Invited talk at "25 Jahre UNI DO", Symposium organized to celebrate the 25 years of Dortmund University, Dortmund, Germany, 16 December 1993 KOLARIK V., LUBASZEWSKI M., COURTOIS B. Towards self-checking mixed-signal integrated circuits 19th European Solid-State Circuits Conference (ESSCIRC'93), Sevilla, Spain, September 22-24, 1993 LUBASZEWSKI M., CASTRO ALVES V., NICOLAIDIS M., COURTOIS B. Checking signatures on boundary scan boards European Test Conference, Rotterdam, NL, April 19-22, 1993 LUBASZEWSKI M., COURTOIS B. Designing fault-tolerant systems by using self-checking replicas Built-In Self-Test / Design for Testability Workshop (BIST/DFT) Kiawah Island, Charleston, SC, USA, March 17-19, 1993 LUBASZEWSKI M., COURTOIS B. Reliable fail-safe systems 2nd Asian Test Symposium (ATS 93), Beijing, China, 16-18 November 1993 NICOLAIDIS M., VARGAS F., COURTOIS B. Design of reliable current sensors for radiation exposed environments 30th Annual International Nuclear and Space Radiation Effects Conference (NSREC'93) Snowbird, Utah, USA, July 19-23, 1993 VARGAS F., NICOLAIDIS M., COURTOIS B. Quiescent current monitoring to improve the reliability of electronic systems in space radiation environments 1993 International Conference on Computer Design (ICCD'93), Cambridge, Massachusetts, USA, 3-6 October 1993 1994 COURTOIS B. Some trends in CAD, test and fabrication of circuits and systems Keynote presentation at Third International Workshop on The Economics of Design, Test and Manufacturing Austin, Texas, USA, 16-17 May 1994 COURTOIS B. Perspectives in CAD, test and manufacturing of circuits and systems Keynote presentation at Second Asia Pacific Conference on Hardware Description Languages (APCHDL(94), Toyohashi, Japan, 24-25 October 1994 COURTOIS B. The CMP Service XXI International Conference and School for young scientists and professionals within the framework of "Informatization of Russia Program" ; New information technologies for science, education and business (CAD'94), Yalta, Ukraine, 4-13 May 1994 COURTOIS B., RENCZ M.* Trends in fabrication, design and CAD - European perspectives XXI International Conference and School for young scientists and professionals within the framework of "Informatization of Russia Program" ; New information technologies for science, education and business (CAD'94) Yalta, Ukraine, 4-13 May 1994 ---------- * Technical University of Budapest, Hungary COURTOIS B. The Services available from CMP Invited paper at IX SBMICRO, Rio de Janeiro, Brazil, 10-12 August 1994 COURTOIS B. MPC Services available worldwide Invited talk at IEEE Asia-Pacific Conference on Circuits and Systems (APCCAS'94) Taipei, Taiwan, 5-8 December 1994 HOFMANN K., KARAM J.M., GLESNER M., COURTOIS B. Entwurf und Simulation von Mikrosystemen Gründungssitzung der G1-Fachgruppe 3.5.6 Mikrosystemtechnik, Schloss Dagstuhl, Dagstuhl, Germany, 21-22 November 1994 ---------- * TH Darmstadt, FG Mikroelektronische Systeme, Germany KOLARIK V., LUBASZEWSKI M., COURTOIS B. Designing self-exercising analogue checkers VLSI Test Symposium '94, Cherry Hill, N.J., USA, April 25-28, 1994 LUBASZEWSKI M., KOLARIK V., MIR. S., COURTOIS B. Self-checking analogue and mixed-signal fully differential circuits Design For Testability / Built-In Self-Test Workshop (DFT/BIST), Vail, Colorado, USA, April 19-22, 1994 LUBASZEWSKI M., COURTOIS B. On-line&off-line, analogue&digital, circuit&board, safety&reliability : how to solve the testing puzzle ? IEEE Asia-Pacific Conference on Circuits and Systems (APCCAS'94), Taipei, Taiwan, December 5-8, 1994 MARZOUKI M., COURTOIS B., CASTRO ALVES V.* High-level synthesis for testability: where should we go from ? 1st International Test Synthesis Workshop, Santa Barbara, California, USA, May 18-20, 1994 -------- * University of Aveiro, Portugal MIR S., KOLARIK V., LUBASZEWSKI M., NIELSEN C., COURTOIS B. Built-in self-test and fault diagnosis of fully differential analogue circuits International Conference on Computer Aided Design (ICCAD'94), San Jose, California, USA, November 6-10, 1994 1995 COURTOIS B. Trends and perspectives in integrated circuits and systems Invited paper at 4th International Conference on VLSI and CAD (ICVC'95), Seoul, Korea, 15-18 October 1995 COURTOIS B., LUBASZEWSKI M. On-line and off-line testing: from digital to analog, from circuits to boards Invited paper at European Solid-State Circuits Conference (ESSCIRC'95), Lille, France, 19-21 September 1995 COURTOIS B., LUBASZEWSKI M. From digital to analog self-checking circuits Invited paper at Mixed Design of VLSI Circuits - Education of Computer Aided Design of Modern VLSI Circuits - (MixVLSI'95), Krakow, Poland, 29-31 May 1995 COURTOIS B. Trends and needs in testing integrated circuits and systems Invited talk at AT&T Conference on Electronic Testing (ACET'95), Princeton, NJ, USA, 24-25 April 1995 COURTOIS B., KARAM J.M., PARET J.M. Advances at CMP service : from microelectronics to microsystems Sixth International Symposium on IC Technology, Systems and Applications (ISIC'95) Singapore, 6-8 September 1995 COURTOIS B. Trends in CAD, test, manufacturing of ICs and systems Invited talk at X SBMICRO I IBERMICRO Conference, Gramado, Brazil, 31 July - 4 August 1995 DUMITRESCU M., KARAM J.M., COURTOIS B. Approximation choices for the numerical modeling of some optical guiding structures Physics and Simulation of Optoelectronic Devices Conference SPIE's Photonics West'95, San Jose, California, USA, 4-10 February 1995 ---------- "Politehnica" University, Bucharest, Romania HOFMANN K., KARAM J.M., MOLEAVIN V., NICULIU T., COURTOIS B., GLESNER M. Modelling and simulation of thermal effects on the system level International Workshop on Thermal Investigations of ICs and Microstructures Grenoble, France, 25-26 September 1995 ---------- * TH Darmstadt, Germany ** POLITECNICA Univ., Bucharest, Romania HOFMANN K., KARAM J.M., SCHULZE M., THEISEN M., COURTOIS B., GLESNER M. Automatische Übersetzung von FEM-Modellen in eine analoge Hardwarebe-schreibungssprache Mikrosystemtechnik & Mikroelektronik 95, Chemnitz, Germany, October 16-17, 1995 ---------- * TH Darmstadt, Germany LUBASZEWSKI M., KOLARIK