Various configurations of Single Photon Avalanche Diodes (SPAD) and associated electronics

Run reference : A35V15_2 - IC ams 0.35µm CMOS High Voltage 4 ML H35B4D3 (datasheet)

A35V15_2 INL_APIX_TOP_V1

This test-chip includes different Single Photon Avalanche Diodes (SPADs) and their electronics in various configurations (quenching and passive or active recharge electronics) and small arrays (4pixels) and has been especially designed for the experimental measurements of the SPAD performances such as dark count rate, photon detection efficiency, timing jitter.