MOSFETs and Circuits for Cryogenic Characterization

Run reference : A35C15_3 - IC ams 0.35µm CMOS 4 ML C35B4C3 (datasheet)

A35C15_3 QNL2_CMOS

The chip contains test circuits of two large arrays of MOS transistors (64x64) used to evaluate matching properties of the MOS devices in a wide range of temperatures (4.2 K to 300 K). The chip also has various circuits, such as 2nd-Order Sigma Delta Modulator, Multiplexer, Level shifter, and so on, for test at very low temperature (4.2 K)