Large-scale IC for the examination of the reliability parameters, process, circuits and patterns

Run reference : S65C15_1 - IC STMicroelectronics 65nm Advanced CMOS 7 ML CMOS065 (datasheet)

S65C15_1 BIS64_1_TOP

Test LSI circuit designed for the examination of the reliability parameters provided by the manufacturing technology. Test structures for superior understanding of 65 nm process and analysis of electronic circuits and patterns. The additional goal is to teach master and undergraduate students of the modern technology features.