V., MIR S., NIELSEN C., COURTOIS B. Mixed-signal circuits and boards for high safety applications European Design and Test Conference (EDAC-ETC-EUROASIC'95), Paris, France, 6-9 March 1995 ---------- Technical Univ. of Brno, Czech Republic MIR S., LUBASZEWSKI M., KOLARIK V., COURTOIS B. Optimal ATPG for analogue built-in self-test and fault diagnosis IEEE International Mixed-Signal Testing Workshop, Grenoble, France, 20-22 June 1995 ---------- Technical University of Brno, Czech Republic MIR S., LUBASZEWSKI M., KOLARIK V., COURTOIS B. Analogue on-line/off-line test unification for fully differential circuits IEEE International Mixed-Signal Testing Workshop, Grenoble, France, 20-22 June 1995 ---------- Technical University of Brno, Czech Republic MIR S., LUBASZEWSKI M., LIBERALLI V., COURTOIS B. Built-In Self-Test approaches for analogue and mixed-signal integrated circuits 38th IEEE Midwest Symposium on Circuits and Systems, Rio de Janeiro, Brazil, 13-16 August 1995 ---------- University of Pavia, Italy MIR S., LUBASZEWSKI M., KOLARIK V., COURTOIS B. Programmable self-checking analogue oscillators 1st IEEE International On-Line Testing Workshop, Nice, France, 4-6 July 1995 ---------- Technical University of Brno, Czech Republic PARET J.M., KARAM J.M., COURTOIS B. CAD tools for MEMs CAVE Workshop'95, Kenmare, Ireland, 3-6 December 1995 POPPE A., KARAM J.M., HOFMANN K., RENCZ M., COURTOIS B., GLESNER M.*, SZEKELY V. A general CAD concept and design framework architecture for integrated microsystems 1st International Conference on Microsystems and Microstructures (MICROSIM 95) Southampton, UK, 26-28 September 1995 ---------- * Technical University of Budapest, Hungary; ** Darmstadt University of Technology, Germany POPPE A., KARAM J.M., HOFMANN K., RENCZ M., COURTOIS B., GLESNER M.*, SZEKELY V. A CAD framework concept for the design of integrated microsystems Symposium on Micromachining and Microfabrication (SPIE'95), Austin, Texas, USA, 23-24 October 1995 ---------- * Technical University of Budapest, Hungary; ** Darmstadt University of Technology, Germany SAAB K., KAMINSKA B., LUBASZEWSKI M., COURTOIS B. Frequency-based BIST for analogue circuit testing 13th IEEE VLSI Test Symposium (VTS'95), Princeton, New Jersey, USA, 30 April - 3 May 1995 ---------- * Ecole Polytechnique de Montréal, Canada SZEKELY V., RENCZ M., COURTOIS B. Trends in thermal management of microcircuits NATO ARW: Future Trends in Microelectronics, Island of Bendor, France, 17-21 July, 1995 ---------- * Technical University of Budapest, Dept. of Electron Devices SZEKELY V., MARTA Cs., RENCZ M., BENEDEK Zs.,COURTOIS B. Design for Thermal Testability (DFTT) and a CMOS realization Ist THERMINIC Workshop, Grenoble, France, 25-26 September 1995 ---------- * Technical University of Budapest, Dept. of Electron Devices SZEKELY V., MARTA Cs., RENCZ M., COURTOIS B. A new approach: Design for Thermal Testability (DFTT) of MCMs 2nd Multi-Chip Module Test Advanced Technology Workshop, Napa Valley, California, USA, 10-13 September 1995 ---------- Technical University of Budapest, Dept. of Electron Devices TCHOUMATCHENKO V., VASSILEVA T., GUYOT A. Delay directed adders synthesis and optimisation European Conference on Circuit Theory and Design, Istambul, Turkey, 27-31 August 1995 ---------- * Technical University of Sofia, Bulgaria VINCI DOS SANTOS F., COURTOIS B. A design technique for compensation of MOS transistor total integrated dose degradation 1st Workshop on Electronics for LHC Experiments, Lisbon, Portugal, 11-15 September 1995 1996 COURTOIS B., KARAM J.M., PARET J.M Developments at CMP Service : from microelectronics to microsystems Invited paper at First European Workshop on Microelectronics Education Villard de Lans (Grenoble), France, 5-6 February 1996 COURTOIS B., SZEKELY V., RENCZ M. Thermal monitoring of memories IEEE International Workshop on Memory Technology, Design and Testing Singapore, 13-14 August 1996 ---------- * Technical University of Budapest, Hungary COURTOIS B., DELORI H., KARAM J.M., PAILLOTIN J.F., TORKI K. CMP Services: basic principles and developments 1996 International Conference on ASIC (ASICON'96), Shanghai, China, 21-24 October 1996 HOFMANN K., LANG M., KARAM J.M., GLESNER M., COURTOIS B. Generation of a behavioural model of an acceleration sensor from its finite-element-description MECHATRONICS'96, Besançon, France, 1-3 October 1996 ---------- TH Darmstadt, Institute of Microelectronic Systems, Germany KARAM J.M., COURTOIS B., BAUGE M. High level CAD melds microsystems with foundries European Design and Test Conference (EDAC-ETC-ASIC'96), Paris, France, 11-14 March 1996 KARAM J.M., COURTOIS B., HOFMANN K., POPPE A., RENCZ M., GLESNER M., SZEKELY V.** Microsystems modeling at system level 3rd Asia Pacific Conference on Hardware Description Languages (APCHDL'96), Bangalore, India, 8-10 January, 1996 ---------- * TH Darmstadt, Institute of Microelectronic Systems, Germany *Technical University of Budapest, Dept of Electron Devices, Hungary KARAM J.M., COURTOIS B., HOFMANN K., GLESNER M., POPPE A., RENCZ M., SZEKELY V.* Applied design and analysis of microsystems European Design and Test Conference (EDAC-ETC-ASIC'96), Paris, France, 11-14 March 1996 ---------- * TH Darmstadt, Institute of Microelectronic Systems, Germany *Technical University of Budapest, Dept of Electron Devices, Hungary KARAM J.M., COURTOIS B., PARET J.M., BOUTAMINE H. Low cost access to MST: Manufacturing techniques and related CAD tools MICRO SYSTEM Technologies 96 (MST'96), Potsdam, Germany, 17-19 September 1996 KARAM J.M., COURTOIS B., HOLJO M., LECLERCQ J.L.; VIKTOROVITCH P.* Collective fabrication of gallium arsenide based microsystems SPIE'96 Symposium on Micromachining and Microfabrication, Austin, Texas, USA, 14-15 October 1996 ---------- * LEAME, Ecole Centrale de Lyon, France KARAM J.M., COURTOIS B., RENCZ M., POPPE A., SZEKELY V.* Microsystem design framework based on tool adaptation and library developments SPIE'96 Symposium on Micromachining and Microfabrication, Austin, Texas, USA, 14-15 October 1996 ---------- * Technical University of Budapest, Dept. of Electron Devices, Hungary KARAM J.M., BOUTAMINE H., COURTOIS B., OUDINOT J., DRAKE P.* CAD of MEMS out to the industry SPIE'96 Symposium on Smart Materials, Structures and MEMS, Bangalore, India, 11-14 December 1996 ---------- * Mentor Graphics, Paris ; ** Mentor Graphics, UK KARAM J.M., COURTOIS B. Microsystem prototyping: from the idea to the foundry via a continuous design flow EUROSENSORS X, Leuven, Belgium, 8-11 September 1996 KARAM J.M., COURTOIS B. From the MEMS idea to the MEMS product: CAD and foundries WESCON'96, Anaheim, CA, USA, 22-24 October 1996 KARAM J.M., COURTOIS B., HOFMANN K., POPPE A., RENCZ M., GLESNER M., SZEKELY V.** CAD of MEMS: from the idea to the reality MECHATRONICS'96, Besançon, France, 1-3 October 1996 ---------- * TH Darmstadt, Institute of Microelectronic Systems, Germany; *Technical University of Budapest, Dept of Electron Devices, Hungary KARAM J.M., COURTOIS B., PARET J.M. Microelectronics compatible manufacturing techniques of microsystems MECHATRONICS'96, Besançon, France, 1-3 October 1996 KARAM J.M., BIANCHI R.A., VINCI DOS SANTOS F., COURTOIS B. Design and fabrication of an array of CMOS compatible IR sensors THERMINIC Workshop, Budapest, Hungary, 25-27 September 1996 KRIM N., COURTOIS B. OMI/EUROMIC Invited talk at European Microelectronic Partners Conference (EMPC'96), Vienna, Austria, 29 February - 1 March 1996 SZEKELY V., KOHARI Z., MARTA Cs., RENCZ M., COURTOIS B. Test structure for thermal monitoring International Conference on Microelectronics Test Structures (ICMTS'96), Trento, Italy, 25-28 March 1996 ---------- Technical University of Budapest, Dept. of Electron Devices SZEKELY V., RENCZ M., KARAM J.M., LUBASZEWSKI M., COURTOIS B. Thermal monitoring of self-checking systems 2nd International On-Line Testing Workshop, Saint Jean de Luz, France, 8-10 July 1996 ---------- * Technical University of Budapest, Dept. of Electron Devices SZEKELY V., RENCZ M., KARAM J.M., LUBASZEWSKI M., COURTOIS B. Thermal monitoring of safety-critical integrated systems 6th Asian Test Symposium (ATS'96), Hsinchu, Taiwan, 20-22 November 1996 ---------- * Technical University of Budapest, Dept. of Electron Devices SZEKELY V., RENCZ M., COURTOIS B. Thermal transient testing of the quality of encapsulation MCM Test Workshop'96, Napa Valley, USA, 15-18 September 1996 ---------- * Technical University of Budapest, Dept. of Electron Devices, Hungary SZEKELY V., RENCZ M., COURTOIS B. Thermal transient testing 29th International Symposium of Microelectronics (ISHM'96), Minneapolis, USA, 6-10 October 1996 ---------- * Technical University of Budapest, Dept. of Electron Devices, Hungary VINCI DOS SANTOS F., BIANCHI R.A., KARAM J.M., COURTOIS B. CMOS compatible IR sensors array Micromechanics Europe Conference (MME'96), Barcelona, Spain, 21-22 October 1996 1997 ABOU-SAMRA S.J., DUDEK V., AYACHE F., GUYOT A., COURTOIS B., HOEFFLINGER B. Designing With 3D SOI CMOS ECS’97 Symposium on SOI Technology and Devices, Paris, France, September 1997 ---------- * Institute for Microelectronics Stuttgart, Germany BIANCHI R.A., SANTOS F.V., KARAM J.M., COURTOIS B., PRESSECQ F., SIFFLET S.* CMOS compatible temperature sensor using lateral bipolar transistor for very wide temperature range applications 3rd International Workshop on Thermal Investigations of Ics and Microstructures (THERMINIC Workshop 97), Cannes, France, 21-23 September 1997 ---------- CNES, Toulouse, France ; TRS31, Auterive, France BOUTAMINE H., KARAM J.M., COURTOIS B., DRAKE P., OUDINOT J., EL TAHAWI H., CAO A., RENCZ M., POPPE A., SZEKELY V.* Engineering tool set for monolithic and hybrid microsystem design SPIE's Symposium on Micromachining and Microfabrication, Autin, Texas, USA, 29-30 September 1997 ---------- * Mentor Graphics; ** Technical University of Budapest, Hungary COURTOIS B. CAD tools and foundries to boost microsystems development Invited talk at Conference on Low Dimensional Structures and Devices (LDSD'97), Lisbon, 19-21 May 1997 COURTOIS B., KARAM J.M., LUBASZEWSKI M., SZEKELY V., RENCZ M., HOFMANN K., GLESNER M. CAD, test and manufacturing of microsystems Invited talk at 1st Electronic Circuits and Systems Conference (ECS'97), Bratislava, Slovakia, 4-5 September 1997 ---------- * Technical University of Budapest, Hungary; ** Darmstadt University of Technology, Germany COURTOIS B., SZEKELY V., RENCZ M., NAPIERALSKI A., KOVAL V., BELEZNAY F.*** Main goals and obtained results of the THERMINIC Project EUROTHERM'97, Nantes, 24-27 September 1997 ---------- * Technical University of Budapest, Hungary; Technical University of Lodz, Poland; * State Polytechnic of Lviv, Ukraine; **** SEMILAB, Hungary HOFMANN K, KARAM J.M., COURTOIS B., GLESNER M. Generation of HDL-A code for non linear behavioral models IEEE International Workshop on Behaviourial Modeling and Simulations (BMA’97) Washington DC, USA, 20-21 October 1997 ---------- * Darmstadt University of Technology, Germany HOFMANN K., GLESNER M., SEBE N., MANOLESCU A., MARCO S.*, SAMITIER J., KARAM J.M., COURTOIS B. Generation of the HDL-A-Model of a micromembrane from its finite-element-description 1997 European Design and Test Conference (ED&TC'97), Paris, France, 17-20 March 1997 ---------- Darmstadt University of Technology, Germany; "Politechnica" University Bucharest, Romania; * University of Barcelona, Spain KARAM J.M., COURTOIS B., BOUTAMINE H., DRAKE P., POPPE A., SZEKELY V., RENCZ M., HOFMANN K., GLESNER M.* CAD and foundries for microsystems Design Automation Conference (DAC'97), Anaheim, Ca, USA, 9-13 June 1997 ---------- * Mentor Graphics, UK; Technical University of Budapest, Hungary; * Darmstadt University of Technology, Germany MARTA C., SZEKELY V., RENCZ M., COURTOIS B. Self-checking current output temperature sensor for DfTT 3rd IEEE International On-Line Testing Workshop, Aghia Pelaghia Headland, Crete, Greece, 7-9 July 1997 ---------- Technical University of Budapest, Hungary PEREZ-RIBAS R., KARAM J.M., COURTOIS B., LECLERCQ J.L., VIKTOROVITCH P. Bulk micromachining characterization of 0.2µm HEMT MMIC technology for GaAs MEMS design Conference on Low Dimensional Structures and Devices (LDSD'97), Lisbon, 19-21 May 1997 ---------- * LEAME, Lyon, France PEREZ- RIBAS R., BENNOURI N., KARAM J.M., COURTOIS B. GaAs MEMs design using 0.2µm HEMT MMIC technology IEEE GaAs IC Symposium, Anaheim, California, USA, 12-15 October 1997 RENCZ M., SZEKELY V., COURTOIS B. A step forward in the transient thermal characterization of packages 30th International Symposium on Microelectronics (ISHM'97), Philadelphia, PA, USA, 12-16 October 1997 ---------- * Technical University of Budapest, Hungary SZEKELY V., RENCZ M., COURTOIS B. Thermal testing of MCMs using Boundary-Scan access IMAPS Advanced Technology Workshop on MCM Test IV, Napa Valley, California, USA September 14-17, 1997 ---------- * Technical University of Budapest, Hungary SZEKELY V., RENCZ M., COURTOIS B. CAD tools for thermal testing of Electronic Systems InterPACK'97 Conference, Mauna Lani, USA, 15-19 June 1997 -------- * Technical University of Budapest, Dept. of Electron Devices, Hungary SZEKELY V., RENCZ M., COURTOIS B. Thermal testing of MCMs using Boundary-Scan access IMAPS Advanced Technology Workshop on MCM Test IV , Napa Valley, California, USA, September 14-17, 1997 VINCI DOS SANTOS F.V., BOUTAMINE H., VEYCHARD D., KARAM J.M., COURTOIS B. Towards space microsystems : design and manufacturing methodologies for CMOS compatible MEMS 2nd Round table on micro-nano technologies for space, ESTEC, Noordwijk, The Netherlands, 15-17 October 1997 1998 ABOU-SAMRA S.J., AISA P.A., GUYOT A., COURTOIS B. 3D CMOS SOI for high performance computing International Symposium on Low-Power Electronics and Design (ISLPED), Monterey, CA, 10-12 August 1998 -------- University of Bologna, Bologna, Italy CASTILLEJO A., VEYCHARD D., MIR S., KARAM J.M., COURTOIS B. Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems International Test Conference (ITC), Washington D.C., USA, 20-22 October 1998 COURTOIS B. From microelectronics to microsystems : CAD, CAT and MPW Invited talk in the Vth NEXUSPAN Workshop, Budapest, Hungary, 6-8 May 1998 COURTOIS B. Multidisciplinary and collaborative design for systems on silicon Invited paper at FED-PDI Joint Conference on 21st Century Electron Devices, Berlin, Germany, 29 June – 2 July 1998 COURTOIS B., DELORI H., KARAM J.M., PAILLOTIN J.F., TORKI K. The services available from CMP Invited paper at 3rd International Conference on ASIC (ASICON’98), Beijing,China, 20-23 October 1998 COURTOIS B., KARAM J.M., LUBASZEWSKI M., SZEKELY V., RENCZ M., KELLY G., ALDERMAN J., MORRISSEY A., HOFMANN K., GLESNER M.** CAD, CAT and MPW for MEMS Invited talk in the Eighth Workshop on Synthesis and System Integration of Mixed Technologies (SASIMI’98), Sendai, Japan, 19-20 October 1998 ---------- * UFRGS, Porto Alegre (RS), Brazil; Technical University of Budapest, Hungary; NMRC, University College, Cork, Ireland; *** Darmstadt University of Technology, Darmstadt, Germany KARAM J.M., COURTOIS B., BOUTAMINE H., CAO A., RODRIGUEZ J., SZEKELY V., RENCZ M., HOFMANN K.*, GLESNER M.* A composite integrated mixed-technology design environment to support micro-electro mechanical systems development The First International Conference on Modeling and Simulation of Microsystems, Semiconductors, Sensors and Actuators, MSM’98, Santa Clara Marriott, California, USA, April 5-8, 1998 ---------- Mentor Graphics Corporation, Oregon, USA; Technical University of Budapest, Budapest, Hungary; *Darmstadt University of Technology, Darmstadt, Germany KRIM N., COURTOIS B. Low cost access to advanced technologies for prototyping and small volume European Multimedia, Microprocessor Systems and Electronic Commerce (EMMSEC’98) Conference and Exhibition, Bordeaux, France, 28-30 September 1998 KRIM N., COURTOIS B., CONQ B. CADnet framework: an open platform for multidisciplinary and collaborative design European Multimedia, Microprocessor Systems and Electronic Commerce (EMMSEC’98), Conference and Exhibition, Bordeaux, France, 28-30 September 1998 ---------- * CNET/DTM/Grenoble, France LUBASZEWSKI M., COTA E.F., COURTOIS B. Microsystems testing : an approach and open problems Design, Automation and Test in Europe, Conference and Exhibition (DATE’98), Paris, France, 23-26 February 1998 ---------- * DELET/UFRGS, Brazil MIR S., KARAM J.M., COURTOIS B. Technologies and fabrication processes for microsystems Forum and Exhibition on Microtechnologies : from microsystems to measurement of micro and nano mechanical properties of materials, Liège, Belgium, 26-27 May 1998 PALAN B., VINCI DOS SANTOS F., KARAM J.M, COURTOIS B., HUSAK M. Integrated microsystem for biomedical applications 7th Annual university-wide seminar Workshop 98, Czech Technical University, Prague, February 3-5, 1998 ---------- * Czech Technical Univesity in Prague, Prague, Czech Republic PALAN B., VINCI DOS SANTOS F., KARAM J.M, COURTOIS B., HUSAK M. A new ISFET sensor interface circuit Eurosensors XII, 12th European Conference on Solid-State Transducers and the 9th UK Conference on Sensors and their Applications, Southampton, UK, 13-16 September 1998 ---------- * Czech Technical Univesity in Prague, Prague, Czech Republic SZEKELY V., RENCZ M., COURTOIS B. Thermal transient testing without a tester SEMICON West 98, Technical Symposium on Semiconductor Packaging Technology, San Jose, CA, USA, 15-17 July 1998 ---------- Technical University of Budapest SZEKELY V., RENCZ M., COURTOIS B. Application results of a new thermal benchmark chip SEMITHERM’98, Semiconductor Thermal Measurement and Management Symposium San Diego, California, 10-12 March 1998 ---------- Technical University of Budapest SZEKELY V., RENCZ M., COURTOIS B. Thermal monitoring through boundary-scan IMAPS Advanced Technology Workshop on MCM Test V Napa Valley, California, 20-23 September 1998 -------- * Technical University of Budapest, Dept. of Electron Devices, Hungary SZEKELY V., RENCZ M., COURTOIS B. Thermal transient testing of packages without a tester 2nd EPTC’98 (Electronics Packaging Technology Conference), Raffles City Convention Centre, Singapore, 8-10 December 1998 ---------- Technical University of Budapest, Hungary SZEKELY V., RENCZ M., COURTOIS B. Thermal transient testing of packages without a tester 31st IMAPS’98 (International Symposium on Microelectronics), San Diego, California, 2 – 4 November 1998 ---------- Technical University of Budapest, Hungary SZEKELY V., RENCZ M., TÖRÖK S., COURTOIS B. Iddq testing of submicron CMOS by cooling Seventh Asian Test Symposium (ATS’98), Singapore, 2-4 December 1998 ---------- Technical University of Budapest, Hungary 1999 CHARLOT B., MIR S., COTA E.F., LUBASZEWSKI M., COURTOIS B. Fault simulation of MEMS using HDLs SPIE Symposium on Design, Test and Microfabrication of MEMS/MOEMS, Paris, France, March-April 1999 ---------- UFRGS, Porto Alegre, Brazil CHARLOT B., MOUSSOURIS S., MIR S., COURTOIS B. Fault modeling of electrostatic comb-drives for mems SPIE Symposium on Design, Test and Microfabrication of MEMS/MOEMS, Paris, France, March-April 1999 CHARLOT B., MIR S., COTA E.F., LUBASZEWSKI M., COURTOIS B. Fault modeling of suspended thermal MEMS In International Test Conference, pp. 319-328, Atlantic city, USA, 28-30 September 1999 ---------- UFRGS, Porto Alegre, Brazil COURTOIS B., KARAM J.M., MIR S., LUBASZEWSKI M., SZEKELY V., RENCZ M., HOFMANN K., GLESNER M.* Design and Test of MEMS The Twelfth International Conference on VLSI DesignGoa, India, 7-10 January 1999 ---------- * UFRGS, Porto Alegre, Brazil Technical University of Budapest, Hungary * Darmstadt University of Technology, Germany LIATENI K., MOULINIER D., AFFOUR B., BOUTAMINE H., KARAM J.M., VEYCHARD D., COURTOIS B. Advanced integrated solution for MEMS design In Design, Test and Microfabrication of MEMS/MOEMS, B. Courtois, S.B. Crary, Wolfgang Ehrfeld, H. Fijuta, J.M. Karam, K. Markus, Editors, Proceedings of SPIE, Vol. 3680, pp. 161-170 Paris, France, 30 March - 1 April 1999 ---------- MEMSCAP, Grenoble, France MIR S., CHARLOT B., COURTOIS B. Extending fault-based testing to microelectromechanical systems European Test Workshop (ETW’99), Constance, Germany May 25-28, 1999 PALAN B., COURTOIS B. Fundamental noise limits of ISFET-based microsystems Eurosensors XIII, The 13th European Conference on Solid-State Transducers The Hague, The Netherlands, 12-15 September 1999 PALAN B., COURTOIS B., HUSAK M.* Microsystems in Space WORKSHOP'99 proceedings, CTU in Prague, February 2-3, pp. 202, 1999 ---------- * Czech Technical Univesity in Prague, Prague, Czech Republic PALAN B., SANTOS F.V., COURTOIS B., HUSAK M.* Noise Analysis of ISFET Based Sensors 3rd International Student Conference on Electrical Engineering POSTER'99, CTU in Prague, pp.130-131, May 27, 1999 ---------- * Czech Technical Univesity in Prague, Prague, Czech Republic PALAN B., SANTOS F.V., COURTOIS B., HUSAK M.* Microsystems for Space Applications 1st International Conference on Advanced Engineering Design, Abstract proceedings, Prague, pp.133-134, 31 May-2 June 1999. Conference proceedings pp.117 ISBN: 80-01-02055-X ---------- * Czech Technical Univesity in Prague, Prague, Czech Republic RIBAS R.P., VEYCHARD D., KARAM J.M., COURTOIS B. Providing technology infrastructure for MEMS In Design, Test and Microfabrication of MEMS/MOEMS, B. Courtois, S.B. Crary, Wolfgang Ehrfeld, H. Fijuta, J.M. Karam, K. Markus, Editors, Proceedings of SPIE, Vol. 3680, pp. 298-303 Paris, France, 30 March - 1 April 1999 RIBAS P.R., COURTOIS B. CAD environment for MEMS Invited paper at International Conference on Microelectronics and Packaging (SBMicro’99) Campinas, Brazil, Technical Digest, pp. 316-325, 3-6 August 1999 Ribas P.R., Veychard D., Leclerq J.L., Courtois B. Thermopile-based GaAs micromachined devices International Conference on Microelectronics and Packaging (SBMicro’99) Campinas, Brazil, Technical Digest, pp. 238-243, 3-6 August 1999 SZEKELY V., RENCZ M., POPPE A.*, COURTOIS B. New way for thermal transient testing Fifteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMITHERM 99) San Diego, CA, USA, 9-11 March 1999 ---------- Technical University of Budapest, Hungary; ** MicRed Microelectronics Res & Dev Ltd., Hungary SZEKELY V., RENCZ M., COURTOIS B. Thermal transient evaluation of packages with the TTMK toolkit The PACIFIC RIM / ASME International, Intersociety ElectronicPackaging Conference, InterPACK’99 Maui, Lahaina, Hawaii, USA, 13-19 June 1999 ---------- Technical University of Budapest, Hungary SZEKELY V., RENCZ M., COURTOIS B. Simulation, testing, and modeling of the thermal behavior and electro-thermal interactions in ICs, MCMs, and PCBs The 1999 Southwest Symposium on Mixed-Signal Design (SSMD’99) Tucson, Arizona, USA, 11-13 April 1999 --------- Technical University of Budapest, Hungary SZEKELY V., RENCZ M., COURTOIS B. Tool and method for the thermal transient evaluation of packages Microelectronics and Micro-Electro-Mechanical Systems Symposium (MICRO/MEMS’99) Queensland, Australia, 27-29 October 1999 --------- * Technical University of Budapest, Hungary TORKI K., COURTOIS B. Advanced low cost manufacturing from CMP service 1999 International Conference on Microelectronic Systems Education (MSE’99) Arlington, USA, 19-21 July 1999 2000 COURTOIS B. Design and test of MEMS Invited talk, VLSI Test Symposium, Montreal, Canada, 1-3 May 2000 COURTOIS B., TORKI K., CHARLOT B., DELORI H., EYRAUD S., PAILLOTIN J.F. Achievements and advances at CMP 3rd European Workshop on Microelectronics Education (EWME’2000), Aix-en-Provence, France, 18-19 May 2000 COURTOIS B., MIR S., CHARLOT B., LUBASZEWSKI M. From microelectronics to MEMS testing IEEE Microelectronics Reliability and Qualification Workshop, Glendale, California, USA, October 31 - 1 November 2000 GOY J., COURTOIS B., KARAM J.M., PRESSECQ F.* Design of an APS CMOS image sensor for space applications using standard CAD tools and CMOS technology Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP of MEMS/MOEMS), Paris, France, 9-11 May 2000 ---------- * MEMSCAP, Grenoble, France; ** CNRS, Toulouse, France MIR S., CHARLOT B., NICOLESCU G., COSTE P., PARRAIN F., ZERGAINOH N., COURTOIS B., JERRAYA A., RENCZ M.* Towards design and validation of mixed-technology SOCs Tenth Great Lakes Symposium on VLSI (GLSVLSI 2000), Chicago, Illinois, USA, March 2-4 2000 (ISBN 1-58113-251-4) ---------- * Technical University Budapest, Hungary PALAN B. ., ROUBIK K., HUSAK M., COURTOIS B. CMOS ISFET-based structures for biomedical applications 1st Annual International IEEE-EMBS Special Topic Conference on Microtechnologies in Medicine and Biology, Lyon, France, October 12-14, 2000 ---------- * Czech Technical Univesity in Prague, Prague, Czech Republic POPPE A., FARKAS G., RENCZ M., BENEDEK Zs., POHL L., SZEKELY V., TORKI K., MIR S., COURTOIS B. Design of scalable multi-fonctional thermal test die with direct and boundary scan access for programmed excitation and measurement data acquisition 6th International Workshop on Thermal Investigations of Ics and Systems (THERMINIC 2000), Budapest, Hungary, September 24-27, 2000 ---------- * Technical University Budapest, Hungary RENCZ M., SZEKELY V., KOHARI Zs., COURTOIS B. A method for thermal model generation of MEMS packages MSM’2000, San Diego, USA, 27-29 March 2000 ---------- Technical University Budapest, Hungary RENCZ M., SZEKELY V., KOHARI Zs., COURTOIS B. Thermal evaluation and modeling of MEMS packages IEMT/ITC Symposium, Omiya, Japan, April 2000 ---------- Technical University Budapest, Hungary RENCZ M., SZEKELY V., KOHARI Zs., COURTOIS B. Thermal evaluation and modelling of the SIP9 and SP10 MEMS packages Seventh Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITHERM 2000) Las Vegas, Nevada, USA, 23-26 May 2000 ---------- Technical University Budapest, Hungary RENCZ M., SZEKELY V., POPPE A.*, COURTOIS B. Fast and user friendly tool for the thermal simulation of power packages International Workshop on Integrated Power Packaging (IWIPP 2000), Waltham-Boston, Ma, USA, July 14-15, 2000 ---------- Technical University Budapest, Hungary; ** MicRed Microelectronics Res & Dev Ltd., Hungary RENCZ M., SZEKELY V., POPPE A.*, COURTOIS B. From MEMS to the global simulation of SoCs Design, Modeling and Simulation in Microelectronics (DMSM 00), Singapore, November 28-30, 2000 ---------- Technical University Budapest, Hungary ** MicRed Microelectronics Res & Dev Ltd., Hungary SZEKELY V., RENCZ M., POPPE A.*, COURTOIS B. New hardware tools for the thermal transient testin of packages 3rd Electronics Packaging Technology Conference (EPTC 2000), Singapore, December 5-7, 2000 ---------- Technical University Budapest, Hungary; ** MicRed Microelectronics Res & Dev Ltd., Hungary SZEKELY V., RENCZ M., POPPE A.*, COURTOIS B. THERMODEL : a tool for thermal model generation, and application for MEMS packages Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP of MEMS/MOEMS) Paris, France, 9-11 May 2000 ---------- Technical University Budapest, Hungary; ** MicRed Microelectronics Res & Dev Ltd., Hungary TORKI K., COURTOIS B. CMP Experience on deep sub-micron design-methodology support and transfer 3rd European Workshop on Microelectonics Education (EWME’2000), Aix-en-Provence, France 18-19 May 2000, (ISBN 0-7923-6456-2) 2001 CHARLOT B., MIR S., PARRAIN F., COURTOIS B. Electrically induced stimuli for MEMS self-test 19th VLSI test symposium (VTS 2001), Los Angeles, USA, April 29 - May 3, 2001 CHARLOT B., PARRAIN F., MIR S., COURTOIS B. A self-testable CMOS thermopile-based infrared imager Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP'2001), Cannes - Mandelieu, France, 25-27 April 2001 COURTOIS B., MIR S., CHARLOT B., LUBASZEWSKI M.* An analog-based approach for MEMS testing IEEE Latin-American Test Workshop (LATW 2001 ), Cancun, Mexico, February 11-14 2001 ---------- * UFRGS, Porto Alegre, Brazil JUNEIDI Z., TORKI K., CHARLOT B., COURTOIS B. MEMS synthesis and optimization Design, Test, Integration, and Packaging of MEMS/MOEMS (DTIP 2001), Cannes, France, April 25-27 2001 JUNEIDI Z., TORKI K., MARTINEZ S., NICOLESCU G., COURTOIS B., JERRAYA A. Global modeling and simulation of system-on-Chip embedding MEMS devices 4th International Conference on ASIC, ASICON 2001, Beijing, China, 23-25 October 2001 GOY J., COURTOIS B., KARAM J.M., PRESSECQ F.* Design and test of an active pixel sensor (APS) CMOS image sensor for space applications Electroning Imaging 2001 Conference on sensors, cameras, and systems for scientific/industrial applications III (E117), San Jose, California, USA, January 21-26 2001 ---------- * MEMSCAP, Grenoble, France ; ** CNRS, Toulouse, France MARTINEZ S.O., COURTOIS B. Study of scalability for micromachined free-spaceoptical cross-connects Photonics Packaging and Integration III part of SPIE Symposium on Integrated Optics, San Jose, California, USA, 20-26 January 2001 MARTINEZ S.O., COURTOIS B. Insertion losses in micromachined free-space optical cross-connects due to fiber misalignments Design, Test, Integration, and Packaging of MEMS/MOEMS (DTIP 2001), Cannes, France, April 25-27 2001 POPPE A.,* FARKAS G.*, RENCZ M., BENEDEK Zs., POHL L., SZEKELY V., TORKI K., MIR S., COURTOIS B. Design issues of a multi-functional intelligent thermal test die 17th IEEE Semiconductor Thermal Measurement and Management Symposium (SEMITERM 2001), San Jose, California, USA, March 20-23 2001 ---------- Technical University of Budapest, Hungary; *MicRed Microelectronics Res & Dev Ltd., Hungary RIBAS R.P., LESCOT J., LECLERCQ J.-L., COURTOIS B. Thermal and mechanical evaluation of micromachined planar spiral inductors Design, Test, Integration, and Packaging of MEMS/MOEMS (DTIP 2001), Cannes, France, April 25-27 2001 ---------- Univ. Federal do Rio Grande do Sul, Brazil; LEMO/CNRS, France ; * LEOM/CNRS, France TORKI K., COURTOIS B. CMP: The access to advanced low cost manufacturing 2001 International Conference on Microelectronic Systems Education (MSE 2001) Las Vegas, USA, 17-18 June 2001 2002 CHARLOT B., COURTOIS B., DELORI H., PAILLOTIN J.-F., TORKI K. The CMP Service 4th European Workshop on Microelectronics Education (EWME 2002), Parador de Baiona, Spain, May 23-24 2002 SZEKELY V., RENCZ M., FARKAS G.*, COURTOIS B. Measuring interface thermal resistance values by transient testing Eight Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITHERM 2002), Marina San Diego, California, USA, May 29 – June 1 2002 ---------- Technical University Budapest, Hungary; ** MicRed Microelectronics Res & Dev Ltd., Hungary RENCZ M., SZEKELY V., COURTOIS B. An algorithm for the inclusion of RC compact models of packages into board level thermal simulation tools International Conference on Computational Nanoscience and Nanotechnology - Fifth International Conference on Modeling and Simulation of Microsystems (ICCN-MSM 2002), San Juan, Puerto Rico, USA, April 22-25, 2002 ---------- * Technical University Budapest, Hungary RENCZ M., COURTOIS B. Co-simulation of dynamic compact models of packages with the detailed models of printed circuit boards SEMICON West STS’02, San Jose, USA, July 17-18 2002 ---------- Technical University Budapest, Hungary 2003 RENCZ M., SZEKELY V., COURTOIS B. Studies with transient compact models of packages and heat sinks International Electronics Packaging Conference, Maui, Hawaii, USA, July 6-11, 2003 ---------- MicRed Microelectronics Res & Dev Ltd., Hungary; ** Budapest University of Technology and Economics, Hungary RENCZ M., SZEKELY V., POPPE A., COURTOIS B. Algorithmic and modeling in the electro-thermal simulation of thermally operated microsystems Nanotechnology Conference and Trade Show (NanoTech’03), San Francisco, California, USA, February 23-27, 2003 ---------- MicRed Microelectronics Res & Dev Ltd., Hungary; ** Budapest University of Technology and Economics, Hungary RENCZ M., SZEKELY V., POPPE A., TORKI K., COURTOIS B. Electro-thermal simulation for the prediction of chip operation within the package 19th Semiconductor Thermal Measurement and Management Symposium (SEMITHERM’03), San Jose, California, USA, March 11-13, 2003 ---------- MicRed Microelectronics Res & Dev Ltd., Hungary; ** Budapest University of Technology and Economics, Hungary RENCZ M., SZEKELY V., POPPE A., TORKI K., COURTOIS B. Electro-thermal simulation of chip operation within the package Workshop on Thermal Management Challenges for the Navy, Annapolis, Maryland, USA, April 8-9, 2003 ---------- MicRed Microelectronics Res & Dev Ltd., Hungary; ** Budapest University of Technology and Economics, Hungary RENCZ M., SZEKELY V., POPPE A., COURTOIS B. Electro-thermal simulation of MEMS elements SPIE Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP’03), Cannes, France, May 5-7, 2003 ---------- MicRed Microelectronics Res & Dev Ltd., Hungary ; ** Budapest University of Technology and Economics, Hungary RENCZ M., FARKAS G., SZEKELY V., POPPE A., COURTOIS B. Boundary condition independent dynamic compact models of packages and heat sinks from thermal transient measurements, 5th Electronics Packaging and Technology Conference 2003 (EPTC’03), Singapore, December 10-12, 2003 ---------- MicRed Microelectronics Res & Dev Ltd., Hungary ; ** Budapest University of Technology and Economics, Hungary 2004 CHARLOT B., SZEKELY V., RENCZ M., BOGNAR G., COURTOIS B. An 8x8 thermopile based uncooled infrared sensor Europen Micro and Nano Systems (EMN’04), Paris, France, October 20-21, 2004 --------- Technical University of Budapest, Hungary COURTOIS B., TORKI K., COLIN S., DELORI H., EYRAUD S., PAILLOTIN J-F., DI PENDINA G Infrastructures for education, research and industry in microelectronics – Developments at CMP and worldwide cooperation 10th International Symposium on Integrated Circuits, Devices & Systems (ISIC’04), Integrated Systems on Silicon, Singapore, 8-10 September 2004 GALY N., CHARLOT B., PARRAIN F., COURTOIS B. A full identification system for a tactile fingerprint sensor Design, Test, Integration, and Packaging of MEMS/MOEMS (DTIP’04), Montreux, Switzerland, May 12-14, 2004 MIR S., RUFER L., COURTOIS B. On-chip testing of embedded transducers Invited talk at 17th International Conference on VLSI Design, Mumbai, India, pp. 463-472, January 5-9, 2004 MIR S., CHARLOT B., RUFER L., COURTOIS B. On-chip testing of embedded silicon transducers Invited talk at IEEE International SOC Conference (SOCC’04), San Clara, California, USA, September 12-15, 2004 MIR S., CHARLOT B., RUFER L., COURTOIS B. On-chip testing of embedded silicon transducers Invited talk at the 16th International Conference on Microelectronics (ICM’04), Tunis, Tunisia, December 6-8,2004 ROMAN C., CIONTU F., COURTOIS B. A carbon nanotube-based sensor for measuring forces developed by cells Nanotechnology Conference and TradeShow (NanoTech’04), Boston, Massachusetts, U.S.A., March 7-11, 2004 ROMAN C., CIONTU F., COURTOIS B. Single molecule detection and macromolecular weighting using an all-carbon-nanotube nanoelectromechanical sensor Fourth IEEE Conference on Nanotechnology (NANO’04), Munich, Germany, August 17-19, 2004 ROMAN C., CIONTU F., COURTOIS B. Aromatic amino acids physisorbed on graphene :electronic properties and hamiltonian model reduction Europen Micro and Nano Systems (EMN’04), Paris, France, October 20-21, 2004 RENCZ M., POPPE A., COLLARD E., RESS S., SZEKELY V., COURTOIS B. A procedure to correct the error in the structure function based thermal measuring methods 20th Semiconductor Thermal Measurement and Management Symposium (SEMITHERM’04), San Jose, California, USA, March 7-11, 2004 ---------- Budapest University of Technology and Economics, Hungary; MicRed Microelectronics Res & Dev Ltd., Hungary RENCZ M., POPPE A.*, COLLARD E., RESS S., SZEKELY V., COURTOIS B. Increasing the accuracy of structure function based evaluation of thermal transient measurements International Conference on Thermal, Mechanics and Thermomechanical Phenomena in Electronic Systems (ITHERM’04), Las Vegas, USA, June 1-4, 2004 ---------- * Budapest University of Technology and Economics, Hungary; ** MicRed Microelectronics Res & Dev Ltd., Hungary RENCZ M., SZEKELY V., POPPE A., COURTOIS B., ZHANG L.*** Testing the die attach quality of 3D Stacked dies International Mechanical Engineering Congress and Exposition (IMECE’04), Anaheim, California, USA, November 13-19, 2004 ---------- * MicRed Microelectronics Res & Dev Ltd., Hungary; Budapest University of Technology and Economics, Hungary; * National Semiconductor Corporation, Santa Clara, CA, USA RENCZ M., FARKAS G., SZEKELY V., POPPE A., COURTOIS B. Thermal qualification of 3D stacked die packages 6th Electronics Packaging and Technology Conference (EPTC’04), Singapore, December 8-10, 2004 ---------- * MicRed Microelectronics Res & Dev Ltd., Hungary; ** Budapest University of Technology and Economics, Hungary SZEKELY V., BOGNAR G., RENCZ M.*, CIONTU F., CHARLOT B., COURTOIS B. Design and verification of an electrostatic MEMS simulator Nanotechnology Conference and TradeShow (NanoTech’04), Boston, Massachusetts, U.S.A., March 7-11, 2004 ---------- Budapest University of Technology and Economics, Hungary; ** MicRed Microelectronics Res & Dev Ltd., Hungar 2005 COURTOIS B., RENCZ M.* Thermal modeling of multiple die packages 7th Electronics Packaging Technology Conference (EPTC’05), Singapore, December 7-9, 2005 ---------- * MicRed Microelectronics Res & Dev Ltd., Hungary ROMAN C., CIONTU F., COURTOIS B. Electronic properties of graphitic surfaces with absorbed aromatic amine acids Nanotechnology Conference and TradeShow (NanoTech’05), Anaheim, California, U.S.A., March 8-12, 2005 ROMAN C., CIONTU F., COURTOIS B. A framework for computing transport properties of carbon nanotube-based conductance biochemical sensors European Nano Systems (ENS’05), Paris, Rance, 14-16 December 2005 SZABO P., PERLAKY G., BOGNAR GY., HORVATH GY., RESS S., POPPE A., SZEKELY V., RENCZ M.*, COURTOIS B. Thermo-mechanical characterization and integrity checking of packages and movable-structures Nanotechnology Conference and Trade Show (NANOTECH’05), Anaheim, California, USA, May 8-12, 2005 ---------- Budapest University of Technology and Economics, Hungary; ** MicRed Microelectronics Res & Dev Ltd., Hungary SZABO P.,, SZEKELY V., POPPE A. ,, FARKAS G., COURTOIS B., RENCZ M. ,** Thermal characterization and modeling of stacked die packages Technical Conference and Exhibition on Integration and Packaging of Micro, Nano and Electronic Systems (InterPACK 2005), San Francisco, Ca., USA, July 17-22, 2005 ---------- * Budapest University of Technology and Economics, Hungary; ** MicRed Microelectronics Res & Dev Ltd., Hungary SZABO P., RENCZ M., SZEKELY V.*, POPPE A., FARKAS G., COURTOIS B. Thermal modeling of multiple die packages 7th Electronics Packaging Technology Conference (EPTC’05), Singapore, December 7-9, 2005 ---------- MicRed Microelectronics Res & Dev Ltd., Hungary; *Budapest University of Technology and Economics, Hungary TORKI K., COURTOIS B. CMP service for prototyping and low volume production CEPA 2 Workshop – Digital Platforms for Defence, Brussels, Belgique, March 15-16, 2005 2006 RENCZ M. ,*, NEMETH B., SZABO P.,, POPPE A. ,*, COURTOIS B. Characterization of the etching quaality in micro-electro-mechanical systems by thermal transient methodology Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP’06), Stresa, Italy, 26-28 April 2006 ---------- Budapest University of Technology and Economics, Hungary; ** MicRed Microelectronics Res & Dev Ltd., Hungary RENCZ M. ,, SZABO P.,*, POPPE A. ,*, COURTOIS B. Thermal testing and dynamic modeling of multiple die packages International Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm’06), San Diego, California, USA, May 30 – June 2, 2006 ---------- Budapest University of Technology and Economics, Hungary; ** MicRed Microelectronics Res & Dev Ltd., Hungary SZABO P.,, NEMETH B., RENCZ M. ,, COURTOIS B. Characterization of the etching quality in micro-electro-mechanical systems by thermal transient methodology Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP’06), Stresa, Italy, April 26-28, 2006 ---------- Budapest University of Technology and Economics, Hungary; ** MicRed Microelectronics Res & Dev Ltd., Hungary SZABO P., POPPE A. ,*, FARKAS G., SZEKELY V., RENCZ M. , COURTOIS B. Thermal characterization and compact modeling of stacked die packages International Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm’06), San Diego, California, USA, May 30 – June 2, 2006 ---------- * MicRed Microelectronics Res & Dev Ltd., Hungary; ** Budapest University of Technology and Economics, Hungary; 2007 COURTOIS B., TORKI K., COLIN S., DELORI H., EYRAUD S., PAILLOTIN J.-F., DI PENDINA G., DUMONT S. Infrastructures for Education, Research and Industry in Microelectronics – Recent Developments. International Symposium on INtegratied Circuits (ISIC’2007), Singapore, 26-28 September 2007. 2008 COURTOIS B, TORKI K., DUMONT S., EYRAUD S., PAILLOTIN J-F., DI PENDINA G. Infrastructures for Education, Research and Industry in Microelectronics 14th IEEE Mediterranean Electrotechnical Conference (MELECON 2008), Ajaccio (France), 5-7 May 2008. COURTOIS B. Infrastructures for Education, Research and Industry in ICs and MEMS Invited paper at the International Conference on MEMS and Nanotechnology (ICMN 2008), Kuala Lumpur (Malaysia), 13-15 May 2008. COURTOIS B., EYRAUD S., PAILLOTIN J-F, DI PENDINA G., TORKI K. Infrastructures for Education, Research and Industry in Microelectronics 7th European Workshop on Microelectronics Education (EWME 2008), Budapest (Hungary) 28-30 May 2008 COURTOIS B., CHARLOT B., DI PENDINA G., RUFER L.* Infrastructures for mixed signalS in biology and medicine 14th IEEE International Mixed-Signals, sensors, and systems Test Workshop (IMS3TW 2008), Vancouver,Canada, 18-20 June 2008 IES/MITEA, Montpellier - France TIMA, Grenoble - France COURTOIS B., CHARLOT B., DI PENDINA G., RUFER L.** Infrastructures for Education, Research and Industry: CMOS and MEMS for BioMed Invited paper at the 12th World Multi-Conference or Systemics, Cybernetics and Informatics (WMSCI 2008), Orlando USA, 29 June – 2 July 2008 IES/MITEA, Montpellier - France, TIMA, Grenoble – France COURTOIS B., CHARLOT B., DI PENDINA G., RUFER L.** Electronics Manufacturing Infrastructures for Education and Commercialization 30th Annual International IEEE EMBS Conference, 20-24 August, 2008, Vancouver, British Columbia, Canada IES/MITEA, Montpellier – France, *TIMA, Grenoble – France COURTOIS B. Services like CMP: where do they come from, where are they going? Keynote in IEEE International Conference on Microelectronics (ICM’08), December 14-17, 2008 in Sharjah, UAE COURTOIS B. ,TORKI K., DUMONT S., EYRAUD S., PAILLOTIN J-F, DI PENDINA G. Infrastructures for Education, Research and Industry in Microelectronics - a look worldwide and a look at India 22nd International Conference on VLSI Design, 5-9 January 2009, New Delhi, India